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Method and apparatus for creating an extraction model using Bayesian inference

  • US 6,883,148 B1
  • Filed: 01/31/2002
  • Issued: 04/19/2005
  • Est. Priority Date: 08/28/2001
  • Status: Expired due to Term
First Claim
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1. A method of constructing a model for estimating at least one electrical characteristic for an extraction sub-problem, said method comprising:

  • identifying a set of physical measurements of integrated circuit components that define said extraction sub-problem;

    selecting a set of training cases for said specific extraction sub-problem, each of said training cases including an associated set of said physical measurements;

    solving said specific extraction sub-problem for each of said training cases using said associated set of physical measurements as an input to an accurate physics based model to generate an associated output; and

    training a machine-learning model with Bayesian inference using said associated set of physical measurements and associated outputs as training data.

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