×

Methods and apparatus for training a pattern recognition system using maximal rank likelihood as an optimization function

  • US 6,850,888 B1
  • Filed: 10/06/2000
  • Issued: 02/01/2005
  • Est. Priority Date: 10/06/2000
  • Status: Expired due to Fees
First Claim
Patent Images

1. A method for selecting model parameters during a training phase of a pattern recognition system, comprising the steps of:

  • obtaining an observation sequence, ot; and

    evaluating a pseudo-rank likelihood of said observation sequence, ot, to obtain model parameters during said training phase, wherein said pseudo-rank likelihood transforms discrete features of a rank likelihood to generate parameter estimations during said training phase.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×