Selecting multiple settings for an integrated circuit function using a single integrated circuit terminal

• US 6,894,501 B1
• Filed: 05/21/2002
• Issued: 05/17/2005
• Est. Priority Date: 05/21/2002
• Status: Expired due to Term

• Current Assignee: Volterra Semiconductor Corporation (Analog Devices, Inc.)
• Original Assignee: Volterra Semiconductor Corporation (Analog Devices, Inc.)
• Inventors: McJimsey, Michael D., Flasck, Jeremy M., Burstein, Andrew J., Lidsky, David B.
• Primary Examiner(s): Nolan, Jr., Charles H.
• Application Number:
  US10/152,245
• Time in Patent Office: 1,092 Days
• Field of Search: 324/416, 341/159
• US Class Current: 324/416
• CPC Class Codes: G11C 2029/5004 Voltage
• CPC Class Codes: G11C 29/028 with adaption or trimming of parameters
• CPC Class Codes: H03K 19/1731 Optimisation thereof

Abstract

A method and apparatus for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external measurement resistor to a measurement terminal of the integrated circuit, comprises applying a direct current to the measurement terminal of the integrated circuit, thereby producing a measurement voltage at the measurement terminal; applying the direct current to a reference terminal of the integrated circuit, wherein the reference terminal has an external reference resistor connected thereto, thereby producing a reference voltage at the reference terminal; quantizing a voltage level of a difference voltage representing a voltage difference between the reference voltage and the measurement voltage, thereby producing a quantized voltage; and providing control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of the settings is represented by a different quantized voltage; wherein the functional module implements the one of the settings represented by the control signals.

Claims

1. A method for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external measurement resistor to a measurement terminal of the integrated circuit, the method comprising:

applying a direct current to the measurement terminal of the integrated circuit, thereby producing a measurement voltage at the measurement terminal;

applying the direct current to a reference terminal of the integrated circuit, wherein the reference terminal has an external reference resistor connected thereto, thereby producing a reference voltage at the reference terminal;

quantizing a voltage level of a difference voltage representing a voltage difference between the reference voltage and the measurement voltage, thereby producing a quantized voltage; and

providing control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of the settings is represented by a different quantized voltage;

wherein the functional module implements the one of the settings represented by the control signals.

2. The method of claim 1, wherein quantizing a voltage level of a difference voltage comprises:

determining a polarity of the difference voltage.

3. The method of claim 2, wherein:

the integrated circuit is a switching voltage regulator; and

the function comprises at least one of selectable switching frequency, selectable set point, selectable droop level, and selectable digital compensation mode.

4. A method for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external resistor to a terminal of the integrated circuit, the method comprising:

applying a direct current to the terminal of the integrated circuit, thereby producing a voltage at the terminal;

quantizing a voltage level of the voltage, thereby producing a quantized voltage; and

providing control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of the settings is represented by a different quantized voltage, wherein the functional module implements the one of the settings represented by the control signals.

5. A method for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external measurement capacitor to a measurement terminal of the integrated circuit, the method comprising:

applying a direct current to the measurement terminal of the integrated circuit, thereby producing a measurement voltage transient;

quantizing a measurement interval required for a voltage level of the measurement voltage transient to reach a predetermined voltage threshold, thereby producing a quantized measurement interval;

applying the direct current to a reference terminal of the integrated circuit, the reference terminal having an external reference capacitor connected thereto, thereby producing a reference voltage transient;

quantizing a reference interval required for a voltage level of the reference voltage transient to reach the predetermined voltage threshold, thereby producing a quantized reference interval;

generating a result of a function of the quantized measurement interval and the quantized reference interval; and

providing control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to a value of the result, wherein each of the settings is represented by a different value of the result;

wherein the functional module implements the one of the settings represented by the control signals.

6. The method of claim 5, wherein generating a result of a function of the quantized measurement interval and the quantized reference interval comprises:

determining a ratio of the quantized measurement interval and the quantized reference interval, thereby producing the result.

7. The method of claim 6, further comprising:

discharging the external measurement capacitor before applying the direct current to the external measurement capacitor; and

discharging the external reference capacitor before applying the direct current to the external reference capacitor.

8. The method of claim 7, wherein:

the integrated circuit is a switching voltage regulator; and

the function comprises at least one of selectable switching frequency, selectable set point, selectable droop level, and selectable digital compensation mode.

9. A method for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external capacitor to a terminal of the integrated circuit, the method comprising:

applying a direct current to the terminal of the integrated circuit, thereby producing a voltage transient;

quantizing an interval required for a voltage level of the voltage transient to reach a predetermined voltage threshold, thereby producing a quantized interval; and

providing control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized interval, wherein the functional module implements the one of the settings represented by the control signals.

10. A method for determining settings specified from a plurality of the settings for functions provided in an integrated circuit, wherein the settings are specified by connecting an external measurement capacitor to a measurement terminal of the integrated circuit and connecting an external measurement resistor between the measurement terminal and a common terminal of the integrated circuit, the method comprising:

applying a first direct current to the measurement terminal of the integrated circuit while the common terminal is connected to a predetermined voltage, thereby producing a measurement voltage at the measurement terminal;

applying the first direct current to a reference terminal of the integrated circuit, wherein an external reference resistor is connected between the reference terminal and the common terminal of the integrated circuit, while the common terminal is connected to the predetermined voltage, thereby producing a reference voltage at the reference terminal;

quantizing a voltage level of a difference voltage representing a voltage difference between the reference voltage and the measurement voltage, thereby producing a quantized voltage;

applying a second direct current to the measurement terminal of the integrated circuit while the common terminal of the integrated circuit is not connected to the predetermined voltage, thereby producing a measurement voltage transient;

quantizing a measurement interval required for a voltage level of the measurement voltage transient to reach a predetermined voltage threshold, thereby producing a quantized measurement interval;

applying the second direct current to the reference terminal of the integrated circuit while the common terminal is not connected to the predetermined voltage, the reference terminal having an external reference capacitor connected thereto, thereby producing a reference voltage transient;

quantizing a reference interval required for a voltage level of the reference voltage transient to reach the predetermined voltage threshold, thereby producing a quantized reference interval;

generating a result of a function of the quantized measurement interval and the quantized reference interval;

providing first control signals to a first functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of a first group of the settings is represented by a different quantized voltage, wherein the first functional module implements the one of the settings represented by the first control signals; and

providing second control signals to a second functional module within the integrated circuit, the second control signals representing the one of the settings corresponding to a value of the result, wherein each of a second group of the settings is represented by a different value of the result, wherein the second functional module implements the one of the settings represented by the second control signals.

11. The method of claim 10, wherein quantizing a voltage level of a difference voltage comprises:

determining a polarity of the difference voltage.

12. The method of claim 10, wherein generating a result of a function of the quantized measurement interval and the quantized reference interval comprises:

determining a ratio of the quantized measurement interval and the quantized reference interval, thereby producing the result.

13. The method of claim 12, further comprising:

discharging the external measurement capacitor before applying the second direct current to the external measurement capacitor; and

discharging the external reference capacitor before applying the second direct current to the external reference capacitor.

14. The method of claim 13, wherein:

the integrated circuit is a switching voltage regulator; and

the functions comprise at least one of selectable switching frequency, selectable set point, selectable droop level, and selectable digital compensation mode.

15. A method for determining settings specified from a plurality of the settings for functions provided in an integrated circuit, wherein the settings are specified by connecting an external capacitor to a terminal of the integrated circuit and connecting an external resistor between the terminal and a common terminal of the integrated circuit, the method comprising:

applying a first direct current to the terminal of the integrated circuit while the common terminal of the integrated circuit is connected to a predetermined voltage, thereby producing a voltage at the terminal;

quantizing a voltage level of the voltage, thereby producing a quantized voltage;

applying a second direct current to the terminal of the integrated circuit while the common terminal of the integrated circuit is not connected to the predetermined voltage, thereby producing a voltage transient;

quantizing an interval required for a voltage level of the voltage transient to reach a predetermined voltage threshold, thereby producing a quantized interval;

providing first control signals to a first functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of the settings is represented by a different quantized voltage, wherein the first functional module implements the one of the settings represented by the first control signals; and

providing second control signals to a second functional module within the integrated circuit, the second control signals representing the one of the settings corresponding to the quantized interval, wherein each of the settings is represented by a different quantized interval, wherein the second functional module implements the one of the settings represented by the second control signals.

16. An apparatus for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external measurement resistor to a measurement terminal of the integrated circuit, the apparatus comprising:

a current mirror to apply a direct current to the measurement terminal and a reference terminal of the integrated circuit, wherein the reference terminal has an external reference resistor connected thereto, thereby producing a measurement voltage at the measurement terminal and a reference voltage at the reference terminal; and

an analog-to-digital converter to quantize a difference voltage representing a voltage difference between the reference voltage and the measurement voltage, thereby producing a quantized voltage, and to provide control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of the settings is represented by a different quantized voltage;

wherein the functional module implements the one of the settings represented by the control signals.

17. The apparatus of claim 16, wherein the analog-to-digital converter comprises:

a comparator to determine a polarity of the difference voltage, wherein the control signals include a polarity signal representing the polarity of the difference voltage.

18. The apparatus of claim 17, further comprising:

a crossing network to swap connections between the current mirror and the measurement and reference terminals in response to the polarity signal, thereby ensuring that the difference voltage is positive when quantizing the difference voltage.

19. The apparatus of claim 18, wherein:

the integrated circuit is a switching voltage regulator; and

the functions comprise at least one of selectable switching frequency, selectable set point, selectable droop level, and selectable digital compensation mode.

20. An apparatus for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external resistor to a terminal of the integrated circuit, the apparatus comprising:

a current source to apply a direct current to the terminal of the integrated circuit, thereby producing a voltage at the terminal; and

an analog-to-digital converter to quantize a voltage level of the voltage, thereby producing a quantized voltage, and to provide control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of the settings is represented by a different quantized voltage;

wherein the functional module implements the one of the settings represented by the control signals.

21. An apparatus for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external measurement capacitor to a measurement terminal of the integrated circuit, the apparatus comprising:

a current source to provide a direct current;

a multiplexer to apply the direct current to one of the measurement terminal and a reference terminal of the integrated circuit in response to a select signal, the reference terminal having an external reference capacitor connected thereto, thereby producing a measurement voltage transient when the direct current is applied to the measurement terminal, and producing a reference voltage transient when the direct current is applied to the reference terminal; and

an analog-to-digital converter to provide the select signal, to quantize a result of a function of a measurement interval required for a voltage level of the measurement voltage transient to reach a predetermined voltage threshold and a reference interval required for a voltage level of the measurement voltage transient to reach the predetermined voltage threshold, and to provide control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to a value of the result, wherein each of the settings is represented by a different value of the result;

wherein the functional module implements the one of the settings represented by the control signals.

22. The apparatus of claim 21, wherein:

the analog-to-digital converter quantizes a ratio of the measurement interval and the reference interval, thereby producing the result.

23. The apparatus of claim 22, further comprising:

a measurement switch to discharge the external measurement capacitor before applying the direct current to the external measurement capacitor; and

a reference switch to discharge the external reference capacitor before applying the direct current to the external reference capacitor.

24. The apparatus of claim 23, wherein:

the integrated circuit is a switching voltage regulator; and

the function comprises at least one of selectable switching frequency, selectable set point, selectable droop level, and selectable digital compensation mode.

25. An apparatus for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external capacitor to a terminal of the integrated circuit, the apparatus comprising:

a current source to apply a direct current to the terminal of the integrated circuit, thereby producing a voltage transient; and

an analog-to-digital converter to quantize an interval required for a voltage level of the voltage transient to reach a predetermined voltage threshold, and to provide control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the interval, wherein each of the settings is represented by a different interval;

wherein the functional module implements the one of the settings represented by the control signals.

26. An apparatus for determining settings specified from a plurality of the settings for functions provided in an integrated circuit, wherein the settings are specified by connecting an external measurement capacitor to a measurement terminal of the integrated circuit and connecting an external measurement resistor between the measurement terminal and a common terminal of the integrated circuit, the apparatus comprising:

a current mirror to apply a first direct current to the measurement terminal and a reference terminal of the integrated circuit while the common terminal is connected to a predetermined voltage, wherein the reference terminal has an external reference resistor connected thereto, thereby producing a measurement voltage at the measurement terminal and a reference voltage at the reference terminal;

a first analog-to-digital converter to quantize a difference voltage representing a voltage difference between the reference voltage and the measurement voltage, thereby producing a quantized voltage, and to provide first control signals to a first functional module within the integrated circuit, the first control signals representing the one of the settings corresponding to the quantized voltage, wherein each of a first group of the settings is represented by a different quantized voltage;

wherein the first functional module implements the one of the settings represented by the first control signals;

a current source to provide a second direct current;

a multiplexer to apply the second direct current to one of the measurement terminal and the reference terminal of the integrated circuit, in response to a select signal, while the common terminal is not connected to the predetermined voltage, the reference terminal having an external reference capacitor connected thereto, thereby producing a measurement voltage transient when the direct current is applied to the measurement terminal, and producing a reference voltage transient when the direct current is applied to the reference terminal; and

a second analog-to-digital converter to provide the select signal, to quantize a result of a function of a measurement interval required for a voltage level of the measurement voltage transient to reach a predetermined voltage threshold and a reference interval required for a voltage level of the reference voltage transient to reach the predetermined voltage threshold, and to provide second control signals to a second functional module within the integrated circuit, the second control signals representing the one of the settings corresponding to a value of the result, wherein each of a second group of the settings is represented by a different value of the result, wherein the second functional module implements the one of the settings represented by the second control signals.

27. The apparatus of claim 26, further comprising:

a comparator to determine a polarity of the difference voltage, wherein the first control signals include a polarity signal representing the polarity of the difference voltage.

28. The apparatus of claim 27, further comprising:

a crossing network to swap connections between the current mirror and the measurement and reference terminals in response to the polarity signal, thereby ensuring that the difference voltage is positive when quantizing the difference voltage.

29. The apparatus of claim 26, wherein:

the second analog-to-digital converter quantizes a ratio of the measurement interval and the reference interval, thereby producing the result.

30. The apparatus of claim 29, further comprising:

a measurement switch to discharge the external measurement capacitor before applying the second direct current to the external measurement capacitor; and

a reference switch to discharge the external reference capacitor before applying the second direct current to the external reference capacitor.

31. The apparatus of claim 30, wherein:

the integrated circuit is a switching voltage regulator; and

the functions comprise at least one of selectable switching frequency, selectable set point, selectable droop level, and selectable digital compensation mode.

32. An apparatus for determining settings specified from a plurality of the settings for functions provided in an integrated circuit, wherein the settings are specified by connecting an external capacitor to a terminal of the integrated circuit and connecting an external resistor between the terminal and a common terminal of the integrated circuit, the apparatus comprising:

a first current source to apply a first direct current to the terminal of the integrated circuit while the common terminal is connected to a predetermined voltage, thereby producing a voltage at the terminal;

a first analog-to-digital converter to quantize a voltage level of the voltage, thereby producing a quantized voltage, and to provide first control signals to a first functional module within the integrated circuit, the first control signals representing the one of the settings corresponding to the quantized voltage, wherein each of a first group of the settings is represented by a different quantized voltage;

wherein the first functional module implements the one of the settings represented by the first control signals;

a second current source to provide a second direct current to the terminal while the common terminal is not connected to the predetermined voltage, thereby producing a voltage transient; and

a second analog-to-digital converter to quantize a interval required for a voltage level of the voltage transient to reach a predetermined voltage threshold, and to provide second control signals to a second functional module within the integrated circuit, the second control signals representing the one of the settings corresponding to a value of the quantized interval, wherein each of a second group of the settings is represented by a different quantized interval, wherein the second functional module implements the one of the settings represented by the second control signals.

33. An apparatus for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external measurement resistor to a measurement terminal of the integrated circuit, the apparatus comprising:

current mirror means for applying a direct current to the measurement terminal of the integrated circuit, thereby producing a measurement voltage at the measurement terminal, and for applying the direct current to a reference terminal of the integrated circuit, wherein the reference terminal has an external reference resistor connected thereto, thereby producing a reference voltage at the reference terminal; and

converter means for quantizing a voltage level of a difference voltage representing a voltage difference between the reference voltage and the measurement voltage, thereby producing a quantized voltage, and for providing control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of the settings is represented by a different quantized voltage;

wherein the functional module implements the one of the settings represented by the control signals.

34. The apparatus of claim 33, wherein the converter means comprises:

means for determining a polarity of the difference voltage.

35. The apparatus of claim 34, wherein:

the integrated circuit is a switching voltage regulator, and the function comprises at least one of selectable switching frequency, selectable set point, selectable droop level, and selectable digital compensation mode.

36. An apparatus for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external resistor to a terminal of the integrated circuit, the apparatus comprising:

current source means for applying a direct current to the terminal of the integrated circuit, thereby producing a voltage at the terminal; and

converter means for quantizing a voltage level of the voltage, thereby producing a quantized voltage, and for providing control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of the settings is represented by a different quantized voltage, wherein the functional module implements the one of the settings represented by the control signals.

37. An apparatus for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external measurement capacitor to a measurement terminal of the integrated circuit, the apparatus comprising:

current source means for generating a direct current;

multiplexer means for applying the direct current to the measurement terminal of the integrated circuit, thereby producing a measurement voltage transient;

converter means for quantizing a measurement interval required for a voltage level of the measurement voltage transient to reach a predetermined voltage threshold, thereby producing a quantized measurement interval; and

wherein the multiplexer means applies the direct current to a reference terminal of the integrated circuit, the reference terminal having an external reference capacitor connected thereto, thereby producing a reference voltage transient;

wherein the converter means quantizes a reference interval required for a voltage level of the reference voltage transient to reach the predetermined voltage threshold, thereby producing a quantized reference interval, and generates a result of a function of the quantized measurement interval and the quantized reference interval, and for providing control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to a value of the result, wherein each of the settings is represented by a different value of the result;

wherein the functional module implements the one of the settings represented by the control signals.

38. The apparatus of claim 37, wherein the converter means determines a ratio of the quantized measurement interval and the quantized reference interval, thereby producing the result.

39. The apparatus of claim 38, further comprising:

switch means for discharging the external measurement capacitor before applying the direct current to the external measurement capacitor, and for discharging the external reference capacitor before applying the direct current to the external reference capacitor.

40. The apparatus of claim 39, wherein:

the integrated circuit is a switching voltage regulator; and

the function comprises at least one of selectable switching frequency, selectable set point, selectable droop level, and selectable digital compensation mode.

41. An apparatus for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external capacitor to a terminal of the integrated circuit, the apparatus comprising:

current source means for applying a direct current to the terminal of the integrated circuit, thereby producing a voltage transient; and

converter means for quantizing an interval required for a voltage level of the voltage transient to reach a predetermined voltage threshold, thereby producing a quantized interval, and for providing control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized interval, wherein the functional module implements the one of the settings represented by the control signals.

42. An apparatus for determining settings specified from a plurality of the settings for functions provided in an integrated circuit, wherein the settings are specified by connecting an external measurement capacitor to a measurement terminal of the integrated circuit and connecting an external measurement resistor between the measurement terminal and a common terminal of the integrated circuit, the apparatus comprising:

current mirror means for applying a first direct current to the measurement terminal of the integrated circuit while the common terminal is connected to a predetermined voltage, thereby producing a measurement voltage at the measurement terminal, and for applying the first direct current to a reference terminal of the integrated circuit, wherein an external reference resistor is connected between the reference terminal and the common terminal of the integrated circuit, while the common terminal is connected to the predetermined voltage, thereby producing a reference voltage at the reference terminal;

first converter means for quantizing a voltage level of a difference voltage representing a voltage difference between the reference voltage and the measurement voltage, thereby producing a quantized voltage;

current source means for generating a second direct current;

multiplexer means for applying the second direct current to the measurement terminal of the integrated circuit while the common terminal of the integrated circuit is not connected to the predetermined voltage, thereby producing a measurement voltage transient;

second converter means for quantizing a measurement interval required for a voltage level of the measurement voltage transient to reach a predetermined voltage threshold, thereby producing a quantized measurement interval;

wherein the multiplexer means applies the second direct current to the reference terminal of the integrated circuit while the common terminal is not connected to the predetermined voltage, the reference terminal having an external reference capacitor connected thereto, thereby producing a reference voltage transient;

wherein the second converter means quantizes a reference interval required for a voltage level of the reference voltage transient to reach the predetermined voltage threshold, thereby producing a quantized reference interval, and generates a result of a function of the quantized measurement interval and the quantized reference interval;

wherein the first converter means provides first control signals to a first functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of a first group of the settings is represented by a different quantized voltage, wherein the first functional module implements the one of the settings represented by the first control signals; and

wherein the second converter means provides second control signals to a second functional module within the integrated circuit, the second control signals representing the one of the settings corresponding to a value of the result, wherein each of a second group of the settings is represented by a different value of the result, wherein the second functional module implements the one of the settings represented by the second control signals.

43. The apparatus of claim 42, wherein the first converter means determines a polarity of the difference voltage.

44. The apparatus of claim 42, wherein the second converter means determines a ratio of the quantized measurement interval and the quantized reference interval, thereby producing the result.

45. The apparatus of claim 44, further comprising:

switch means for discharging the external measurement capacitor before applying the second direct current to the external measurement capacitor, and for discharging the external reference capacitor before applying the second direct current to the external reference capacitor.

46. The apparatus of claim 45, wherein:

the integrated circuit is a switching voltage regulator; and

the functions comprise at least one of selectable switching frequency, selectable set point, selectable droop level, and selectable digital compensation mode.

47. An apparatus for determining settings specified from a plurality of the settings for functions provided in an integrated circuit, wherein the settings are specified by connecting an external capacitor to a terminal of the integrated circuit and connecting an external resistor between the terminal and a common terminal of the integrated circuit, the apparatus comprising:

first current source means for applying a first direct current to the terminal of the integrated circuit while the common terminal of the integrated circuit is connected to a predetermined voltage, thereby producing a voltage at the terminal;

first converter means for quantizing a voltage level of the voltage, thereby producing a quantized voltage;

second current source means for applying a second direct current to the terminal of the integrated circuit while the common terminal of the integrated circuit is not connected to the predetermined voltage, thereby producing a voltage transient;

second converter means for quantizing an interval required for a voltage level of the voltage transient to reach a predetermined voltage threshold, thereby producing a quantized interval;

wherein the first converter means provides first control signals to a first functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of the settings is represented by a different quantized voltage, wherein the first functional module implements the one of the settings represented by the first control signals; and

wherein the second converter means provides second control signals to a second functional module within the integrated circuit, the second control signals representing the one of the settings corresponding to the quantized interval, wherein each of the settings is represented by a different quantized interval, wherein the second functional module implements the one of the settings represented by the second control signals.