Semiconductor device having multi-layer wiring
First Claim
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1. A semiconductor device comprising:
- a first insulating film comprising an organic material formed over a conductive layer;
a first metallic layer formed on said first insulating film;
a second metallic layer formed on said first metallic layer;
a second insulating film formed in contact with said second metallic layer, said first metallic layer and said first insulating film; and
a pixel electrode formed on said second insulating film, said pixel electrode being connected to said second metallic layer at the bottom of a contact hole provided in said second insulating film, wherein said conductive layer and said second metallic layer are directly connected to each other through a contact hole provided in said first metallic layer and said first insulating film.
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Abstract
The object is to pattern extremely fine integrated circuits by forming fine contact holes. The dry etching method is employed to form contact holes to pattern a wiring (114), using a mask made of metallic film (112) and an organic material as an inter-layer insulating film (111) for covering switching elements and each of the wirings.
182 Citations
36 Claims
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1. A semiconductor device comprising:
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a first insulating film comprising an organic material formed over a conductive layer;
a first metallic layer formed on said first insulating film;
a second metallic layer formed on said first metallic layer;
a second insulating film formed in contact with said second metallic layer, said first metallic layer and said first insulating film; and
a pixel electrode formed on said second insulating film, said pixel electrode being connected to said second metallic layer at the bottom of a contact hole provided in said second insulating film, wherein said conductive layer and said second metallic layer are directly connected to each other through a contact hole provided in said first metallic layer and said first insulating film. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A semiconductor device comprising:
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a first insulating film comprising an organic material formed over a thin film transistor;
a first metallic layer formed on said first insulating film;
a second metallic layer formed on said first metallic layer;
a second insulating film formed in contact with said second metallic layer, said first metallic layer and said first insulating film; and
a pixel electrode formed on said second insulating film, said pixel electrode being connected to said second metallic layer at the bottom of a contact hole provided in said second insulating film, wherein a source region or a drain region of said thin film transistor and said second metallic layer are directly connected to each other through a contact hole provided in said first metallic layer and said first insulating film. - View Dependent Claims (8, 9, 10, 11, 12)
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13. A semiconductor device comprising:
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a first insulating film comprising an organic material formed over a thin film transistor;
a first conductive layer formed on said first insulating film;
a second conductive layer formed on said first conductive layer;
a second insulating film formed in contact with said second conductive layer, said first conductive layer and said first insulating film; and
a pixel electrode formed on said second insulating film, said pixel electrode being connected to said second conductive layer at the bottom of a contact hole provided in said second insulating film, wherein a source region or a drain region and said second conductive layer are directly connected to each other through a contact hole provided in said first conductive layer and said first insulating film, wherein said second conductive layer is contact with said first insulating film inside of said contact hole. - View Dependent Claims (14, 15, 16, 17, 18)
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19. A semiconductor device comprising:
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a thin film transistor formed over a substrate, said thin film transistor having a semiconductor layer and a gate electrode adjacent to said semiconductor layer with a gate insulating film interposed therebetween;
a first insulating film comprising an organic material formed over said thin film transistor;
a first conductive layer formed on said first insulating film;
a second conductive layer formed on said first conductive layer;
a second insulating film formed in contact with said second conductive layer, said first conductive layer and said first insulating film; and
a pixel electrode formed on said second insulating film, said pixel electrode being connected to said second conductive layer at the bottom of a contact hole provided in said second insulating film, wherein said second conductive layer is directly connected to said semiconductor layer through a contact hole provided in said first conductive layer and said first insulating film. - View Dependent Claims (20, 21, 22, 23, 24)
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25. A semiconductor device comprising:
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a thin film transistor formed over a substrate, said thin film transistor having a semiconductor layer and a gate electrode adjacent to said semiconductor layer with a gate insulating film interposed therebetween;
a first insulating film comprising an organic material formed over said thin film transistor;
a first conductive layer formed on said first insulating film;
a second conductive layer formed on said first conductive layer;
a second insulating film formed in contact with said second conductive layer, said first conductive layer and said first insulating film; and
a pixel electrode formed on said second insulating film, said pixel electrode being connected to said second conductive layer at the bottom of a contact hole provided in said second insulating film, wherein said second conductive layer is directly connected to said semiconductor layer through a contact hole provided in said first conductive layer and said first insulating film. - View Dependent Claims (26, 27, 28, 29, 30)
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31. A semiconductor device comprising:
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a thin film transistor formed over a substrate, said thin film transistor having a semiconductor layer and a gate electrode adjacent to said semiconductor layer with a gate insulating film interposed therebetween;
a first insulating film comprising an organic material formed over said thin film transistor;
a first wiring formed on said first insulating film;
a second wiring formed on said first wiring;
a second insulating film formed in contact with said second wiring, said first wiring and said first insulating film; and
a pixel electrode formed on said second insulating film, said pixel electrode being connected to said second wiring at the bottom of a contact hole provided in said second insulating film, wherein said second wiring is directly connected to said semiconductor layer through a contact hole provided in said first wiring and said first insulating film. - View Dependent Claims (32, 33, 34, 35, 36)
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Specification