Method of estimating elastic and compositional parameters from seismic and echo-acoustic data
First Claim
1. A method for determining from measured reflection data on a plurality of trace positions one or more subsurface parameters, said method comprising the steps of:
- (a) preprocessing the measured reflection data into a plurality of partial or full stacks;
(b) specifying one or more initial subsurface parameters defining an initial subsurface model;
(c) specifying a wavelet or wavelet field for each of the partial or full stacks of the measured reflection data;
(d) calculating synthetic reflection data based on the specified wavelets and the initial subsurface parameters;
(e) optimizing an objective function, comprising the weighted difference between measured reflection data and synthetic reflection data for a plurality of trace positions simultaneously; and
(f) outputting the optimized one or more subsurface parameters.
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Abstract
A method for determining from measured reflection data on a plurality of trace positions, a plurality of subsurface parameters. The method includes the steps of: preprocessing the measured reflection data into a plurality of partial or full stacks; specifying one or more initial subsurface parameters defining an initial subsurface model; specifying a wavelet or wavelet field for each of the partial or full stacks of the measured reflection data; calculating synthetic reflection data based on the specified wavelets and the initial subsurface parameters; optimizing an objective function, including the weighted difference between measured reflection data and synthetic reflection data for a plurality of trace positions simultaneously; and outputting the optimized subsurface parameters. A device for implementing this method is also included.
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Citations
68 Claims
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1. A method for determining from measured reflection data on a plurality of trace positions one or more subsurface parameters, said method comprising the steps of:
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(a) preprocessing the measured reflection data into a plurality of partial or full stacks;
(b) specifying one or more initial subsurface parameters defining an initial subsurface model;
(c) specifying a wavelet or wavelet field for each of the partial or full stacks of the measured reflection data;
(d) calculating synthetic reflection data based on the specified wavelets and the initial subsurface parameters;
(e) optimizing an objective function, comprising the weighted difference between measured reflection data and synthetic reflection data for a plurality of trace positions simultaneously; and
(f) outputting the optimized one or more subsurface parameters. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32)
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33. A method for determining from measured reflection data on one or more trace positions a plurality of subsurface parameters, said method comprising the steps of:
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(a) preprocessing the measured reflection data into a plurality of partial or full stacks;
(b) specifying a plurality of initial subsurface parameters defining an initial subsurface model;
(c) specifying a wavelet or wavelet field for each of the partial or full stacks of the measured reflection data;
(d) calculating synthetic reflection data based on the specified wavelets and the initial subsurface parameters;
(e) simultaneously optimizing an objective function, comprising the weighted difference between measured reflection data and synthetic reflection data, for said plurality of subsurface parameters and for each trace position separately; and
(g) outputting said plurality of optimized subsurface parameters. - View Dependent Claims (34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 60, 61, 62, 63, 64)
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65. A device for determining from measured reflection data on a plurality of trace positions one or more subsurface parameters, the device comprising:
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(a) input means for inputting at least the measured reflection data and one or more initial subsurface parameters defining an initial subsurface model;
(b) processing means for;
(i) preprocessing the measured reflection data into a plurality of partial or full stacks;
(ii) specifying a wavelet or wavelet or wavelet field for each of the partial or full stacks of the measured reflection data;
(iii) calculating synthetic reflection data based on the specified wavelets or wavelet fields and the initial subsurface parameters; and
(iv) (a) optimizing an objective function, comprising the weighted difference between measured reflection data and synthetic reflection data for a plurality of trace positions simultaneously;
or(b) optimizing an objective function, comprising the weighted difference between measured reflection data and synthetic reflection data for a plurality of trace positions simultaneously and one or more stabilization terms and/or one or more correction terms; and
(c) output means for outputting optimized one or more subsurface parameters.
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66. A device for determining from measured reflection data on one or more trace positions a plurality of subsurface parameters, said device comprising:
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(a) input means for inputting at least the measured reflection data and one or more initial subsurface parameters defining an initial subsurface model;
(b) processing means for;
(i) preprocessing the measured reflection data into a plurality of partial or full stacks;
(ii) specifying a wavelet or wavelet field for each of the partial or full stacks of the measured reflection data;
(iii) calculating synthetic reflection data based on the specified wavelets or wavelet fields and the initial subsurface parameters; and
(iv) (a) simultaneously optimizing an objective function, comprising the weighted difference between measured reflection data and synthetic reflection data, for said plurality of subsurface parameters and for each trace position separately;
or(b) simultaneously optimizing an objective function, comprising the weighted difference between measured reflection data and synthetic reflection data for a plurality of subsurface parameters and one or more stabilization terms and/or one or more correction terms; and
(c) output means for outputting optimized subsurface parameters.
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67. A method for determining from measured reflection data on a plurality of trace positions one or more subsurface parameters, said method comprising the steps of:
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(a) preprocessing the measured reflection data into a plurality of partial or full stacks;
(b) specifying one or more initial subsurface parameters defining an initial subsurface model;
(c) specifying a wavelet or wavelet field for each of the partial or full stacks of the measured reflection data;
(d) calculating synthetic reflection data based on the specified wavelets and the initial subsurface parameters;
(e) optimizing an objective function, the objective function comprising the weighted difference between measured reflection data and synthetic reflection data, and one or more stabilization terms and one or more corrections terms, for a plurality of trace positions simultaneously; and
(f) outputting the optimized one or more subsurface parameters.
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68. A device for determining from measured reflection data on a plurality of trace positions one or more subsurface parameters, said device comprising:
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(a) input means for inputting at least the measured reflection data and one or more initial subsurface parameters defining an initial subsurface model;
(b) processing means for;
(i) preprocessing the measured reflection data into a plurality of partial or full stacks;
(ii) specifying a wavelet or wavelet field for each of the partial or full stacks of the measured reflection data;
(iii) calculating synthetic reflection data based on the specified wavelets or wavelet fields and the initial subsurface parameters; and
(iv) optimizing an objective function, comprising the weighted difference between measured reflection data and synthetic reflection data, and one or more stabilization terms and/or one or more correction terms for a plurality of trace positions simultaneously; and
(c) output means for outputting optimized one or more subsurface parameters.
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Specification