Non-contact tester for electronic circuits

• US 6,885,202 B2
• Filed: 09/19/2003
• Issued: 04/26/2005
• Est. Priority Date: 09/19/2002
• Status: Expired due to Fees

• Current Assignee: Scanimetrics, Inc.
• Original Assignee: Scanimetrics, Inc.
• Inventors: Slupsky, Steven Harold
• Primary Examiner(s): Zarneke, David
• Assistant Examiner(s): Nguyen, Jimmy
• Application Number:
  US10/666,553
• Publication Number:
  US 20040075453A1
• Time in Patent Office: 585 Days
• Field of Search: 324/765, 324/752, 324/751, 324/753, 324/158.1, 324/763, 324/755, 324/96, 714/733, 714/719, 714/724, 257/723, 257/48, 438 14- 19, 359/237, 359/245, 359/246, 359/247, 359/256, 359/257, 359/258
• US Class Current: 324/754.23
• CPC Class Codes: G01R 31/2822 of microwave or radiofrequency circuits of attenuation, gain, e.g. using network analyzers G01R27/28
• CPC Class Codes: G01R 31/3025 Wireless interface with the DUT
• CPC Class Codes: G01R 31/303 of integrated circuits G01R31/305 - G01R31/315 take precedence
• CPC Class Codes: G01R 31/315 by inductive methods

Abstract

A non-contact tester for electronic circuits consists of an electronic circuit and independent scanning head, in combination. The electronic circuit includes a micro-fabricated wireless i/o cell and means for sending and receiving signals via the wireless i/o cell. The independent scanning head has a wireless i/o cell that is compatible with the wireless i/o cell on the electronic circuit. This enables data to be exchanged with the electronic circuit to confirm proper functioning of the electronic circuit.

Claims

1. A non-contact tester for electronic circuits, comprising in combination:

an electronic circuit which includes a plurality of wireless i/o cells and means for sending and receiving signals via each of the at least one wireless i/o cells, and a wireless i/o cell being provided for each contact point on the electronic circuit to be tested; and

an independent scanning head having a plurality of wireless i/o cells compatible with the wireless i/o cells on the electronic circuit, such that data may be exchanged with the electronic circuit to confirm proper functioning of the electronic circuit, and the number of wireless i/o cells on the independent scanning head corresponding in a one to one relationship with the number of wireless i/o cells on the electronic circuit being tested.

2. The non-contact tester for electronic circuits as defined in claim 1, wherein the means for sending and receiving signals via each of the wireless i/o cells is a radio frequency interface.

3. The non-contact tester for electronic circuits as defined in claim 2, wherein the radio frequency interface includes at least one transmitter and at least one receiver.

4. The non-contact tester for electronic circuits as defined in claim 1, wherein the means for sending and receiving signals via each of the wireless i/o cells is an optical interface.

5. The non-contact tester for electronic circuits as defined in claim 4, the optical interface includes at least one light emitter and at least one light receptor.

6. The non-contact tester for electronic circuits as defined in claim 1, wherein the means for sending and receiving signals via each of the wireless i/o cells is a magnetic interface.

7. The non-contact tester for electronic circuits as defined in claim 6, wherein the magnetic interface includes a magnetic detector and a magnetic generator.