Method for measuring a position of a conductive target material

• US 6,919,731 B2
• Filed: 05/29/2003
• Issued: 07/19/2005
• Est. Priority Date: 10/22/1999
• Status: Expired due to Term

• Current Assignee: Bently Nevada Incorporated (General Electric Company)
• Original Assignee: Bently Nevada Incorporated (General Electric Company)
• Inventors: Slates, Richard D.
• Primary Examiner(s): Ramirez, Nestor
• Assistant Examiner(s): Kobert, Russell M.
• Application Number:
  US10/448,986
• Publication Number:
  US 20030206001A1
• Time in Patent Office: 782 Days
• Field of Search: 324/603, 324/607, 324/608, 324/662, 324/671, 324/699, 324/713, 324/716, 324/207.15, 324/207.16, 702/65, 702/116, 702/155, 702/158, 702/166
• US Class Current: 324/716
• CPC Class Codes: G01B 7/003 for measuring position, not involving coordinate determination coordinate measuring G01B7/004
• CPC Class Codes: G01B 7/023 for measuring distance between sensor and object G01B7/082 and G01B7/102 take precedence
• CPC Class Codes: G01D 18/00 Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
• CPC Class Codes: G01D 5/202 by movable a non-ferromagnetic conductive element G01D5/2033 takes precedence
• CPC Class Codes: G01N 27/9046 by analysing electrical signals

Abstract

A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.

Claims

1. A method for measuring a position of a conductive target material, the steps including:

sampling and digitizing a first voltage impressed across a serial connection of a resistance means and a proximity probe located adjacent a conductive target material to obtain a first digitized voltage;

sampling and digitizing a second voltage impressed only across the probe to obtain a second digitized voltage,

transforming the two digitized voltages into complex voltage numbers;

calculating an electrical impedance of the proximity probe by using both complex voltage numbers;

correlating the calculated electrical impedance to a gap between the proximity probe and the conductive target material.

2. The method of claim 1 further including the steps of normalizing the calculated electrical impedance of the proximity probe and comparing the normalized impedance to a plurality of previously compiled representations of normalized impedance curves for different conductive target materials for identifying the conductive target material prior to correlating the calculated electrical impedance to the gap between the proximity probe and the conductive target material.

3. The method of claim 1 wherein the correlating step further includes the steps of normalizing the calculated electrical impedance of the proximity probe and comparing the normalized impedance to a previously compiled representation of a plurality of gap locus lines, each defining a single gap value for different conductive target materials, for identifying a gap line for use in correlating the calculated electrical impedance to a gap between the proximity probe and the conductive target material.