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Profiling of a component having reduced sensitivity to anomalous off-axis reflections

  • US 6,870,631 B2
  • Filed: 06/27/2002
  • Issued: 03/22/2005
  • Est. Priority Date: 08/06/1999
  • Status: Expired due to Fees
First Claim
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1. A system for measuring the profile of an external surface of a component comprising:

  • a plurality of profilometry systems surrounding the component, each profilometry system comprising;

    a source of light that emits light destined to be incident onto a plurality of locations within a region of an external surface of a component;

    a linear, light-sensitive sensor;

    a lens used to image the plurality of locations within the region onto said linear, light-sensitive sensor; and

    a re-positionable mirror positioned in the light path between the region and said source of light, said lens, and said linear, light-sensitive sensor, wherein said re-positionable mirror re-directs the light emitted from said source of light to said plurality of locations within the region and re-directs light scattered, diffracted, or reflected from said plurality of locations within the region to said lens and said linear, light-sensitive sensor;

    wherein said source of light and said linear, light-sensitive sensor are positioned substantially within the same plane such that said linear, light-sensitive sensor detects substantially only light scattered, diffracted, or reflected from the region and traveling substantially within said plane; and

    wherein each profilometry system is calibrated in a common coordinate system to produce an integrated profile of the component.

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