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Apparatus and method for detecting photon emissions from transistors

  • US 6,891,363 B2
  • Filed: 09/03/2002
  • Issued: 05/10/2005
  • Est. Priority Date: 09/03/2002
  • Status: Expired due to Term
First Claim
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1. A method for analyzing photon emission data to discriminate between photons emitted from a transistor and noise, the photon emission data comprising a first photon emission and at least one second photon emission, each photon emission comprising characteristics including a spatial component corresponding with the space where each photon was detected and a temporal component corresponding with the time when each photon was detected, the method comprising:

  • receiving the first photon emission and the at least one second photon emission; and

    determining whether at least one characteristic of the first photon emission correlates with at least one characteristic of the second photo emission;

    wherein the first photon emission and the second photon emission are attributed to a transistor rather than noise when at least one characteristic of the first photon emission correlates with at least one characteristic of the second photon emission.

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