Piezo-resistive sensing of mirror position in an optical switch

• US 6,911,913 B2
• Filed: 09/30/2002
• Issued: 06/28/2005
• Est. Priority Date: 09/30/2002
• Status: Expired due to Term

• Current Assignee: Lucent Technologies, Inc. (Nokia Corporation)
• Original Assignee: Lucent Technologies, Inc. (Nokia Corporation)
• Inventors: Kim, Jungsang, Olkhovets, Anatoli, Tran, Alex T.
• Primary Examiner(s): Lieu, Julie Bichngoc
• Application Number:
  US10/261,086
• Publication Number:
  US 20040061619A1
• Time in Patent Office: 1,002 Days
• Field of Search: 340/593, 340/635, 340/665, 340/657, 340/686.1, 385/15, 385/16, 385/19, 385/25, 359/220, 359/221, 359/223, 359/224, 359/226
• US Class Current: 340/593
• CPC Class Codes: G02B 26/0841 the reflecting element being moved or deformed by electrostatic means
• CPC Class Codes: G02B 6/3518 the reflective optical element being an intrinsic part of a MEMS device, i.e. fabricated together with the MEMS device MEMS devices in general B81B; manufacture of MEM devices in general B81C; micromechanical devices controlling the direction of light G02B26/0833
• CPC Class Codes: G02B 6/357 Electrostatic force electrostatic forces controlling reflecting elements in general G02B26/0841
• CPC Class Codes: G02B 6/3578 Piezoelectric force piezoelectric forces controlling reflecting elements in general G02B26/0858; piezo-optic devices G02F1/0131
• CPC Class Codes: G02B 6/359 of the position of the moving element itself during switching, i.e. without monitoring the switched beams

Abstract

An integrated piezo-resistive sensor for determining mirror position in an optical switch. One or more piezo-resistive layers may be formed in silicon springs supporting a movable mirror in the switch. Change in resistivity of those layers due to spring deformation during mirror motion is measured and related to the mirror deflection angle. Information about the angle may be used to provide feedback to the motion actuator, which then may be operated to orient the mirror more accurately. A sensor'"'"'s sensitivity may be increased by appropriately orienting the springs with respect to the crystallographic axes of the silicon.

Claims

1. A MEMS device, comprising:

a stationary part; and

at least one spring movably coupling the stationaly part and a movable part of the MEMS device and having first and second piezo-resistive layers, wherein the resistivity of the first piezo-resistive layer indicates position of the movable part with respect to the stationary part.

2. The invention of claim 1, wherein the first piezo-resistive layer is adapted to deform as a result of motion of the movable part relative to the stationary part.

3. The invention of claim 1, wherein the second piezo-resistive layer is substantially electrically isolated from the first piezo-resistive layer.

4. The invention of claim 3, wherein the at least one spring further comprises a third layer located between the first and second piezo-resistive layers, the third layer providing electrical isolation between the first and second piezo-resistive layers.

5. The invention of claim 4, wherein:

the first and second piezo-resistive layers comprise n-silicon;

the third layer comprises p-silicon; and

when at least one of the first and second piezo-resistive layers is electrically biased relative to the third layer, the first piezo-resistive layer is diode isolated from the second piezo-resistive layer.

6. The invention of claim 3, wherein:

the movable part comprises;

a first plate; and

a second plate rotatably coupled between the first plate and the stationary part to enable motion of the first plate relative to the second plate and motion of the second plate relative to the stationary part, wherein the at least one spring is a first spring connected between the second plate and the stationary part; and

a second spring is connected between the first and second plates, the second spring comprising at least one piezo-resistive layer, wherein the resistivities of the first and second piezo-resistive layers of the first spring and the at least one piezo-resistive layer of the second spring indicate orientation of the first plate with respect to the stationary part.

7. The invention of claim 6, wherein:

the first and second piezo-resistive layers of the first spring are adapted to deform as a result of motion of the second plate relative to the stationary part; and

the at least one piezo-resistive layer of the second spring is adapted to deform as a result of motion of the first plate relative to the second plate.

8. The invention of claim 6, wherein a surface of the second plate is at least partially metal-plated to enable electrical connection between the first piezo-resistive layer of the first spring and the at least one piezo-resistive layer of the second spring.

9. The invention of claim 6, wherein a surface of the second plate is at least partially selectively-doped to provide electrical connection between the first piezo-resistive layer of the first spring and the piezo-resistive layer of the second spring.

10. The invention of claim 6, wherein:

a third spring is connected between the second plate and the stationary part, the third spring comprising a first piezo-resistive layer and a second piezo-resistive layer substantially electrically isolated from each other;

a fourth spring is connected between the first plate and the second plate, the fourth spring comprising at least one piezo-resistive layer;

the first and third springs are connected to opposite sides of the second plate;

the second and fourth springs are connected to opposite sides of the first plate;

the first and second piezo-resistive layers of each of the first and third springs are adapted to deform as a result of motion of the second plate relative to the stationary part;

the at least one piezo-resistive layer of each of the second and fourth springs is adapted to deform as a result of motion of the first plate relative to the second plate;

the first piezo-resistive layer of the first spring, the at least one piezo-resistive layer of the second spring, the first piezo-resistive layer of the third spring, and the at least one piezo-resistive layer of the fourth spring are electrically connected in series to form at least part of a first sensing circuit; and

the second piezo-resistive layer of the first spring and the second piezo-resistive layer of the third spring are electrically connected in series to form at least part of a second sensing circuit.

11. The invention of claim 10, wherein at least one of the first and second sensing circuits is part of a bridge adapted for resistivity measurements.

12. The invention of claim 1, wherein the MEMS device is implemented in a wafer comprising crystalline silicon and the at least one spring is oriented at about 22.5 degrees with respect to a [100] crystallographic direction in the silicon.

13. The invention of claim 1, wherein the MEMS device is an optical switch and is implemented in an integrated device having two or more optical switches.

14. The invention of claim 1, wherein the MEMS device is adapted to generate a feedback signal based on the position of the movable part with respect to the stationary part to control motion of the movable part.

15. The invention of claim 1, wherein the at least one spring is a serpentine spring.

16. A method comprising:

measuring resistivity of a piezo-resistive layer of at least one spring movably coupling a stationary part and a movable part of a MEMS device, wherein the at least one spring has at least two piezo-resistive layers; and

determining position of the movable part with respect to the stationary part of the MEMS device based on the measured resistivity.

17. The invention of claim 16, further comprising generating a feedback signal based on the position of the movable part with respect to the stationary part to control motion of the movable part.

20. The invention of claim 16, wherein a first piezo-resistive layer is substantially electrically isolated from a second piezo-resistive layer.

21. The invention of claim 20, wherein the at least one spring has a third layer located between the first and second piezo-resistive layers, the third layer providing electrical isolation between the first and second piezo-resistive layers.

22. The invention of claim 20, wherein:

the movable part comprises;

a first plate; and

a second plate rotatably coupled between the first plate and the stationary part to enable motion of the first plate relative to the second plate and motion of the second plate relative to the stationary part, wherein the at least one spring is a first spring connected between the second plate and the stationary part; and

a second spring is connected between the first and second plates, the second spring comprising at least one piezo-resistive layer, wherein the resistivities of the first and second piezo-resistive layers of the first spring and the at least one piezo-resistive layer of the second spring indicate orientation of the first plate with respect to the stationary part.

18. Apparatus comprising:

means for measuring resistivity of a piezo-resistive layer of at least one spring movably coupling a stationary part and a movable part of a MEMS device, wherein the at least one spring has at least two piezo-resistive layers; and

means for determining position of the movable part with respect to the stationary part of the MEMS device based on the measured resistivity.

19. The invention of claim 18, further comprising means for generating a feedback signal based on the position of the movable part with respect to the stationary part to control motion of the movable part.

23. The invention of claim 18, wherein a first piezo-resistive layer is substantially electrically isolated from a second piezo-resistive layer.

24. The invention of claim 23, wherein the at least one spring has a third layer located between the first and second piezo-resistive layers, the third layer providing electrical isolation between the first and second piezo-resistive layers.

25. The invention of claim 23, wherein:

the movable part comprises;

a first plate; and

a second plate rotatably coupled between the first plate and the stationary part to enable motion of the first plate relative to the second plate and motion of the second plate relative to the stationary part, wherein the at least one spring is a first spring connected between the second plate and the stationary part; and

a second spring is connected between the first and second plates, the second spring comprising at least one piezo-resistive layer, wherein the resistivities of the first and second piezo-resistive layers of the first spring and the at least one piezo-resistive layer of the second spring indicate orientation of the first plate with respect to the stationary part.