×

Method and apparatus for performing extraction using a neural network

  • US 6,907,591 B1
  • Filed: 01/31/2002
  • Issued: 06/14/2005
  • Est. Priority Date: 08/28/2001
  • Status: Active Grant
First Claim
Patent Images

1. A method of extracting electrical characteristics from an integrated circuit layout, said method comprising:

  • dividing said integrated circuit layout into at least one extraction sub problem;

    selecting a set of physical parameters from integrated circuit layout that define said extraction sub problem;

    selecting an extraction neural network from a plurality of extraction neural networks;

    supplying said set of physical parameters to said selected extraction neural network; and

    calculating at least one electrical characteristic for said extraction sub problem by analyzing said set of physical parameters with said selected extraction neural network.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×