Spectral characteristic measuring apparatus and method for correcting wavelength shift of spectral sensitivity in the apparatus

• US 6,876,448 B2
• Filed: 07/12/2002
• Issued: 04/05/2005
• Est. Priority Date: 07/12/2001
• Status: Active Grant

• Current Assignee: Minolta Corporation Limited (Konica Minolta Inc.)
• Original Assignee: Minolta Corporation Limited (Konica Minolta Inc.)
• Inventors: Ichikawa, Susumu, Imura, Kenji
• Primary Examiner(s): LAUCHMAN, LAYLA G
• Application Number:
  US10/193,291
• Publication Number:
  US 20030011767A1
• Time in Patent Office: 998 Days
• Field of Search: 356/301, 356/73, 356/72, 356/319, 356/323, 356/325, 356/326, 356/328, 356/317, 356/378, 356/408, 356/425, 250/461.1, 250/252.1
• US Class Current: 356/326
• CPC Class Codes: G01J 2003/2866 Markers; Calibrating of scan
• CPC Class Codes: G01J 3/0254 Spectrometers, other than colorimeters, making use of an integrating sphere
• CPC Class Codes: G01J 3/10 Arrangements of light sources specially adapted for spectrometry or colorimetry
• CPC Class Codes: G01J 3/28 Investigating the spectrum using colour filters G01J3/51

Abstract

A spectral characteristic measuring apparatus is provided with a memory and a CPU. The memory stores a spectral profile output from a sample light sensor array when light from a lamp is received, and a plurality of spectral profiles to be output from the sensor array at each displaced position in the case where a light separator is displaced relative to a grating member of the sensor array at a certain pitch stepwise in a wavelength diffusing direction. The CPU controls the lamp to emit light in a state that a white plate for calibration is disposed as a sample, compares a spectral profile output from the sensor array for correction with each spectral profile stored in the memory, and sets a displacement amount corresponding to the spectral profile that is most approximate to the corrective spectral profile as a wavelength shift correction amount.

Claims

1. A spectral characteristic measuring apparatus comprising:

an illuminator for illuminating a sample to be measured;

an illuminator controller for controlling the illuminator to emit light from a light source;

a light separator for separating rays of the light from the sample according to wavelengths;

a light receiver including an array of photoelectric conversion elements arrayed at a certain interval in a wavelength diffusing direction of the light separator to receive rays of light in the different wavelengths so as to output a light receiving signal corresponding to a received light intensity, the light receiver outputting a spectral profile being formed by a plurality of light receiving signals;

a spectral sensitivity storage unit for storing spectral sensitivities of the photoelectric conversion elements;

a spectral characteristic calculator for calculating a spectral characteristic of the sample in a predetermined wavelength band for measurement with use of the spectral profile and the spectral sensitivities of the photoelectric conversion elements;

a reference spectral profile group storage unit for storing a reference spectral profile group including a spectral profile in a specific wavelength band including at least a specific wavelength which is output from the light receiver when the light receiver receives light from a the light source having a light intensity peak at the specific wavelength in an initial state of the apparatus, and a plurality of spectral profiles in the specific wavelength band to be output from the light receiver at each displaced position when the light receiver is displaced relative to the light separator in the wavelength diffusing direction at a certain pitch stepwise;

a correction controller for controlling the light source to emit light in a calibratable state of the apparatus, after the initial state thereof; and

a correction amount calculator for comparing a spectral profile for correction which is output from the light receiver when the light source is caused to emit light, and each spectral profile stored in the reference spectral profile group storage unit in the specific wavelength band, and which sets a shift amount corresponding to the spectral profile which is stored in the reference spectral profile group storage unit and is most approximate to the corrective spectral profile as a wavelength shift correction amount to correct the relative displacement of the light receiver after the initial state of the apparatus.

2. The apparatus according to claim 1, wherein the light source has a spectral intensity distribution including continuous spectra and a bright line spectrum at the specific wavelength.

3. The apparatus according to claim 2, wherein the light source includes a flash lamp which is caused to emit light in an array of pulses, the illuminator controller controls the flash lamp to emit light for a first duration, and the correction controller controls the flash lamp to emit light for a second duration, the second duration being shorter than the first duration.

4. The apparatus according to claim 2, wherein:

the light source includes a xenon flash lamp; and

the specific wavelength includes a wavelength corresponding to the bright line spectrum in a wavelength band of 700 nm or longer;

the apparatus further comprising a shift amount storage unit for storing a correlation between a shift amount of the bright line spectrum in the wavelength band of 700 nm or longer in the wavelength diffusing direction and an average wavelength shift amount with respect to an entirety of the wavelength band for measurement when the light receiver is displaced relative to the light separator in the wavelength diffusing direction after the initial state of the apparatus;

wherein the correction amount calculator for calculating an average wavelength shift amount with respect to the entirety of the wavelength band for measurement based on the shift amount corresponding to the spectral profile which is most approximate to the corrective spectral profile, based on the correlations stored in the shift amount storage unit to set the average wavelength shift amount as the wavelength shift correction amount.

5. The apparatus according to claim 2, wherein the correction amount calculator calculates a shift amount corresponding to the spectral profile which gives a highest correlation between differential data with respect to a wavelength of the corrective spectral profile and differential data with respect to a wavelength of each spectral profile stored in the reference spectral profile group storage unit to set the shift amount as the wavelength shift correction amount.

6. The apparatus according to claim 2, wherein the correction amount calculator calculates a correlation value between differential data with respect to a wavelength of the corrective spectral profile and differential data with respect to a wavelength of each spectral profile stored in the reference spectral profile group storage unit, approximates each of the correlation values according to a certain function in which the shift amount is used as a variant, and sets a shift amount which gives a maximal value among the approximation results as the wavelength shift correction amount.

7. The apparatus according to claim 1, wherein the plurality of spectral profiles in the specific wavelength band which are stored in the reference spectral profile group storage unit and are output from the light receiver at each displaced position are obtained by measuring a spectral intensity distribution of the light source, measuring the spectral sensitivities of the photoelectric conversion elements, numerically synthesizing the plurality of spectral sensitivities by shifting each spectral sensitivity at a certain pitch stepwise in the wavelength diffusing direction, and by using the plurality of spectral sensitivities obtained by the synthesis and the spectral intensity distribution of the light source obtained by the measurement.

8. The apparatus according to claim 1, wherein the corrective spectral, profile is obtained in a first calibratable state of the apparatus in which a white plate for calibration is disposed at a sample opening of the apparatus in place of the sample in the case where the light separator separates the reflected light from the sample prior to measurement of the spectral characteristic of the sample which is implemented after the initial state of the apparatus, and is obtained in a second calibratable state of the apparatus in which light is allowed to transmit through the sample opening in the case where the light separator separates transmitted light through the sample opening.

9. The apparatus according to claim 1, further comprising a correction amount storage unit for storing a wavelength shift correction amount obtained by the correction amount calculator, wherein:

the spectral characteristic calculator calculates a spectral characteristic of the sample based on spectral sensitivities which are shifted from the spectral sensitivities of the photoelectric conversion elements by the wavelength shift correction amount in the case where the wavelength shift correction amount is stored in the correction amount storage unit.

10. The apparatus according to claim 1, further comprising a correction amount storage unit for storing a wavelength shift correction amount obtained by the correction amount calculator, wherein:

the spectral characteristic calculator calculates a spectral characteristic of the sample based on spectral sensitivities which are shifted from the spectral sensitivities of the photoelectric conversion elements by an amount set based on the wavelength shift correction amount in the case where the wavelength shift correction amount stored in the correction amount storage unit exceeds a certain value.

11. A method for correcting a wavelength shift of a spectral characteristic measuring apparatus which comprises:

an illuminator for illuminating a sample to be measured;

an illuminator controller for controlling the illuminator to emit light from a light source;

a light separator for separating rays of the light from the sample according to wavelengths;

a light receiver including an array of photoelectric conversion elements arrayed at a certain interval in a wavelength diffusing direction of the light separator to receive the rays of light in the different wavelengths so as to output a light receiving signal corresponding to a received light intensity, the light receiver outputting a spectral profile being formed by a plurality of light receiving signals;

a spectral sensitivity storage unit for storing spectral sensitivities of the photoelectric conversion elements; and

a spectral characteristic calculator for calculating a spectral characteristic of the sample in a predetermined wavelength band for measurement with use of the spectral profile and the spectral sensitivities of the photoelectric conversion elements;

the method comprising the steps of;

storing a reference spectral profile group including a spectral profile in a specific wavelength band including at least a specific wavelength which is output from the light receiver when the light receiver receives light from the light source having a light intensity peak at the specific wavelength in an initial state of the apparatus, and a plurality of spectral profiles in the specific wavelength band to be output from the light receiver at each displaced position when the light receiver is displaced relative to the light separator in the wavelength diffusing direction at a certain pitch stepwise;

comparing a spectral profile for correction which is output from the light receiver when the light source is caused to emit light in a calibratable state of the apparatus after the initial state thereof with each spectral profile in the reference spectral profile group in the specific wavelength band; and

setting a shift amount corresponding to the spectral profile in the reference spectral profile group which is most approximate to the corrective spectral profile as a wavelength shift correction amount to correct the relative displacement of the light receiver after the initial state of the apparatus.

12. The method according to claim 11, wherein the plurality of spectral profiles in the specific wavelength band to be output from the light receiver at each displaced position are obtained by:

measuring a spectral intensity distribution of the light source;

measuring the spectral sensitivities of the photoelectric conversion elements;

numerically synthesizing a plurality of spectral sensitivities by shifting the spectral sensitivities of the photoelectric conversion elements at a certain pitch in the wavelength diffusing direction stepwise; and

using the plurality of spectral sensitivities obtained by the synthesis and the spectral intensity distribution of the light source obtained by the measurement.

13. The method according to claim 11, further comprising the steps of:

storing the wavelength shift correction amount; and

calculating the spectral characteristic of the sample with use of spectral sensitivities which are shifted from the spectral sensitivities of the photoelectric conversion elements by the wavelength shift correction amount.

14. A method for correcting a wavelength shift of a spectral characteristic measuring apparatus which comprises:

an illuminator for illuminating a sample to be measured;

an illuminator controller for controlling the illuminator to emit light from a light source;

alight separator for separating rays of the light from the sample according to wavelength bands;

a light receiver including an array of photoelectric conversion elements arrayed at a certain interval in a wavelength diffusing direction of the light separator to receive the rays of light in different wavelengths so as to output a light receiving signal corresponding to a received light intensity, the light receiver outputting a spectral profile including a plurality of the light receiving signals; and

a spectral characteristic calculator for calculating a spectral characteristic of the sample in a predetermined wavelength band for measurement with use of the spectral profile;

the method comprising the steps of;

measuring a spectral intensity distribution of each illuminator of a plurality of spectral characteristic measuring apparatus to select at least one of spectral intensity distributions based on measurement results;

obtaining a spectral profile group including a plurality of spectral profiles in the, specific wavelength band to be output from the light receiver by measuring spectral sensitivities of the photoelectric conversion elements with respect to a spectral characteristic measuring apparatus in an initial state thereof to which a wavelength shift correction is to be implemented, numerically synthesizing a plurality of spectral sensitivities by shifting the spectral sensitivities at a certain pitch stepwise in the wavelength diffusing direction and by using the plurality of spectral sensitivities obtained by the synthesis, the spectral sensitivities obtained by the measurement, and the selected spectral intensity distribution;

comparing a corrective spectral profile output from the light receiver when the illuminator is caused to emit light in a calibratable state of the apparatus with each spectral profile in the spectral profile group in the specific wavelength band; and

storing in advance a spectral profile group in the specific wavelength band which has a most approximate spectral profile to the corrective spectral profile with respect to a spectral intensity distribution as a reference spectral profile group of the spectral characteristic measuring apparatus;

a wavelength shift correction being performed with respect to a spectral characteristic measuring apparatus after the initial state thereof to which the wavelength shift correction is to implemented by;

comparing the corrective spectral profile output from the light receiver when the illuminator is caused to emit light in the calibratable state of the apparatus with each spectral profile in the stored reference spectral profile group in the specific wavelength band; and

setting a shift amount corresponding to the spectral profile in the reference spectral profile group which is most approximate to the corrective spectral profile as the wavelength shift correction amount.

15. The method according to claim 14, further comprising the steps of:

selecting a spectral characteristic measuring apparatus which gives a typical spectral intensity distribution with respect to the measurement results of the spectral intensity distribution of each illuminator of the plurality of spectral characteristic measuring apparatus;

measuring a spectral intensity distribution in which the emission duration of the illuminator is changed stepwise at a certain pitch with respect to the selected spectral characteristic measuring apparatus;

obtaining a spectral profile group including a plurality of spectral profiles in the specific wavelength band to be output from the light receiver by measuring spectral sensitivities of the photoelectric conversion elements with respect to the apparatus in an initial state thereof to which a wavelength shift correction is to be implemented, numerically synthesizing a plurality of spectral sensitivities by shifting the spectral sensitivities stepwise at a certain pitch in the wavelength diffusing direction, and by using the plurality of spectral sensitivities obtained by the synthesis, the spectral sensitivities obtained by the measurement, and the spectral intensity distribution in each emission duration;

comparing a corrective spectral profile output from the light receiver when the illuminator is caused to emit light in a calibratable state of the apparatus with each spectral profile in the reference spectral profile group in the specific wavelength band; and

storing in advance the spectral profile group in the specific wavelength band which has a most approximate spectral profile to the corrective spectral profile with respect to the emission duration as a reference spectral profile group of the apparatus to which a wavelength shift correction is to be implemented.

16. The method according to claim 14, further comprising the steps of:

storing the wavelength shift correction amount; and

calculating the spectral characteristic of the sample with use of spectral sensitivities which are shifted from the spectral sensitivities of the photoelectric conversion elements by the wavelength shift correction amount.