Digitizing temperature measurement system

• US 6,869,216 B1
• Filed: 03/27/2003
• Issued: 03/22/2005
• Est. Priority Date: 03/27/2003
• Status: Active Grant

• Current Assignee: National Semiconductor Corporation (Texas Instruments, Inc.)
• Original Assignee: National Semiconductor Corporation (Texas Instruments, Inc.)
• Inventors: Wan, Jun, Blom, Eric D., Urie, Stuart H., Holloway, Peter R.
• Primary Examiner(s): Gutierrez, Diego
• Assistant Examiner(s): Jagan, Mirellys
• Application Number:
  US10/402,658
• Time in Patent Office: 726 Days
• Field of Search: 374/170, 374/178, 374/173, 374/168, 374/172, 374/171, 257/470, 327/512, 327/336, 341/143
• US Class Current: 374/170
• CPC Class Codes: G01K 1/028 arrangements for numerical indication
• CPC Class Codes: G01K 7/01 using semiconducting elements having PN junctions G01K7/02, G01K7/16, G01K7/30 take precedence
• CPC Class Codes: H03M 3/324 characterised by means or methods for compensating or preventing more than one type of error at a time, e.g. by synchronisation or using a ratiometric arrangement
• CPC Class Codes: H03M 3/43 the quantiser being a single bit one
• CPC Class Codes: H03M 3/456 the modulator having a first order loop filter in the feedforward path

Abstract

A digitizing temperature measurement system for providing a digital temperature measurement includes an excitation source for providing switched excitation currents to two or three temperature sensing elements and an ADC circuit including a charge-balancing modulator and a digital post processing circuit. The system utilizes synchronous AC excitation of the temperature sensing elements and an AC coupled analog-to-digital converter input. The temperature measurement system also implements correlated double sampling for noise cancellation to provide low noise and highly accurate analog-to-digital conversions. The modulator receives a charge domain reference signal generated by a reference charge packet generator incorporating a charge based bandgap subsystem. Therefore, the temperature measurement system can be operated at very low supply voltages, such as 1.0 Vdc. A low noise and highly accurate temperature measurement system is thus realized where temperature measurements of very high resolutions (up to 16 bit) can be attained.

Claims

1. A temperature measurement system comprising:

a switched excitation circuit coupled to excite a temperature sensing element for generating an input voltage step; and

an analog-to-digital converter (ADC) circuit coupled to sample said input voltage step and generate a temperature output signal, said ADC circuit comprising;

a modulator coupled to integrate charge associated with said input voltage step and balance said charge with a charge domain reference signal generated entirely in the charge domain, said modulator generating a digital output signal, said digital output signal forming a digital data stream over a plurality of sampling cycles where said digital data steam has an ones density proportional to the magnitude of said input voltage step; and

post processing circuit coupled to receive said digital data stream and generating a digital number indicative of the occurrence of ones in said digital data stream within said plurality of sampling cycles as said temperature output signal.

2. The temperature measurement system of claim 1, wherein said charge domain reference signal comprises two component charge packets, said input voltage step and at least one of said two component charge packets of said charge domain reference signal are AC coupled to said modulator of said ADC circuit.

3. The temperature measurement system of claim 1, wherein said post processing circuit comprises:

a counting circuit receiving said digital data stream and counting occurrences of ones in said digital data stream over a plurality of sampling cycles, said counting circuit generating a count value; and

an offset subtraction circuit receiving said count value and subtracting from said count value an offset value to generate a temperature output value, wherein said offset value comprises a value for converting said count value from degree Kelvin to degree Centigrade.

4. The temperature measurement system of claim 3, wherein a first trim value is applied to said counting circuit to adjust a total number of sampling cycles for which said occurrences of ones are counted, and a second trim value is applied to said offset subtraction circuit to adjust the value of said offset value.

5. The temperature measurement system of claim 1, wherein said charge domain reference signal comprises a reference charge packet and wherein said modulator applies said reference charge packet to balance said charge associated with said input voltage step based on a data dependent signal, said data dependent signal having a value corresponding to said digital output signal of said modulator.

6. The temperature measurement system of claim 5, wherein said modulator comprises:

an integer coupled to sample said input voltage step in synchronous with the excitation of said temperature sensing element and to generate an integrator output signal, said integrator comprising;

an input capacitor having a first terminal coupled to said temperature sensing element and a second terminal;

an amplifier having a first input terminal coupled to said second terminal of said input capacitor and an output terminal, said input voltage step being AC coupled through said input capacitor to said first input terminal of said amplifier;

an accumulation capacitor having a first terminal coupled to said first input terminal of said amplifier and a second terminal providing said integrator output signal;

a first switch coupled between said first input terminal and said output terminal of said amplifier, said first switch being controlled by said data dependent signal; and

a second switch coupled between said second terminal of said accumulation capacitor and said output terminal of said amplifier, said second switch being controlled by an inverse of said data dependent signal;

a reference charge packet generator generating said reference charge packet based on a first temperature-dependent voltage step and a second temperature-dependent voltage step, at least one of said first and second temperature-dependent voltage steps being AC coupled to said first input terminal of said amplifier; and

a comparator having an input terminal coupled to receive a signal corresponding to said integrator output signal and comparing said signal to a reference level, said comparator generating said digital output signal at an output terminal.

7. The temperature measurement system of claim 6, wherein said temperature sensing element comprises a first isothermal diode, and said reference charge packet generator comprises a second isothermal diode, said second isothermal diode being excited by said switched excitation source to generate said first and second temperature-dependent voltage steps.

8. The temperature measurement system of claim 7, wherein said first temperature-dependent voltage step comprises Δ

V_BE voltage of said second isothermal diode as a result of the switched excitation of said second isothermal diode by a first current and a second current, and said second temperature-dependent voltage step comprises a V_BEH voltage of said second isothermal diode as a result of the excitation of said second isothermal diode by the greater of the first and second currents.

9. The temperature measurement system of claim 7, wherein said reference charge packet generator further comprises:

a first capacitor having a first terminal coupled to an anode terminal of said second isothermal diode and a second terminal coupled to said first input terminal of said amplifier;

a third switch coupled between said anode terminal of said second isothermal diode and a first node, said third switch being controlled by a first clock signal;

a fourth switch coupled between said first node and a ground node, said fourth switch being controlled by an inverse of said first clock signal; and

a second capacitor having a first terminal coupled to said first node and a second terminal coupled to said first input terminal of said amplifier, said first capacitor being m times larger than said second capacitor;

wherein said first temperature-dependent voltage step is generated at said anode terminal of said second isothermal diode as a result of the switched excitation of said second isothermal diode by a first current and a second current, and said second temperature-dependent voltage step is generated at said first node as a result of switching said first node from said ground node to said anode terminal of said second isothermal diode by the action of said third and fourth switches during the switched excitation of said second isothermal diode by said second current, said first temperature-dependent voltage step being AC coupled to said first input terminal of said amplifier; and

wherein said second current is larger than said first current, said first temperature-dependent voltage step comprises a Δ

V_BE voltage of said second isothermal diode and said second temperature-dependent voltage step comprises a V_BEH voltage of said second isothermal diode.

10. The temperature measurement system of claim 7, wherein said reference charge packet generator further comprises:

a first capacitor having a first terminal coupled to an anode terminal of said second isothermal diode and a second terminal coupled to said first input terminal of said amplifier;

a third switch coupled between said anode terminal of said first isothermal diode and a first node, said third switch being continued by a first clock signal;

a fourth switch coupled between said first node and a ground node, said fourth switch being controlled by an inverse of said first clock signal; and

a second capacitor having a first terminal coupled to said first node and a second terminal coupled to said first input terminal of said amplifier, said first capacitor being (m+1) times larger than said second capacitor;

wherein said first temperature-dependent voltage step is generated at said anode terminal of said second isothermal diode as a result of the switched excitation of said second isothermal diode by a first current and a second current, and said second temperature-dependent voltage step is generated at said first node as a result of switching said first node from said ground node to said anode terminal of said first isothermal diode by the action of said third and fourth switches during the switched excitation of said first isothermal diode by said first current, said first temperature-dependent voltage step being AC coupled to said first input terminal of said amplifier; and

wherein said first current is smaller than said second current, said first temperature-dependent voltage step comprises a Δ

V_BE voltage of said second isothermal diode and said second temperature-dependent voltage step comprises a V_BEL voltage of said first isothermal diode.

11. The temperature measurement system of claim 7, wherein said switched excitation circuit comprises at least one current source, said at least one current source being switchably coupled to excite said first isothermal diode and said second isothermal diode.

12. The temperature measurement system of claim 6, further comprising:

a logic circuit for generating said data dependent signal and said inverse, said logic circuit receiving an input signal corresponding to said digital output signal and a first clack signal,

wherein said first clock signal is asserted to cause said data dependent signal to be at a first value for operating said integrator in said correlated double sampling mode.

13. The temperature measurement system of claim 6, wherein said integrator further comprises an inverting buffer having an input terminal coupled to said second terminal of said accumulation capacitor and an output terminal coupled to said input terminal of said comparator, said comparator receiving an input signal being an inverse of said integrator output signal.

14. The temperature measurement system of claim 6, wherein said amplifier comprises a self-referential transconductance amplifier.

15. The temperature measurement system of claim 6, wherein said comparator further comprises a second input terminal coupled to receive a reference voltage as said reference level.

16. The temperature measurement system of claim 6, wherein said comparator comprises a self-referential transconductance amplifier including one or more transconducting inverters.

17. The temperature measurement system of claim 6, wherein each of said first switch and said second switch comprises a self-bootstrapping constant on-resistance switch circuit.

18. The temperature measurement system of claim 6, wherein said integrator integrates charges associated with a rising edge of said input voltage step, and said data dependent signal directing said integrator to either integrate said reference charge packet associated with the falling edges of said first and second temperature-dependent voltage steps or disregard said reference charge packet.

19. The temperature measurement system of claim 6, wherein said reference charge packet is generated based on at least one temperature-dependent voltage step, said integrator integrates charges associated with a falling edge of said input voltage step, and said data dependent signal directing said integrator to either integrate said reference charge packet associated with the rising edges of said first and second temperature-dependent voltage steps or disregard said reference charge packet.

20. The temperature measurement system of claim 6, wherein said first switch is closed and said second switch is open to operate said integrator in a correlated double sampling mode for enabling said amplifier to store an amplifier error voltage onto said input capacitor.

21. The temperature measurement system of claim 20, wherein said amplifier error voltage comprises an amplifier offset voltage, 1/f noise and wideband amplifier noise.

22. The temperature measurement system of claim 6, wherein said temperature sensing element comprises a first isothermal diode, and said reference charge packet generator comprises a second isothermal diode being excited to generate said first temperature-dependent voltage step and a third isothermal diode being excited to generate said second temperature-dependent voltage step.

23. The temperature measurement system of claim 22, wherein said first temperature-dependent voltage step comprises a Δ

V_BE voltage of said second isothermal diode as a result of the switched excitation of said second isothermal diode by a first current and a second current, and said second temperature-dependent voltage step comprises a V_BEH voltage of said third isothermal diode as a result of the excitation of said third isothermal diode of the greater of the first and second currents.

24. The temperature measurement system of claim 22, wherein said reference charge packet generator further comprises:

a first capacitor having a first terminal coupled to an anode terminal of said second isothermal diode and a second terminal coupled to said first input terminal of said amplifier, said second isothermal diode being excited by a first current and a second current;

a third switch coupled between a third current source and an anode terminal of said third isothermal diode, said third switch being controlled by a fist clock signal, said third current source providing a third current having the same magnitude as said second current to said third isothermal diode;

a fourth switch coupled between said anode terminal of said third isothermal diode and a ground node, said fourth switch being controlled by an inverse of said first clock signal; and

a second capacitor having a first terminal coupled to said anode terminal of said third isothermal diode and a second terminal coupled to said first input terminal of said amplifier;

wherein said first temperature-dependent voltage step is generated at said anode terminal of said second isothermal diode and said second temperature dependent voltage step is generated at said anode terminal of said third isothermal diode, said first and second temperature-dependent voltage steps being AC coupled to said first input terminal of said amplifier.

25. The temperature measurement system of claim 24, wherein said first temperature-dependent voltage step comprises a Δ

V_BE voltage of said second isothermal diode as a result of the switched excitation of said second isothermal diode by said first current and said second current, and said second temperature-dependent voltage step comprises a V_BEH voltage of said third isothermal diode as a result of the excitation of said third isothermal diode by said third current, said third current being larger than said first current, and wherein said first capacitor is m times larger than said second capacitor.

26. The temperature measurement system of claim 24, wherein said first temperature-dependent voltage step comprises a Δ

V_BE voltage of said second isothermal diode as a result of the switched excitation of said second isothermal diode by said first current and said second current, and said second temperature-dependent voltage step comprises a V_BEL voltage of said third isothermal diode as a result of the excitation of said third isothermal diode by said third current, said third current being smaller than said first current, and wherein said first capacitor is (m+1) times larger than said second capacitor.