×

Test probe for electrical devices having low or no wedge depression

  • US 6,927,598 B2
  • Filed: 11/20/2003
  • Issued: 08/09/2005
  • Est. Priority Date: 10/15/2002
  • Status: Expired due to Fees
First Claim
Patent Images

1. A probe for detecting abnormalities in an electrical device having an effective wedge depression of no more than 200 mils between a pair of teeth, comprising:

  • a probe core having first and second sensing end portions; and

    and a sense coil wound about the probe core;

    wherein said probe is adapted to extend between said pair of teeth and detect abnormalities in the electrical device in a spaced, contact-free relationship between and at least partially above opposed adjacent surfaces of said pair of teeth, forming first and second air gaps between the first and second sensing end portions of the core and the respective opposed adjacent surfaces.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×