Method and apparatus for performing extraction using a neural network
First Claim
1. A method of extracting electrical characteristics from an integrated circuit layout, said method comprising:
- dividing said integrated circuit layout into at least one extraction sub problem;
selecting a set of physical parameters from integrated circuit layout that define said extraction sub problem;
selecting an extraction neural network from a plurality of extraction neural networks;
supplying said set of physical parameters to said selected extraction neural network; and
calculating at least one electrical characteristic for said extraction sub problem by analyzing said set of physical parameters with said selected extraction neural network.
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Abstract
A system for using machine-learning to create a model for performing integrated circuit layout extraction is disclosed. The system of the present invention has two main phases: model creation and model application. The model creation phase comprises creating one or more extraction models using machine-learning techniques. First, a complex extraction problem is decomposed into smaller simpler extraction problems. Then, each smaller extraction problem is then analyzed to identify a set of physical parameters that fully define the smaller extraction problem. Next, models are created using machine learning techniques for all of the smaller simpler extraction problems. The machine learning is performed by first creating training data sets composed of the identified parameters from typical examples of the smaller extraction problem and the answers to those example extraction problems as solved using a highly accurate physics-based field solver. Next, the system trains a set of neural networks using the training sets. In one embodiment, Bayesian inference is used to train the neural networks that are used to model the extraction. After the creation the neural network based models for each of the smaller simpler extraction problems, the neural network based models may be used for extraction.
50 Citations
18 Claims
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1. A method of extracting electrical characteristics from an integrated circuit layout, said method comprising:
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dividing said integrated circuit layout into at least one extraction sub problem;
selecting a set of physical parameters from integrated circuit layout that define said extraction sub problem;
selecting an extraction neural network from a plurality of extraction neural networks;
supplying said set of physical parameters to said selected extraction neural network; and
calculating at least one electrical characteristic for said extraction sub problem by analyzing said set of physical parameters with said selected extraction neural network. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A computer readable medium, said computer readable medium comprising an arranged set of computer instructions for:
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dividing an integrated circuit layout into at least one extraction sub problem;
selecting a set of physical parameters from integrated circuit layout that define said extraction sub problem;
selecting an extraction neural network from a plurality of extraction neural networks;
supplying said set of physical parameters to said selected extraction neural network; and
calculating at least one electrical characteristic for said extraction sub problem by analyzing said set of physical parameters with said selected extraction neural network. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18)
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Specification