Method and apparatus for telemetered probing of integrated circuit operation

• US 6,865,503 B2
• Filed: 12/24/2002
• Issued: 03/08/2005
• Est. Priority Date: 12/24/2002
• Status: Active Grant

• Current Assignee: MACOM Technology Solutions Holdings, Inc.
• Original Assignee: Conexant Systems Incorporated (Synaptics Incorporated)
• Inventors: Yang, Kewei, Spencer, Sam L., Malpass, Welborn R, Kind, Keith A, Erlenborn, Mark L., Harper, George, Gemar, Jeff R.
• Primary Examiner(s): ASSOUAD, PATRICK J
• Application Number:
  US10/330,797
• Publication Number:
  US 20040113809A1
• Time in Patent Office: 805 Days
• Field of Search: 702/122, 702/117, 702/118, 702/120, 324/754, 324/537, 324/750, 324/555, 324/763, 324/765, 714/724, 714/733, 714/734
• US Class Current: 702/122
• CPC Class Codes: G01R 31/3025 Wireless interface with the DUT
• CPC Class Codes: G08C 19/16 in which transmission is by pulses

Abstract

State of test points on an integrated circuit are encapsulated in a telemetry frame that is wirelessly conveyed to a test system. Test points may be logic levels or analog levels converted into representative multi-bit values. Conveyance off the circuit may be by radio frequency or optical emission.

Claims

1. An integrated circuit fabricated and tested according to a method comprising the steps of:

identifying a plurality of test points within the integrated circuit;

capturing the electrical state present at the test points;

incorporating the electrical state present at the test points into a telemetry stream;

modulating an output signal according to the telemetry stream; and

emitting energy from a transducer driven by the output signal.

2. The integrated circuit yielded by the method of claim 1 wherein the step of capturing the electrical state present at the test points comprises the steps of:

representing the electrical state present at one of the test point as a binary logic state in accordance with the voltage present at the electrical test point; and

storing the logic level.

3. The integrated circuit yielded by the method of claim 1 wherein the step of capturing the electrical state present at the test point comprises the steps of:

converting the voltage level present at the test point to a digital value; and

storing the digital value.

4. The integrated circuit yielded by the method of claim 1 wherein the step of incorporating the electrical state present at the test point into a telemetry stream comprises the steps of:

assigning the test point to a time slot in a repeating data sequence; and

outputting the electrical state present at the test point during the assigned time slot.

5. The integrated circuit yielded by the method of claim 1 wherein the step of modulating an output signal according to the telemetry stream comprises:

generating an oscillating carrier signal; and

varying the oscillating carrier signal according to the telemetry stream.

6. The integrated circuit yielded by the method of claim 5 wherein the step of emitting energy from a transducer driven by the output signal comprises the step of radiating an oscillating electromagnetic field.

7. The integrated circuit yielded by the method of claim 5 wherein the step of emitting energy from a transducer driven by the output signal comprises the step of radiating optical energy.

8. The integrated circuit yielded by the method of claim 5 wherein the step of generating an oscillating carrier signal comprises the steps of:

generating an oscillating carrier signal at a particular frequency; and

periodically changing the frequency of the oscillating carrier signal according to a repeating numeric sequence.

9. The integrated circuit yielded by the method of claim 5 wherein the step of varying the oscillating carrier signal according to the telemetry stream comprises the step of varying the amplitude or the frequency of the carrier signal according to the telemetry stream.

10. The integrated circuit yielded by the method of claim 5 wherein the step of varying the oscillating carrier signal according to the telemetry stream comprises the step of shifting the phase of the carrier signal according to the telemetry stream.

11. The integrated circuit yielded by the method of claim 1 wherein the step of modulating an output signal according to the telemetry stream comprises the step of setting the output signal active or inactive according to the telemetry stream.

12. The integrated circuit yielded by the method of claim 11 wherein the step of emitting energy from a transducer driven by the output signal comprises the step of radiating optical energy.

13. An integrated circuit comprising:

application specific circuitry comprising a plurality of test points;

test point capture circuit that captures the electrical state of the predefined test points;

telemetry formatter that creates a telemetry stream by incorporating the captured electrical state of the test points;

modulator that generates a modulated output signal according to the telemetry stream; and

transducer that emits energy according to the modulated output signal.

14. The integrated circuit of claim 13 wherein the test point capture circuit comprises:

comparator that outputs a binary logic level in accordance with the voltage present at the test point; and

flip-flop that stores the binary logic level in accordance with a sample signal.

15. The integrated circuit of claim 13 wherein the test point capture circuit comprises:

analog-to-digital converter that generates a digital value representative of the voltage present at the test point; and

register that stores the digital value.

16. The integrated circuit of claim 13 wherein the telemetry formatter comprises:

control state machine that;

generates a load signal for capturing data;

generates a frame start identifier by selectively varying the state of a telemetry stream; and

generates a shift signal when captured data needs to be output as a serial data stream;

shift register that;

stores a plurality of data bits if the load signal is received; and

generates a digital data stream if the shift signal is received.

17. The integrated circuit of claim 13 wherein the modulator comprises:

oscillator that generates an oscillating carrier signal; and

adjustment circuit that varies the oscillating carrier signal according to the telemetry stream.

18. The integrated circuit of claim 17 wherein the transducer comprises an antenna that emits the oscillating carrier signal.

19. The integrated circuit of claim 17 wherein the transducer comprises an optical emitter that emits light in accordance with the oscillating carrier signal.

20. The integrated circuit of claim 17 wherein the oscillator comprises:

numeric sequence generator that generates a periodic sequence of digital values; and

numerically controlled frequency synthesizer that generates an oscillating signal in accordance with the digital value generated by the numeric sequence generator.

21. The integrated circuit of claim 17 wherein the adjustment circuit comprises an amplitude modulator that adjusts the amplitude of the oscillating carrier signal according to the telemetry stream or wherein the oscillator varies the frequency of the oscillating carrier signal according to a control voltage and the adjustment circuit comprises a frequency modulator that generates a control voltage according to the telemetry stream.

22. The integrated circuit of claim 17 wherein the adjustment circuit comprises a phase shifter that shifts the phase of the oscillating carrier signal in accordance with the telemetry stream.

23. The integrated circuit of claim 13 wherein the modulator comprises a comparator that outputs a logic level in accordance with the telemetry stream.

24. The integrated circuit of claim 23 wherein the transducer is an optical emitter that is enabled according to the logic level output by the modulator.