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Gated fabrication of nanostructure field emission cathode material within a device

  • US 6,858,455 B2
  • Filed: 05/24/2002
  • Issued: 02/22/2005
  • Est. Priority Date: 05/25/2001
  • Status: Active Grant
First Claim
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1. A method, comprising:

  • growing a single substantially vertically aligned carbon nanostructure, the single substantially vertically aligned carbon nanostructure coupled to a substrate;

    covering at least a portion of the single substantially vertically aligned carbon nanostructure with a dielectric;

    forming a gate, the gate coupled to the dielectric;

    releasing the single substantially vertically aligned carbon nanostructure by forming an aperture in the gate and removing a portion of the dielectric; and

    forming a dielectric protection layer, the dielectric protection layer coupled to the gate, before releasing the single substantially vertically aligned carbon nanostructure, wherein removing a portion of the dielectric includes reactive ion etching.

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