Tool for generating a re-generative functional test
First Claim
1. A system, comprising:
- user directives provided to indicate user desired actions;
instruction information provided to define a suite of instructions; and
a software built-in self-test engine (SBE) generation tool arranged to generate a software built-in self-test engine (SBE) based on the user directives, the instruction information and device constraints, for subsequent storage on-board of a complex device under test (DUT) and activation of a re-generative functional test on the complex device under test (DUT);
wherein said SBE generation tool comprises;
a random instruction test generator (RIT-G) composer to receive the user directives and the instruction information and generate a compact RIT-G code;
a test execution directive composer to receive the user directives and the device constraints and create a run time environment to enable the re-generative functional test to repeatedly generate functional tests and execute generated tests on-board the complex device under test (DUT);
a test result compaction module composer to generate a test result compaction module code; and
a code merger to merge code from the RIT-G composer, the test execution directive composer and the test result compaction module composer to generate the software built-in self-test engine (SBE).
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Accused Products
Abstract
A host system for generating a software built-in self-test engine (SBE) is provided for enabling on-chip generation and application of a re-generative functional test on a complex device such as a microprocessor under test. The host system comprises user directives provided to indicate user desired actions; instruction information provided to define a suite of instructions; and a SBE generation tool arranged to generate a software built-in self-test engine (SBE) based on the user directives, the instruction information and device constraints, for subsequent storage on-board of a complex device such as a microprocessor under test and activation of a re-generative functional test on the complex device under test (DUT).
64 Citations
31 Claims
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1. A system, comprising:
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user directives provided to indicate user desired actions;
instruction information provided to define a suite of instructions; and
a software built-in self-test engine (SBE) generation tool arranged to generate a software built-in self-test engine (SBE) based on the user directives, the instruction information and device constraints, for subsequent storage on-board of a complex device under test (DUT) and activation of a re-generative functional test on the complex device under test (DUT);
wherein said SBE generation tool comprises;
a random instruction test generator (RIT-G) composer to receive the user directives and the instruction information and generate a compact RIT-G code;
a test execution directive composer to receive the user directives and the device constraints and create a run time environment to enable the re-generative functional test to repeatedly generate functional tests and execute generated tests on-board the complex device under test (DUT);
a test result compaction module composer to generate a test result compaction module code; and
a code merger to merge code from the RIT-G composer, the test execution directive composer and the test result compaction module composer to generate the software built-in self-test engine (SBE). - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A system, comprising:
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user directives provided to indicate user desired actions;
instruction information provided to define a suite of instructions; and
a software built-in self-test engine (SBE) generation tool arranged to generate a software built-in self-test engine (SBE) based on the user directives, the instruction information and device constraints, for subsequent storage on-board of a complex device under test (DUT) and activation of a re-generative functional test on the complex device under test (DUT);
wherein said SBE is to be merged with an expected test result and then loaded on-board the complex device under test (DUT) so as to activate the re-generative functional test on the complex device under test (DUT) and make a comparison between test results of the re-generative functional test and the expected test result to check for design validations and/or manufacturing defects. - View Dependent Claims (9)
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10. A system, comprising:
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user directives provided to indicate user desired actions;
instruction information provided to define a suite of instructions; and
a software built-in self-test engine (SBE) generation tool arranged to generate a software built-in self-test engine (SBE) based on the user directives, the instruction information and device constraints, for subsequent storage on-board of a complex device under test (DUT) and activation of a re-generative functional test on the complex device under test (DUT);
wherein said software built-in self-test engine (SBE) comprises;
a random instruction test generator (RIT-G) including random instruction test (RIT) machine code residing on-board the complex device under test (DUT) for generating the re-generated functional test;
a test program execution module including test execution directives for providing a run time environment to store and run the re-generated functional test; and
a test result compaction module including compression machine code to compress test results of the re-generated functional test for storage on-board the complex device under test (DUT). - View Dependent Claims (11)
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12. A system, comprising:
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user directives provided to indicate user desired actions;
instruction information provided to define a suite of instructions; and
a software built-in self-test engine (SBE) generation tool arranged to generate a software built-in self-test engine (SBE) based on the user directives, the instruction information and device constraints, for subsequent storage on-board of a complex device under test (DUT) and activation of a re-generative functional test on the complex device under test (DUT);
wherein said complex device under test (DUT) includes a microprocessor;
wherein, when test patterns of the SBE are applied to the microprocessor from an on-board memory, the microprocessor performs the following;
beginning a set-up for executing test patterns;
executing the test patterns to generate a series of test sequences and associated data for respective test sequences;
running the test sequences, and at the end of the test sequences, obtaining test results for storage in the on-board memory; and
dumping the test results of the test patterns for making a comparison with an expected test result to check for design validations and/or manufacturing defects; and
wherein said software built-in self-test engine (SBE) is programmed to generate and execute one or more (“
N”
),instruction sequences, each sequence being executed on one or more (“
M”
) data sets, where “
N” and
“
M”
represent an integer no less than “
1” and
are user-specified numbers used in generating the SBE by the SBE generation tool. - View Dependent Claims (13)
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14. A computer readable medium having stored thereon a software built-in self-test engine (SBE) generation software tool which, when executed by a host system, causes the system to perform:
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demanding inputs of user directives indicating user desired actions;
obtaining instruction information provided to define a suite of instructions; and
generating a software built-in self-test engine (SBE) based on the user directives, the instruction information and device constraints, for subsequent storage on-board of a complex device under test (DUT) and activation of a re-generative functional test on the complex device under test (DUT);
wherein said SBE generation tool comprises;
a random instruction test generator (RIT-G) composer to receive the user directives and the instruction information and generate a compact RIT-G code;
a test execution directive composer to receive the user directives and the device constraints and create a run time environment needed to enable the re-generative functional test to repeatedly generate functional tests and execute generated tests on-board the complex device under test (DUT);
a test result compaction module composer to generate a test result compaction module code; and
a code merger to merge code from the RIT-G composer, the test execution directive composer and the test result compaction module composer to generate the software built-in self-test engine (SBE). - View Dependent Claims (15, 16, 17, 18, 19)
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20. A computer readable medium having stored thereon a software built-in self-test engine (SBE) generation software tool which, when executed by a host system, causes the system to perform:
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demanding inputs of user directives indicating user desired actions;
obtaining instruction information provided to define a suite of instructions; and
generating a software built-in self-test engine (SBE) based on the user directives, the instruction information and device constraints, for subsequent storage on-board of a complex device under test (DUT) and activation of a re-generative functional test on the complex device under test (DUT);
wherein said software built-in self-test engine (SBE) comprises;
a random instruction test generator (RIT-G) including compact random instruction test (RIT) machine code residing on-board the complex device under test (DUT) for generating the re-generated functional test;
a test program execution module including test execution directives for providing a run time environment to store and run the re-generated functional test; and
a test result compaction module including compression machine code to compress test results of the re-generated functional test for storage on-board the complex device under test (DUT).
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21. A computer readable medium having stored thereon a software built-in self-test engine (SBE) generation software tool which, when executed by a host system, causes the system to perform:
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demanding inputs of user directives indicating user desired actions;
obtaining instruction information provided to define a suite of instructions; and
generating a software built-in self-test engine (SBE) based on the user directives, the instruction information and device constraints, for subsequent storage on-board of a complex device under test (DUT) and activation of a re-generative functional test on the complex device under test (DUT);
wherein said software built-in self-test engine (SBE) is programmed to generate and execute one or more (“
N”
) instruction sequences during testing, each sequence being executed on one or more (“
M”
) data sets, where “
N” and
“
M”
represent an integer no less than “
1” and
are user-specified numbers used in generating the SBE by the SBE generation tool. - View Dependent Claims (22)
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23. A method for generating a software built-in self-test engine (SBE) for on-chip generation and application of a re-generative functional test on a complex device under test (DUT), comprising:
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obtaining user directives which indicate user desired actions;
obtaining instruction information which defines a suite of instructions; and
generating the software built-in self-test engine (SBE) based on the user directives, the instruction information and device constraints, for subsequent storage on-board of the complex device under test (DUT) and activation of the re-generative functional test on the complex device under test (DUT);
wherein said software built-in self-test engine (SBE) is generated by;
generating a compact random instruction test generator (RIT-G) code based on the user directives and the instruction information;
creating a run time environment to enable the re-generative functional test to repeatedly generate functional tests and execute generated tests on-board the complex device under test (DUT) based on the device constraints;
generating a test result compaction module code based on the user directives and the device constraints; and
merging the RIT-G code, the run time environment and the test result compaction module code to obtain the software built-in self-test engine (SBE). - View Dependent Claims (24, 25, 26, 27, 28, 29)
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30. A method for generating a software built-in self-test engine (SBE) for on-chip generation and application of a re-generative functional test on a complex device under test (DUT), comprising:
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obtaining user directives which indicate user desired actions;
obtaining instruction information which defines a suite of instructions; and
generating the software built-in self-test engine (SBE) based on the user directives, the instruction information and device constraints, for subsequent storage on-board of the complex device under test (DUT) and activation of the re-generative functional test on the complex device under test (DUT);
wherein said SBE is to be merged with an expected test result and then loaded on-board the complex device under test (DUT) so as to activate the re-generative functional test on the complex device under test (DUT) and make a comparison between test results of the re-generative functional test and the expected test result to check for design validations and/or manufacturing defects. - View Dependent Claims (31)
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Specification