Parallel insulation fault detection system

• US 6,876,203 B2
• Filed: 06/10/2002
• Issued: 04/05/2005
• Est. Priority Date: 06/11/2001
• Status: Expired due to Term

• Current Assignee: Astronics Advanced Electronic Systems Corporation (Astronics Corporation)
• Original Assignee: Astronics Advanced Electronic Systems Corporation (Astronics Corporation)
• Inventors: Blades, Frederick K.
• Primary Examiner(s): Le, N.
• Assistant Examiner(s): Dole, Timothy J.
• Application Number:
  US10/167,671
• Publication Number:
  US 20020196031A1
• Time in Patent Office: 1,030 Days
• Field of Search: 324/539, 324/540, 324/541, 324/544, 324/551, 324/459
• US Class Current: 324/536
• CPC Class Codes: G01R 1/07 Non contact-making probes
• CPC Class Codes: G01R 15/16 using capacitive devices
• CPC Class Codes: G01R 31/11 using pulse reflection methods

Abstract

A device for detecting and locating arcs in a set of wires is discussed. The device comprises a probe for discharging controlled current to an exposed portion of a wire in the set of wires. The probe includes a handleable enclosure and an elongated structure which projects from the enclosure for conducting a gas and for enclosing a needle that has a tip. A suitable gas includes gases that have low electron attachment, such as helium. The device further comprises a control unit for communicating control signals as well as the gas to the probe. The control unit includes a controller, a valve being controllable by the controller and being capable of regulating the flow of the gas, and a high-voltage generator being controllable by the controller to generate a high-voltage signal, which can be communicated to the probe by the control unit.

Claims

1. A system for detecting and locating parallel arc faults in a set of wires, at least, a parallel arc fault being defined as a condition in which wires in the set of wires are close enough to produce an arc, the arc being capable of producing an incident waveform and a reflected waveform, the two waveforms together forming a pulse that has a width, the system comprising:

a first device that includes;

a controller for receiving information and for processing the information to produce a number of control signals;

a current source having a first terminal coupled to a first node and a second terminal coupled to ground, the current source being controlled by the controller to produce a direct current so as to charge a capacitance up to the testing voltage, the capacitance being defined between a wire under test and the remaining wires of the set of wires;

a timing circuit interfaced to the controller, the timing circuit having a first terminal coupled to the first node and a second terminal coupled to ground, the timing circuit being receptive to the incident waveform and the reflected waveform at the first terminal so as to measure the width of the pulse, the width being approximately proportional to the distance from the device to the arc;

a sequencer for coupling the wire under test to the first node while grounding the remaining wires of the set of wires, the sequencer defining the wire under test as a previous wire under test when the device cannot detect the arc on the wire under test, the sequencer being adapted to choose another wire of the remaining wires of the set of wires and define the another wire as the wire under test while grounding the previous wire under test and the remaining wires; and

a reflection minimizer interposed between the sequencer and at least one wire from the remaining set of wires, the reflection minimizer being capable of minimizing the attenuation of the amplitude of the pulse.

2. The system of claim 1, wherein the reflection minimizer is a resistor approximately equal in value to the characteristic impedance of the wire under test.

3. The system of claim 1, wherein the first device further comprises a user interface device coupled to the controller, the user interface including a display for displaying information from the controller and a keyboard for inputting information into the controller.

4. The system of claim 3, wherein the display of the first device is adapted to display the insulation resistance of the wire under test and the capacitance.

5. The system of claim 1, wherein the current source of the first device includes a voltage switching supply to produce DC voltage as determined by the controller, the DC voltage being in the range of less than about 6000 volts, the current source including a resistor coupled to the voltage switching supply, the resistor being in the range of about 1 gigaohm.

6. The system of claim 1, wherein the first device further comprises a voltage sensor for sensing a voltage level at the first node, the voltage sensor being comprised of a voltage divider.

7. The system of claim 1, wherein the first device further comprises a first relay that is actuated by the controller and is further adapted to couple the first node from ground.

8. The system of claim 1, wherein the timing circuit of the first device comprises:

means for measuring the width of the pulse, the width being proportional to the time for the incident waveform or the reflected waveform to travel from the parallel arcing fault back to the device; and

means for calculating the distance to the parallel arcing fault by multiplying the propagation speed in the wire under test by one-half of the width of the pulse.

9. The system of claim 1, further including a second device having a common, the second device comprising:

a probe having a tip that is capable of discharging current to the wire on which the arc originates;

a high-voltage supply having one polarity coupled to the tip of the probe and another polarity coupled to the common;

a distance estimator for calculating the distance from the probe to the arc by analyzing the amount of discharged current, which is approximately proportional to the distance from the probe to the conductor; and

a gas supplier having a nozzle for supplying a gas, which has low electron attachment, within proximity to the tip of the probe.

10. The system of claim 9, wherein the common is coupled to the airframe.

11. The system of claim 9, wherein the common is coupled to the wire under test.

12. The system of claim 11, wherein the first device further comprises a second relay that is actuated by the controller and is further adapted to couple the first node at least to one of the current source and the common.

13. The system of claim 9, wherein the second device further comprises a first sensing circuit that senses when the probe is within a small fraction of an inch of the arc so as to indicate to the user that the are has been located.

14. The system of claim 9, wherein the second device further comprises a second sensing circuit that senses whether the wire under test is powered by an AC line voltage.

15. A method for detecting parallel arc faults in a set of wires, the method comprising:

selecting a first wire of the set of wires and defining the first wire as a wire under test while grounding the remaining wires in the set of wires to define these remaining wires as ground wires;

charging a capacitance defined between the wire under test and the ground wires using a current source to ramp up the voltage on the wire under test to a maximum test voltage lever;

determining that an arc has occurred when the voltage on the wire under test drops precipitously; and

calculating the approximate distance to an arc when the arc has occurred on the wire under test by determining the difference in arrival times among incident and reflected waveforms from the arc.

16. The method of claim 15, further comprising pointing a probe toward the set of wires to locate the arc, the probe having a tip being capable of conducting current to the wire under test.

17. The method of claim 16, wherein determining that an arc has occurred includes coupling one polarity of a high-voltage source to a tip of a probe and another polarity of the high-voltage source to a common, the common being coupled to the wire under test.

18. The method of claim 17, further comprising flowing a low electron-attachment gas within the vicinity of the tip of the probe so as to increase the conduction of current to a location on the wire under test where the arc originates.

19. The method of claim 16, further comprising sensing by a first sense circuit when the probe is within a fraction of an inch of the arc so as to indicate to the user that the are has been located.