Three dimensional stress vector sensor array and method therefor
First Claim
Patent Images
1. A sensor for measuring applied forces within an object body, comprising:
- a mat having a lower plane comprising a plurality of discrete capacitor plates mutually arranged in a spaced apart two dimensional array about an interrogation electrode and an upper conductive plate repositionable relative to the plurality of discrete capacitor plates responsive to the applied forces from the object body; and
means for measuring the applied forces within the object body by resolving and measuring in three dimensions a stress vector resulting from the movement of the upper mat conductive plate relative to the lower capacitor plates;
the mat comprises a dielectric body, and the plurality of discrete capacitor plates being capacitively coupled to the interrogation electrode and to the upper conductive plate and wherein the capacitance between the lower discrete capacitor plates and the interrogation electrode changes responsive to a change in position between the mat upper conductive plate and the mat lower capacitor plates; and
the means for measuring the applied forces within the object body comprises means for comparing the sign and magnitude of the capacitance changes between the lower capacitor plates and the interrogation electrode.
1 Assignment
0 Petitions
Accused Products
Abstract
A sensor array is configured based upon capacitive sensor techniques to measure stresses at various positions in a sheet simultaneously and allow a stress map to be obtained in near real-time. The device consists of single capacitive elements applied in a one or two dimensional array to measure the distribution of stresses across a mat surface in real-time as a function of position for manufacturing and test applications. In-plane and normal stresses in rolling bodies such as tires may thus be monitored.
-
Citations
10 Claims
-
1. A sensor for measuring applied forces within an object body, comprising:
-
a mat having a lower plane comprising a plurality of discrete capacitor plates mutually arranged in a spaced apart two dimensional array about an interrogation electrode and an upper conductive plate repositionable relative to the plurality of discrete capacitor plates responsive to the applied forces from the object body; and
means for measuring the applied forces within the object body by resolving and measuring in three dimensions a stress vector resulting from the movement of the upper mat conductive plate relative to the lower capacitor plates;
the mat comprises a dielectric body, and the plurality of discrete capacitor plates being capacitively coupled to the interrogation electrode and to the upper conductive plate and wherein the capacitance between the lower discrete capacitor plates and the interrogation electrode changes responsive to a change in position between the mat upper conductive plate and the mat lower capacitor plates; and
the means for measuring the applied forces within the object body comprises means for comparing the sign and magnitude of the capacitance changes between the lower capacitor plates and the interrogation electrode.
-
-
2. A sensor for measuring applied forces within an object body, comprising:
-
a mat having a lower plane and an upper plane repositionable relative to the lower plane in at least one direction responsive to the applied forces from the object body; and
means for measuring the applied forces within the object body by measuring the movement of the upper mat plane relative to the lower mat plane;
wherein the mat comprises a dielectric body having a plurality of lower electrodes disposed in a predetermined pattern and an upper electrode, the upper electrode being repositionable in at least one direction relative to the lower electrodes responsive to applied forces within the object body;
wherein each lower electrode is capacitively coupled to an interrogation source, the capacitance between the lower electrodes and the interrogation source changing responsive to a change in position between the mat upper electrode and the mat lower electrodes and wherein the means for measuring the applied forces within the object body comprises means for comparing the sign and magnitude of the capacitance changes between the lower electrodes and the interrogation source. - View Dependent Claims (3, 4, 5, 6)
-
-
7. A sensor for measuring applied force within an object body comprising:
-
a plurality of discrete sensor components attend into a linear array with each sensor component mechanically isolated from an adjacent sensor, each sensor component comprising a mat having a plurality of lower capacitor plates disposed about and capacitively coupled to an interrogation electrode and an upper conductive plate repositionable relative to the lower plane in at least one direction responsive to the applied forces within the object body; and
means for measuring the applied force within th object body by measuring the movement of the upper mat conductive plate relative to the lower mat capacitor plates; and
the means for measuring the applied force within the object body comprises means for comparing the sign and magnitude of capacitance changes between the lower capacitor plates and the interrogation electrode.
-
-
8. A method for measuring applied forces within an object body, comprising the steps:
-
(a) locating a sensor proximate the body, the sensor comprising a mat having a lower plane and an upper plane repositionable relative to the lower plane in at least one direction responsive to the applied forces within the object body;
(b) connecting means to the mat for measuring the applied forces within the object body by measuring the movement magnitude and direction of the upper mat plane relative to the lower mat plane; and
wherein the mat is formed at least partially of dielectric material having a plurality of lower electrodes disposed in a predetermined pattern and an upper electrode repositionable in at least one direction relative to the lower electrodes responsive to applied forces, the method comprising the further steps;
capacitively coupling the lower electrodes to an interrogation source, the capacitance between the lower electrodes and the interrogation source changing responsive to a change in position between the mat upper electrode and the mat lower electrodes; and
comparing the sign and magnitude of the capacitance changes between the lower electrodes and the interrogation source. - View Dependent Claims (9, 10)
-
Specification