Self-test circuit and method for testing a microsensor

• US 6,918,282 B2
• Filed: 03/27/2003
• Issued: 07/19/2005
• Est. Priority Date: 03/27/2003
• Status: Expired due to Fees

• Current Assignee: Delphi Technologies, Inc. (BorgWarner Incorporated)
• Original Assignee: Delphi Technologies, Inc. (BorgWarner Incorporated)
• Inventors: Zarabadi, Seyed R.
• Primary Examiner(s): Noland, Thomas P.
• Application Number:
  US10/401,207
• Publication Number:
  US 20040187555A1
• Time in Patent Office: 845 Days
• Field of Search: 73 137- 138, 73/10.1, 73/18.8, 702/88, 702/116, 324/601, 295/92, 295/95
• US Class Current: 73/1.38
• CPC Class Codes: G01P 15/125 by capacitive pick-up
• CPC Class Codes: G01P 2015/0814 for translational movement of the mass, e.g. shuttle type
• CPC Class Codes: G01P 21/00 Testing or calibrating of apparatus or devices covered by the preceding groups
• CPC Class Codes: Y10T 29/49 Method of mechanical manufacture

Abstract

A test circuit and method provide testing of a capacitive type microsensor. The method includes applying a first signal having a first voltage potential to an input of a microsensor during a non-test operating mode. The method also includes applying a second voltage signal having a second voltage potential different than the first voltage potential during a test mode. The second voltage potential induces a net differential electrostatic force in the microsensor. The method further includes the steps of monitoring an output signal of the microsensor, comparing the output signal to an expected value when the microsensor is in the test mode, and determining if the microsensor is functioning properly as a function of the comparison.

Claims

1. Method of testing a capacitive-type microsensor, said method comprising the steps of:

applying a first signal having a first voltage potential to an input of a microsensor during a non-test operating mode;

applying a second voltage signal having a second voltage potential different than the first voltage potential during a test mode, wherein the second voltage potential induces a change in electrostatic force in the microsensor as compared to the first voltage potential and the microsensor generates an output signal;

monitoring the output signal of the microsensor;

comparing the output signal to an expected value when the microsensor is in the test mode;

determining if the microsensor is functioning properly as a function of the comparison; and

setting a flag if the microsensor is determined not to be functioning properly.

2. The method as defined in claim 1 further comprising the steps of measuring gain of the microsensor and adjusting a gain factor based on the measured gain.

3. The method as defined in claim 2, wherein the step of adjusting the gain factor comprises electronically trimming microsensor circuitry.

4. The method as defined in claim 1 further comprising the steps of:

generating the first signal as a first alternating waveform signal having high and low voltage potentials; and

generating the second signal as a second alternating waveform signal having high and low voltage potentials.

5. The method as defined in claim 4, wherein the first and second alternating wave signals comprise square wave signals.

6. The method as defined in claim 4, wherein the high and low voltage potentials of the first attenuating waveform signal are offset in voltage from the high and low voltage potentials of the second alternating waveform signal.

7. The method as defined in claim 1, wherein the microsensor comprises variable capacitors comprising fixed capacitive plates and movable capacitive plates arranged to form a capacitive device.

8. The method as defined in claim 1, wherein the microsensor comprises a capacitive type accelerometer.

9. Method of testing a capacitive-type microsensor, said method comprising the steps of:

applying a first signal having a first voltage potential to an input of a microsensor during a non-test operating mode;

applying a second voltage signal having a second voltage potential different than the first voltage potential during a test mode, wherein the second voltage potential induces a change in electrostatic force in the microsensor as compared to the first voltage potential and the microsensor generates an output signal;

monitoring the output signal of the microsensor;

comparing the output signal to an expected value when the microsensor is in the test mode;

determining if the microsensor is functioning properly as a function of the comparison;

receiving an input voltage from a voltage source; and

dividing the input voltage into the first and second voltage potentials via a resistor divider network.

10. The method as defined in claim 9 further comprising the steps of measuring gain of the microsensor and adjusting a gain factor based on the measured gain.

11. The method as defined in claim 10, wherein the step of adjusting the gain factor comprises electronically trimming microsensor circuitry.

12. The method as defined in claim 9 further comprising the steps of:

generating the first signal as a first alternating waveform signal having high and low voltage potentials; and

generating the second signal as a second alternating waveform signal having high and low voltage potentials.

13. The method as defined in claim 12, wherein the first and second alternating wave signals comprise square wave signals.

14. The method as defined in claim 12, wherein the high and low voltage potentials of the first attenuating waveform signal are offset in voltage from the high and low voltage potentials of the second alternating waveform signal.

15. The method as defined in claim 9, wherein the microsensor comprises variable capacitors comprising fixed capacitive plates and movable capacitive plates arranged to form a capacitive device.

16. The method as defined in claim 9, wherein the microsensor comprises a capacitive type accelerometer.