Active cantilever for nanomachining and metrology

• US 6,923,044 B1
• Filed: 03/07/2002
• Issued: 08/02/2005
• Est. Priority Date: 03/08/2001
• Status: Expired due to Fees

• Current Assignee: Terraspan LLC
• Original Assignee: General Nanotechnology LLC
• Inventors: Kley, Victor B.
• Primary Examiner(s): NOLAND, THOMAS
• Application Number:
  US10/094,408
• Time in Patent Office: 1,244 Days
• Field of Search: 731/05, 250/306
• US Class Current: 73/105
• CPC Class Codes: B24B 37/11 Lapping tools
• CPC Class Codes: B82Y 35/00 Methods or apparatus for measurement or analysis of nanostructures
• CPC Class Codes: G01Q 70/02 Probe holders
• CPC Class Codes: Y10S 977/86 Scanning probe structure
• CPC Class Codes: Y10S 977/872 Positioner
• CPC Class Codes: Y10S 977/873 Tip holder

Abstract

A probe assembly suited for use in a scanning probe microscope (SPM) system includes a cantilever have an attachment to a main body portion. A suitable tip disposed at the free end of the cantilever provides various functions. According to various embodiments of the invention, the tip and cantilever members have active components to produce kinetic action, thus facilitating the utility of the probe assembly in various SPM applications.

Claims

1. A probe suitable for use in a scanning probe microscope system comprising:

a main body portion; and

a cantilever assembly comprising;

a primary cantilever having a fixed end connected to the main body portion and having a free end;

a scanning tip disposed proximate the free end of the primary cantilever; and

an assembly head flexibly connected to the main body portion, the assembly head having plural preset positions relative to the primary cantilever,

the assembly head comprising one or more interaction structures configured for coactive interaction with the primary cantilever, each interaction structure associated with one of the preset positions and selectably aligned with the primary cantilever,

the assembly head having a position locking arrangement to releasably position the assembly head into one of the preset positions wherein its associated interaction structure is brought into alignment with the primary cantilever, wherein operation of the primary cantilever is affected by characteristics of the associated interaction structure.

2. The probe of claim 1 wherein a first interaction structure is a first auxiliary cantilever having a free end that can be brought into alignment with the free end of the primary cantilever.

3. The probe of claim 1 wherein a second interaction structure is a second auxiliary cantilever having a free end that can be brought into alignment with the free end of the primary cantilever, the first auxiliary structure having a stiffness characteristic different from that of the second auxiliary structure.

4. The probe of claim 1 wherein one of the interaction structures comprises a land that can be brought into contacting relation with the scanning tip.

5. The probe of claim 1 wherein one of the interaction structures comprises a slotted opening configured to receive a portion of the primary cantilever to restrict cantilever deflections.