Method for measuring a gap between a proximity probe and a conductive target material

• US 6,861,852 B2
• Filed: 06/03/2003
• Issued: 03/01/2005
• Est. Priority Date: 10/22/1999
• Status: Expired due to Fees

• Current Assignee: Bently Nevada Incorporated (General Electric Company)
• Original Assignee: Bently Nevada Incorporated (General Electric Company)
• Inventors: Slates, Richard D.
• Primary Examiner(s): Zarneke, David A.
• Assistant Examiner(s): Kobert, Russell M
• Application Number:
  US10/449,931
• Publication Number:
  US 20030206003A1
• Time in Patent Office: 637 Days
• Field of Search: 324/603, 324/607, 324/608, 324/662, 324/671, 324/699, 324/713, 324/716, 324/207.15, 324/207.16, 702/155, 702/158, 702/166
• US Class Current: 324/699
• CPC Class Codes: G01B 7/003 for measuring position, not involving coordinate determination coordinate measuring G01B7/004
• CPC Class Codes: G01B 7/023 for measuring distance between sensor and object G01B7/082 and G01B7/102 take precedence
• CPC Class Codes: G01D 18/00 Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
• CPC Class Codes: G01D 5/202 by movable a non-ferromagnetic conductive element G01D5/2033 takes precedence
• CPC Class Codes: G01N 27/9046 by analysing electrical signals

Abstract

A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.

Claims

1. A method for measuring a gap between a proximity probe and a conductive target material, the steps including:

sampling and digitizing a first voltage impressed across a serial connection of a resistance means and a proximity probe located adjacent a conductive target material to obtain a first digital voltage correlative to the first voltage at a first frequency;

sampling and digitizing a second voltage impressed only across the probe to obtain a second digital voltage correlative to the second voltage at the first frequency,

digitally convolving the first digital voltage and the second digital voltage into a first complex voltage number and a second complex voltage number;

calculating an electrical impedance of the proximity probe at the first frequency by using the first complex voltage number and the second complex voltage number;

sampling and digitizing a third voltage impressed across the serial connection of the resistance means and the proximity probe located adjacent the conductive target material to obtain a third digital voltage correlative to the third voltage at a second frequency;

sampling and digitizing a fourth voltage impressed only across the probe to obtain a fourth digital voltage correlative to the fourth voltage at the second frequency,

digitally convolving the third digital voltage and the fourth digital voltage into a third complex voltage number and a fourth complex voltage number;

calculating a complex electrical impedance of the proximity probe at the second frequency by using the third complex voltage number and the fourth complex voltage number;

dividing a reactance of the calculated complex electrical impedance of the sensing coil at the first frequency by the reactance of the calculated complex electrical impedance of the sensing coil at the second different frequency for defining an inductive ratio;

correlating the inductive ratio to a value representative to a gap between the proximity probe and the conductive target material.