Semiconductor factory automation system and method for monitoring at least one server in real time

• US 6,859,675 B1
• Filed: 06/22/2000
• Issued: 02/22/2005
• Est. Priority Date: 06/22/1999
• Status: Expired due to Term

• Current Assignee: Hyundai Electronics Industries Co. Ltd. (SK Hynix Inc.)
• Original Assignee: Hyundai Electronics Industries Co. Ltd. (SK Hynix Inc.)
• Inventors: Kim, Young-Jin
• Primary Examiner(s): Picard, Leo
• Assistant Examiner(s): Garland, Steven R.
• Application Number:
  US09/599,475
• Time in Patent Office: 1,706 Days
• Field of Search: 700/2, 700/9, 700/83, 700/95, 700/108, 700/110, 700/121, 714/10, 714/47, 714/57, 702/188, 345/734, 345/736, 345/961, 709/224, 710/15, 710 17- 19
• US Class Current: 700/108
• CPC Class Codes: G05B 19/0428 Safety, monitoring G05B19/0423 takes precedence
• CPC Class Codes: G05B 2219/24048 Remote test, monitoring, diagnostic
• CPC Class Codes: G05B 2219/24102 Display status of controller
• CPC Class Codes: G05B 2219/31344 Element, file server
• CPC Class Codes: G05B 2219/34454 Check functioning controller, cpu or program
• CPC Class Codes: G06F 11/3013 where the computing system is an embedded system, i.e. a combination of hardware and software dedicated to perform a certain function in mobile devices, printers, automotive or aircraft systems testing or monitoring of control systems or parts thereof G05B23/02
• CPC Class Codes: G06F 11/302 where the computing system component is a software system
• CPC Class Codes: G06F 11/3024 where the computing system component is a central processing unit [CPU]
• CPC Class Codes: G06F 11/3034 where the computing system component is a storage system, e.g. DASD based or network based digital input from or digital output to record carriers G06F3/06; digital recording or reproducing G11B20/18; for distributed storage of data in networks, e.g. transport arrangements for network file system [NFS], storage area networks [SAN] or network attached storage [NAS], H04L67/1097
• CPC Class Codes: G06F 11/3055 Monitoring arrangements for monitoring the status of the computing system or of the computing system component, e.g. monitoring if the computing system is on, off, available, not available error or fault processing without redundancy G06F11/0703; error detection or correction by redundancy in data representation G06F11/08; error detection or correction by redundancy in operation G06F11/14; error detection or correction by redundancy in hardware G06F11/16
• CPC Class Codes: G06F 11/328 Computer systems status display G06F11/327 takes precedence

Abstract

A method for monitoring at least one server in a semiconductor factory automation (FA) system, includes the steps of: a) providing server state information from at least one server to a real-time database, wherein the server state information includes an availability of a central processing unit, an availability of a disk and a state of a program process related to the server; b) storing the processor state information in the real-time database; c) retrieving the server state information to monitor the server; and d) displaying the server state information retrieved. Therefore, the method monitors at least one server in a real time so that an operator can easily locate a failure of at least one-server.

Claims

1. A semiconductor factory automation (FA) system, comprising:

at least one processor, which is coupled to at least one semiconductor processing means for processing a semiconductor wafer cassette containing a predetermined number of semiconductor wafers, each for driving a program process and providing processor state information, wherein the processor state information includes an availability of a central processing unit related to said processor, an availability of a disk related to said processor, and a state of the program process related to said processor;

storing means for storing the processor state information in real time;

monitoring means for retrieving the processor state information stored in said storing means in order to monitor said processor in real time; and

displaying means for displaying the processor state information retrieved.

2. The semiconductor FA system as recited in claim 1, wherein said displaying means includes:

a first display space for displaying the availability of the central processing unit related to said processor; and

a second display space for displaying the availability of the disk related to said processor.

3. The semiconductor FA system as recited in claim 2, wherein said displaying means further includes:

a first light emitting device for emitting a first light when the disk has failed;

a second light emitting device for emitting a second light when the program process is in a down state; and

a third light emitting device for emitting a third light when a communication between said monitoring means and said processor is disconnected.

4. The semiconductor FA system as recited in claim 3, wherein said displaying means further includes:

a third display space for displaying identification information of the program process of the down state.

5. The semiconductor FA system as recited in claim 4, wherein said at least one processor includes a first processor and a second processor.

6. The semiconductor FA system as recited in claim 4, further comprising:

stocking means for stocking the semiconductor wafer cassette; and

transportation means for transporting the semiconductor wafer cassette from said semiconductor processing means to said stocking means or from said stocking means to said semiconductor processing means.

7. A method for monitoring at least one server in a semiconductor factory automation (FA) system, comprising the steps of:

a) providing server state information from at least one server, which is coupled to at least one semiconductor processing means, to a real-time database, wherein the server state information includes an availability of a central processing unit related to the server, an availability of a disk related to the server, and a state of a program process related to the server;

b) storing the server state information in the real-time database;

c) retrieving the server state information stored in the real-time database to monitor the server, and

d) displaying the server state information retrieved in real time.

8. The method as recited in claim 7, wherein said step d) includes the steps of:

d1) displaying the availability of the central processing unit related to the server; and

d2) displaying the availability of the disk related to the server.

9. The method as recited in claim 8, wherein said step d) further includes the steps of:

d3) emitting a first light when the disk has failed; and

d4) emitting a second light when the program process is in a down state.

10. The method as recited in claim 9, wherein said step d) further includes the step of:

d5) displaying identification information of the program process of the down state.

11. A semiconductor factory automation (FA) system, comprising:

a plurality of processors, each coupled to a plurality of semiconductor processing means for processing a semiconductor wafer cassette containing a predetermined number of semiconductor wafers, said plurality of processors for driving a plurality of program processes, respectively, and providing respective processor state information, wherein for each of said plurality of processors the processor state information respectively includes an availability of a central processing unit related to said processor, an availability of a disk related to said processor, and a state of the program process related to said processor;

storing means for storing the processor state information of said plurality of processors in real time;

monitoring means for retrieving the processor state information stored in said storing means in order to monitor said plurality of processors in real time; and

displaying means for displaying the processor state information retrieved, said displaying means including, for each processor,

a first display space for displaying the availability of the central processing unit related to said processor; and

a second display space for displaying the availability of the disk related to said processor.

12. The semiconductor FA system as recited in claim 11, wherein said displaying means further includes, for each processor:

a first light emitting device for emitting a first light when the respective disk has failed;

a second light emitting device for emitting a second light when the respective program process is in a down state; and

a third light emitting device for emitting a third light when a communication between said monitoring means and said respective processor is disconnected.

13. The semiconductor FA system as recited in claim 12, wherein said displaying means further includes, for each processor:

a third display space for displaying identification information of the program process of the down state.