Method and system for extending delay and slew metrics to ramp inputs

• US 6,868,533 B2
• Filed: 11/26/2002
• Issued: 03/15/2005
• Est. Priority Date: 11/26/2002
• Status: Expired due to Fees

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Liu, Ying, Devgan, Anirudh, Alpert, Charles Jay, Kashyap, Chandramouli V.
• Primary Examiner(s): Siek, Vuthe
• Assistant Examiner(s): Dimyan, Magid Y.
• Application Number:
  US10/306,603
• Publication Number:
  US 20040103379A1
• Time in Patent Office: 840 Days
• Field of Search: 716/4, 716/1, 716/5, 716/6
• US Class Current: 716/113
• CPC Class Codes: G06F 30/33 Design verification, e.g. functional simulation or model checking

Abstract

A method of determining a circuit response (such as delay or slew) from a ramp input of an RC circuit calculates two circuit response parameters using a given circuit response metric based on a step input for the RC circuit, and extends the circuit response metric to a ramp input of the RC circuit by combining the first and second circuit response parameters to yield an estimated ramp response. The novel technique is based on the use of probability distribution functions and cumulative distribution functions to characterize the impulse response of the RC circuit, and the calculating steps derive the first and second circuit response parameters from such statistical distribution functions. In particular, the calculating steps may use a standard deviation or a mean of a probability distribution function corresponding to the circuit response parameter. In one application, the invention is used to estimate delay response for the ramp input of the RC circuit. In another application, the invention is used to estimate output slew for the ramp input of the RC circuit. The invention may be used to extend any valid delay or slew metric.

Claims

1. A method of determining a circuit response from a ramp input of a resistive-capacitive (RC) circuit, comprising the steps of:

calculating a first circuit response parameter using a given circuit response metric based on a step input for the RC circuit, wherein the circuit response metric is selected from a slew metric and a delay metric;

calculating a second circuit response parameter, different from the first circuit response parameter, using the same circuit response metric based on a step input for the RC circuit; and

extending the circuit response metric to the ramp input of the RC circuit by combining the first and second circuit response parameters to yield an estimated ramp response.

2. The method of claim 1 wherein said calculating steps derive the first and second circuit response parameters from a statistical distribution function.

3. The method of claim 2 wherein at least one of the first and second circuit response parameters is derived from a standard deviation of a probability distribution function corresponding to the circuit response parameter.

4. The method of claim 2 wherein at least one of the first and second circuit response parameters is derived from a mean of a probability distribution function corresponding to the circuit response parameter.

5. The method of claim 1 wherein:

said step of calculating the first circuit response parameter calculates a step slew;

said step of calculating the second circuit response parameter calculates an input slew; and

said step of extending the circuit response metric combines the step slew and input slew to yield an estimated output slew for the ramp input of the RC circuit.

6. The method of claim 5 wherein said step of extending the circuit response metric further combines the step slew (Slew(S)) and input slew (Slew(I)) to yield the estimated output slew (Slew(R)) according to the formula

Slew(R)=√

Slew²(S)+Slew²(I).

7. The method of claim 1 wherein:

said step of calculating the first circuit response parameter calculates a mean value for delay step response;

said step of calculating the second circuit response parameter calculates a median value for delay step response; and

said step of extending the circuit response metric combines the mean and median values for delay step response to yield an estimated delay for the ramp input of the RC circuit.

8. The method of claim 7 wherein said step of extending the circuit response metric further combines the mean value for delay step response (μ

(S)) and the median value for delay step response (M(S)) to yield the estimated delay (D(R)) according to the formula

D(R)=(1−

α

)μ

(S)+α

M(S),

where α

is a constant based on the standard deviations of the delay step response and an input waveform.

9. A data processing system for determining a circuit response from a ramp input of a resistive-capacitive (RC) circuit, comprising:

means for processing program instructions;

a memory device connected to said processing means; and

program instructions stored in said memory device for calculating a first circuit response parameter using a given circuit response metric based on a step input for the RC circuit, wherein the given circuit response metric is selected from a slew metric and a delay metric, calculating a second circuit response parameter different from the first circuit response parameter using the same circuit response metric based on a step input for the RC circuit, and extending the circuit response metric to the ramp input of the RC circuit by combining the first and second circuit response parameters to yield an estimated ramp response.

10. The data processing system of claim 9 wherein said program instructions derive the first and second circuit response parameters from a statistical distribution function.

11. The data processing system of claim 10 wherein at least one of the first and second circuit response parameters is derived from a standard deviation of a probability distribution function corresponding to the circuit response parameter.

12. The data processing system of claim 10 wherein at least one of the first and second circuit response parameters is derived from a mean of a probability distribution function corresponding to the circuit response parameter.

13. The data processing system of claim 9 wherein:

said program instructions calculate the first circuit response parameter by calculating a step slew;

said program instructions calculate the second circuit response parameter by calculating an input slew; and

said program instructions combine the step slew and input slew to yield an estimated output slew for the ramp input of the RC circuit.

14. The data processing system of claim 13 wherein said program instructions further combine the step slew (Slew(S)) and input slew (Slew(I)) to yield the estimated output slew (Slew(R)) according to the formula

Slew(R)=√

Slew²(S)+Slew²(I).

15. The data processing system of claim 9 wherein:

said program instructions calculate the first circuit response parameter by calculating a mean value for delay step response;

said program instructions calculate the second circuit response parameter by calculating a median value for delay step response; and

said program instructions combine the mean and median values for delay step response to yield an estimated delay for the ramp input of the RC circuit.

16. The data processing system of claim 15 wherein said program instructions further combine the mean value for delay step response (μ

(S)) and the median value for delay step response (M(S)) to yield the estimated delay (D(R)) according to the formula

D(R)=(1−

α

)μ

(S)+α

M(S),

where α

is a constant based on the standard deviations of the delay step response and an input waveform.

17. A computer program product for determining a circuit response from a ramp input of a resistive-capacitive (RC) circuit, comprising:

a computer-readable medium; and

program instructions residing in said medium for calculating a first circuit response parameter using a given circuit response metric based on a step input for the RC circuit, wherein the given circuit response metric is selected from a slew metric and a delay metric, calculating a second circuit response parameter different from the first circuit response parameter using the same circuit response metric based on a step input for the RC circuit, and extending the circuit response metric to the ramp input of the RC circuit by combining the first and second circuit response parameters to yield an estimated ramp response.

18. The computer program product of claim 17 wherein said program instructions derive the first and second circuit response parameters from a statistical distribution function.

19. The computer program product of claim 18 wherein at least one of the first and second circuit response parameters is derived from a standard deviation of a probability distribution function corresponding to the circuit response parameter.

20. The computer program product of claim 18 wherein at least one of the first and second circuit response parameters is derived from a mean of a probability distribution function corresponding to the circuit response parameter.

21. The computer program product of claim 17 wherein:

said program instructions calculate the first circuit response parameter by calculating a step slew;

said program instructions calculate the second circuit response parameter by calculating an input slew; and

said program instructions combine the step slew and input slew to yield an estimated output slew for the ramp input of the RC circuit.

22. The computer program product of claim 21 wherein said program instructions further combine the step slew (Slew(S)) and input slew (Slew(I)) to yield the estimated output slew (Slew(R)) according to the formula

Slew(R)=√

Slew²(S)+Slew²(I).

23. The computer program product of claim 17 wherein:

said program instructions calculate the first circuit response parameter by calculating a mean value for delay step response;

said program instructions calculate the second circuit response parameter by calculating a median value for delay step response; and

said program instructions combine the mean and median values for delay step response to yield an estimated delay for the ramp input of the RC circuit.

24. The computer program product of claim 23 wherein said program instructions further combine the mean value for delay step response (μ

(S)) and the median value for delay step response (M(S)) to yield the estimated delay (D(R)) according to the formula

D(R)=(1−

α

)μ

(S)+α

M(S),

where α

is a constant based on the standard deviations of the delay step response and an input waveform.