Sensor drift compensation by lot
First Claim
1. A drift compensation system for compensating the drift of a sensor within a manufacturing lot, comprising:
- a sensor test sample manufactured from a lot of material having substantially similar chemical or metallurgical properties;
a drift characterization tester, wherein the test sample is exposed to a predetermined thermal environment, and wherein measurements of the test sample output are analyzed to provide a functional relationship between temperature and time associated with the sensor test sample;
a drift function describing the relationship between time and temperature derived from the thermal exposure testing of the test sample in the drift characterization tester;
a sensor system comprising;
a second sensor manufactured from the same lot of material as the sensor test sample; and
a memory storage component for storing parameters associated with the drift function of the sensor test sample and the second sensor;
a drift compensation instrument coupleable to the second sensor, and operable to retrieve the stored parameters of the drift function from the memory storage component and correct the output of the second sensor based on the drift function; and
wherein the sensor test sample is exposed to the predetermined thermal environment in the drift characterization tester to characterize the drift function that is used by the drift compensation instrument to compensate the output drift of the sensors manufactured from the same lot of material.
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Accused Products
Abstract
Drift compensation systems and methods are presented for compensating the drift of a sensor within a manufacturing lot. The system comprises a sensor test sample manufactured from a lot of material having substantially similar chemical or metallurgical properties, a drift characterization tester, wherein the test sample is exposed to a predetermined thermal environment. Measurements of the test sample output are analyzed to provide a drift function describing the relationship between time and temperature from the thermal exposure measurements of the test sample in the drift characterization tester. Parameters associated with the drift function and the sensor test sample are stored in a memory storage component associated with a second sensor. The second sensor is manufactured from the same lot of material as the sensor test sample. A sensor system is manufactured comprising the second sensor and the memory storage component. A drift compensation instrument coupleable to the second sensor and the memory storage component of the sensor system is operable to retrieve the stored parameters of the drift function from the memory storage component and correct the output of the second sensor based on the drift function, thereby compensating the output drift of the sensors manufactured from the same lot of material.
85 Citations
30 Claims
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1. A drift compensation system for compensating the drift of a sensor within a manufacturing lot, comprising:
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a sensor test sample manufactured from a lot of material having substantially similar chemical or metallurgical properties;
a drift characterization tester, wherein the test sample is exposed to a predetermined thermal environment, and wherein measurements of the test sample output are analyzed to provide a functional relationship between temperature and time associated with the sensor test sample;
a drift function describing the relationship between time and temperature derived from the thermal exposure testing of the test sample in the drift characterization tester;
a sensor system comprising;
a second sensor manufactured from the same lot of material as the sensor test sample; and
a memory storage component for storing parameters associated with the drift function of the sensor test sample and the second sensor;
a drift compensation instrument coupleable to the second sensor, and operable to retrieve the stored parameters of the drift function from the memory storage component and correct the output of the second sensor based on the drift function; and
wherein the sensor test sample is exposed to the predetermined thermal environment in the drift characterization tester to characterize the drift function that is used by the drift compensation instrument to compensate the output drift of the sensors manufactured from the same lot of material. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A measurement system for compensating the drift of a sensor within a manufactured lot of sensors, comprising:
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a sensor test sample manufactured from a lot of material having substantially similar chemical or metallurgical properties;
an expected thermal exposure input for the sensor lot, comprising an exposure to an expected temperature and time;
a drift characterization tester, wherein the test sample is exposed to the expected temperature for the expected time;
a drift function describing the relationship between time and temperature derived from the thermal exposure testing of the test sample;
a memory storage component for storing parameters corresponding to the drift of the sensor test sample and a second sensor manufactured from the same lot of material;
a drift compensation instrument coupleable to the second sensor of the sensor lot, and operable to retrieve the stored parameters of the drift function from the memory storage component and correct the output of the second sensor based on the drift function; and
wherein the sensor test sample is exposed to the expected thermal environment in the drift characterization tester to characterize the drift function that is used by the drift compensation instrument to compensate the output drift of the second sensor manufactured from the same lot of material. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. A method of compensating for the drift of a sensor in a measurement system comprising a sensor test sample manufactured from a lot of material having substantially similar chemical or metallurgical properties, a drift characterization tester, a drift function, a sensor system comprising a second sensor manufactured from the same lot of material as the sensor test sample, and a memory storage component, and a drift compensation instrument, the method comprising:
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exposing a sensor test sample to a predetermined thermal environment in the drift characterization tester;
measuring the output of the sensor as a function of temperature and time;
characterizing and storing a drift function for the sensor, wherein the drift function describes the relationship between time and temperature derived from the thermal exposure temperature and time measurements of the test sample;
storing parameters associated with the drift function in the memory storage component of the sensor system;
inputting the parameters associated with the drift function to the drift compensation instrument, and use the parameters to compensate the output drift of the second sensor; and
wherein the sensor test sample is exposed to the predetermined thermal environment in the drift characterization tester to characterize the drift function used by the drift compensation instrument to compensate the output drift of the second sensor manufactured from the same lot of material. - View Dependent Claims (23, 24, 25, 26, 27, 28, 29, 30)
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Specification