×

Empirical data based test optimization method

  • US 6,907,378 B2
  • Filed: 09/26/2002
  • Issued: 06/14/2005
  • Est. Priority Date: 09/26/2002
  • Status: Active Grant
First Claim
Patent Images

1. A method for optimized testing of integrated circuits (ICs), comprising:

  • executing a first test sequence comprising a plurality of tests to test a first plurality of integrated circuit (ICs) and to generate a statistically significant test result comprising one or more test failures, wherein executing the first test sequence does not stop as the one or more test failures of the first plurality of ICs are generated during execution of the first test sequence;

    analyzing the one or more test failures to identify one or more redundant and inefficient tests (RITs) in the plurality of tests of the first test sequence; and

    generating a second test sequence that is optimized with respect to the first test sequence by performing at least one of removing and reordering at least one of the one or more identified RITs.

View all claims
  • 6 Assignments
Timeline View
Assignment View
    ×
    ×