Low volt/high volt transistor
First Claim
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1. A semiconductor device, comprising:
- a substrate; and
at least two transistors each having different threshold voltages provided over the substrate, wherein each transistor includes LDD regions and a gate electrode, at least one of said transistors having a higher threshold voltage and at least one of said transistors having a lower threshold voltage, and the LDD regions of the at least one highest threshold voltage transistor have a deeper junction depth than the LDD regions of the at least one lowest threshold voltage transistor.
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Abstract
A semiconductor device has at least one high-voltage and low-voltage transistor on a single substrate. The reliability of the high-voltage transistor is enhanced by performing a LDD implantation in only the high-voltage transistor prior to conducting an oxidation process to protect the substrate and gate electrode. After the oxidation process is performed, the low-voltage transistor is subjected to an LDD implantation process. The resultant semiconductor device provides a high-voltage transistor having a deeper LDD region junction depth than the low-voltage transistor, ensuring reliability and performance.
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10 Claims
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1. A semiconductor device, comprising:
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a substrate; and
at least two transistors each having different threshold voltages provided over the substrate, wherein each transistor includes LDD regions and a gate electrode, at least one of said transistors having a higher threshold voltage and at least one of said transistors having a lower threshold voltage, and the LDD regions of the at least one highest threshold voltage transistor have a deeper junction depth than the LDD regions of the at least one lowest threshold voltage transistor. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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Specification