Post thermal treatment methods of forming high dielectric layers in integrated circuit devices
First Claim
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1. A method for treating a high dielectric layer of a semiconductor device, comprising:
- nitriding a high dielectric layer on a silicon substrate, wherein said high dielectric layer comprises a multi-layered nano laminate formed by forming a hafnium oxide layer or a zirconium oxide layer directly on the substrate using atomic layer deposition and then forming a Group 3 metal oxide layer thereon using atomic layer deposition; and
post treating the high dielectric layer and silicon substrate.
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Abstract
High dielectric layers formed from layers of hafnium oxide, zirconium oxide, aluminum oxide, yttrium oxide, and/or other metal oxides and silicates disposed on silicon substrates may be nitrided and post thermally treated by oxidation, annealing, or a combination of oxidation and annealing to form high dielectric layers having superior mobility and interfacial characteristics.
37 Citations
29 Claims
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1. A method for treating a high dielectric layer of a semiconductor device, comprising:
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nitriding a high dielectric layer on a silicon substrate, wherein said high dielectric layer comprises a multi-layered nano laminate formed by forming a hafnium oxide layer or a zirconium oxide layer directly on the substrate using atomic layer deposition and then forming a Group 3 metal oxide layer thereon using atomic layer deposition; and
post treating the high dielectric layer and silicon substrate. - View Dependent Claims (2, 3, 4, 5)
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6. A method for treating a high dielectric layer of a semiconductor device, comprising:
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nitriding a silicon substrate and a high dielectric layer on said silicon substrate, said high dielectric layer comprising a multi-layered nano laminate formed by forming a hafnium oxide layer or a zirconium oxide layer directly on the substrate using atomic layer deposition and then forming a Group 3 metal oxide layer thereon using atomic layer deposition; and
then annealing the silicon substrate and high dielectric layer. - View Dependent Claims (7, 8, 9, 10, 11)
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12. A method for treating a high dielectric layer of a semiconductor device, comprising:
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nitriding a silicon substrate and a high dielectric layer on said silicon substrate, said high dielectric layer comprising a multi-layered nano laminate formed by forming a hafnium oxide layer or a zirconium oxide layer directly on the substrate using atomic layer deposition, and then forming a Group 3 metal oxide layer thereon using atomic layer deposition; and
then oxidizing the silicon substrate and high dielectric layer. - View Dependent Claims (13, 14, 15, 16, 17, 18)
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19. A method for treating a high dielectric layer of a semiconductor device, comprising:
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nitriding a silicon substrate and a high dielectric layer on said silicon substrate, said high dielectric layer comprising a multi-layered nano laminate formed by forming a hafnium oxide layer or a zirconium oxide layer directly on the substrate using atomic layer deposition, and then forming a Group 3 metal oxide layer thereon using atomic layer deposition; and
thenoxidizing the silicon substrate and high dielectric layer; and
annealing the nitrided and oxidized silicon substrate and high dielectric layer. - View Dependent Claims (20, 21, 22, 23, 24, 25, 26, 27, 28)
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29. A method for treating a multi-layered nano laminate high dielectric layer of an integrated circuit device, comprising nitriding to provide a nitride profile concentration in the high dielectric layer that is greater adjacent to a polysilicon/high dielectric layer interface than adjacent to a silicon/high dielectric layer interface, wherein the multi-layered nano laminate is formed by forming a hafnium oxide layer or a zirconium oxide layer directly on the substrate using atomic layer deposition, and then forming a Group 3 metal oxide layer thereon using atomic layer deposition.
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