Method and apparatus for generating transaction-based stimulus for simulation of VLSI circuits using event coverage analysis
First Claim
1. A method of simulating a circuit, comprising the steps of:
- identifying a set of logic events associated with said circuit, wherein the logic events are represented as data objects embodying logic equations;
generating a plurality of input test cases;
simulating operation of said circuit utilizing said plurality of input test cases;
tabulating for the plurality of input test cases and the set of logic events the numbers of times that each input test case stimulates logic event; and
identifying as non-occurring events one or more logic events that have not been stimulated more than a predetermined threshold of times.
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Abstract
The present invention applies genetic algorithmic generation of test cases the simulation of VLSI logic circuit blocks. The present invention generates a number of original test cases. This aggregate of solutions is provided to a circuit simulator. The results of the simulator are maintained in a matrix or table. The results detail the number of times that particular logic states or events associated with the VLSI block have been stimulated by particular test cases. The aggregate of solutions and the simulation results are then analyzed by the genetic algorithm. The genetic algorithm preferably identifies states associated with the circuit simulation that have not been produced by the original test cases. The genetic algorithm then combines characteristics of various test cases to generate new test cases. The new test cases are provided to the circuit simulator thereby providing a higher degree of confidence that the entire VLSI chip design has been simulated.
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Citations
20 Claims
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1. A method of simulating a circuit, comprising the steps of:
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identifying a set of logic events associated with said circuit, wherein the logic events are represented as data objects embodying logic equations;
generating a plurality of input test cases;
simulating operation of said circuit utilizing said plurality of input test cases;
tabulating for the plurality of input test cases and the set of logic events the numbers of times that each input test case stimulates logic event; and
identifying as non-occurring events one or more logic events that have not been stimulated more than a predetermined threshold of times. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A system for simulating, comprising:
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a data structure including a set of logic events associated with said circuit, wherein the logic events are represented as data objects embodying logic equations;
a first software routine generating a plurality of input test cases;
a second software routine applying said plurality of input test cases to a circuit simulator;
a third software routine tabulating for the plurality of input test cases and the set of logic events the numbers of times that each input test case stimulates each logic event; and
a fourth software routine identifying as non-occurring events one or more logic events that have not been stimulated more than a predetermined threshold of times. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18)
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19. A computer program product having a computer readable medium having programmable logic recorded thereon for testing a circuit, the computer product comprising:
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means for representing a set of logic events associated with said circuit as data objects embodying logic equations;
means for generating a plurality of input test cases for application to a circuit simulator;
means for tabulating for the plurality of input test cases and the set of logic events the numbers of times that each input test case stimulates each logic event;
means for identifying as non-occurring events one or more logic events that have not been stimulated more than a predetermined threshold of times;
means for selecting one event of said non-occurring events; and
means for comparing a logic equation of said one event against logic equations of logic events that have been simulated more than a predetermined threshold. - View Dependent Claims (20)
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Specification