Methods for predicting board test coverage
First Claim
1. A method for predicting board test coverage, comprising:
- a) enumerating potentially defective properties for a board design;
b) determining how each of a number of potential test technologies could be applied to the board design; and
c) predicting board test coverage for one or more combinations of the potential test technologies by;
i) for each potentially defective property enumerated, generate a property score that is indicative of whether a potential test technology could test for the potentially defective property; and
ii) combining property scores to predict board test coverage for each combination of potential test technologies.
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Abstract
Disclosed are methods for predicting board test coverage. In one method, board test coverage is predicted by enumerating potentially defective properties for a board design; determining how each of a number of potential test technologies could be applied to the board design; and predicting board test coverage for one or more combinations of the potential test technologies. Board test coverage is predicted for a combination of potential test technologies by, for each potentially defective property enumerated, generating a property score that is indicative of whether a potential test technology could test for the potentially defective property; and combining property scores to predict board test coverage for the combination of potential test technologies.
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Citations
28 Claims
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1. A method for predicting board test coverage, comprising:
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a) enumerating potentially defective properties for a board design;
b) determining how each of a number of potential test technologies could be applied to the board design; and
c) predicting board test coverage for one or more combinations of the potential test technologies by;
i) for each potentially defective property enumerated, generate a property score that is indicative of whether a potential test technology could test for the potentially defective property; and
ii) combining property scores to predict board test coverage for each combination of potential test technologies. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method for predicting board test coverage, comprising:
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a) enumerating potentially defective properties for a board design;
b) determining how each of a number of potential test technologies can be applied to the board design, said determination including, enumerating DFT features that enable the potential test technologies to test the board design;
c) predicting board test coverage for one or more combinations of the potential test technologies and enumerated DFT features by;
i) for each potentially defective property enumerated, generating a property score that is indicative of whether a potential test technology could test for the potentially defective property; and
ii) combining property scores to predict board test coverage for each combination of potential test technologies; and
d) for each board test coverage prediction and its corresponding combination of potential test technologies, compiling a list of DFT features on which the board test coverage prediction is based. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28)
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Specification