×

Method and apparatus for monitoring the operation of a wafer handling robot

  • US 6,871,115 B2
  • Filed: 10/11/2002
  • Issued: 03/22/2005
  • Est. Priority Date: 10/11/2002
  • Status: Expired due to Fees
First Claim
Patent Images

1. A method of monitoring the operation of a robot used to transport wafers in a semiconductor manufacturing operation, comprising the steps of:

  • (A) sensing control signals sent to said robot by a controller, and detecting said signals during transmission thereof from a motor controller to a motor drive used to drive said robot;

    (B) comparing characteristics of the control signals sensed in step (A) with a set of reference characteristics representing correct commands to said robot; and

    , (C) issuing an error signal based on the comparison performed in step (B).

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×