Combined waveform and data entry apparatus and method for facilitating fast behavioral verification of digital hardware designs

• US 6,871,331 B1
• Filed: 06/13/2003
• Issued: 03/22/2005
• Est. Priority Date: 05/04/2000
• Status: Expired due to Term

• Current Assignee: Xilinx, Inc. (Advanced Micro Devices, Inc.)
• Original Assignee: Xilinx, Inc. (Advanced Micro Devices, Inc.)
• Inventors: Escoto, Rodrigo Jose, Bloom, Andrew Maurice
• Primary Examiner(s): Siek, Vuthe
• Assistant Examiner(s): LEVIN, NAUM B
• Application Number:
  US10/461,014
• Time in Patent Office: 648 Days
• Field of Search: 716/1, 716 3- 6, 714738-744, 713/400, 713/500, 713/501, 713/503, 713/600
• US Class Current: 716/102
• CPC Class Codes: G06F 30/33 Design verification, e.g. functional simulation or model checking

Abstract

A computer implemented apparatus and method that automates the entry, modification, analysis, and generation of test benches from electrical circuits, both of which are specified as hardware description language (HDL) files. The computer implemented-method and apparatus also provides a unique mechanism that blends entry and display of timing requirements that must be met by the electric circuit.

Claims

1. A computer-aided method for constructing software test benches based upon a software description of an electrical circuit, comprising the steps of:

displaying a spreadsheet comprised of a timing waveform derived from time-dependent data patterns, wherein said time-dependent data patterns correspond to said software description, wherein said spreadsheet comprises rows and columns, said rows representing signal names and said columns representing cell values of said time-dependent data patterns, wherein said timing waveform is superimposed upon at least part of said cell values;

modifying said data patterns; and

translating, automatically, said timing waveform into a test bench file.

2. The computer-aided method of claim 1 wherein if a user does not manually enter a cell value in a column, then said cell value in said column is identical to the cell value in the column immediately proceeding said column but is not displayed therein.

3. The computer-aided method of claim 1 wherein said signal data patterns are represented in binary form or hexadecimal form or decimal form or a combination thereof.

4. The computer-aided method of claim 1 wherein said waveform is automatically modified to correspond to an update in said software description.

5. The computer-aided method of claim 1 wherein said modifying said data patterns is via one or more click events initiated by the user.

6. The computer-aided method of claim 1 further comprising means for updating said waveform subsequent to simulation of said test bench.