Method and apparatus for monitoring structural fatigue and use

• US 6,928,881 B2
• Filed: 06/29/2001
• Issued: 08/16/2005
• Est. Priority Date: 06/29/2000
• Status: Expired due to Fees

• Current Assignee: University College London (University of London)
• Original Assignee: University College London (University of London)
• Inventors: Brennan, Feargal Peter
• Primary Examiner(s): Noor, Max
• Application Number:
  US10/312,927
• Publication Number:
  US 20040025595A1
• Time in Patent Office: 1,509 Days
• Field of Search: 737/66, 737/68, 737/74, 737/81, 737/84, 737/86, 737/87
• US Class Current: 73/766
• CPC Class Codes: G01M 5/0033 by determining damage, crack or wear
• CPC Class Codes: G01M 5/0083 by measuring variation of impedance, e.g. resistance, capacitance, induction

Abstract

An electronic stress monitoring device (1) is provided that is arranged to detect and record measurements of stress experienced by a structure (2) to which the stress history unit is attached, with the measurement and recordal of stress occurring at substantially the same location. The stress monitoring unit (1) is also arranged to process the detected readings of stress to determine when significant structural events are occurring within the structure (2) to which it is attached. Data indicative of these events are recorded within the stress monitoring device (1). Periodically data recorded within the stress monitoring device (1) is obtained by data reader (4) and then transmitted to a computer (6) for subsequent analysis.

Claims

1. Apparatus for detecting stresses experienced by a structure, comprising:

a housing adapted to be attached to a structure;

a strain gauge positioned within said housing such that when said housing is attached to a structure the strain gauge may detect stresses experienced by the structure, the strain gauge being operable to generate electrical signals indicative of said stresses;

a memory within said housing and operable to record data derived from said signals to form a record of stresses experienced at different points in a period of time by the structure to which said housing is attached; and

a temperature variation detector within said housing operable to identify variations in detected stress by said strain gauge arising from variations in temperature,

wherein said memory is responsive to record data identifying stresses experienced by said structure arising from variations in load on said structure independent of identified variations arising from variations in temperature.

2. Apparatus in accordance with claim 1 further comprising a processor within said housing operable to determine which variations indicative of changes in stress arising from variation in load are at least a predetermined threshold, wherein said memory is responsive to said determination to record data derived from signals identified by said processor as being indicative of stresses arising from variations in load of at least said predetermined threshold.

3. Apparatus in accordance with claim 1 further comprising a processor within said housing operable to determine which variations indicative of changes in stress arising from variation in load are indicative of the occurrence of maximal or minimal loads, said memory being responsive to said processor to record data derived from signals indicative of maximal or minimal loads.

4. Apparatus in accordance with claim 1 including a processor within said housing operable to determine which variations indicative of changes in stress arising independent of variations arising from variations in temperature are indicative of the occurrence of a period of substantially constant load, said memory being responsive to said processor to record data derived from signals indicative of periods of substantially constant load.

5. Apparatus in accordance with claim 1, including a processor within said housing operable to detect characteristics of said signals indicative of the occurrence in said structure of one or more predetermined stress conditions arising from variations in load on said structure independent of identified variations arising from variations in temperature, said memory being operable in response to detection of said characteristics by said processor to record data indicative of the occurrence of said predetermined stress conditions.

6. Apparatus in accordance with claim 5, wherein said processor is operable to cause said memory to record data derived only from signals determined by said processor to possess said characteristics indicative of said one or more predetermined stress conditions.

7. Apparatus in accordance with claim 1 further comprising a clock within said housing wherein said memory is arranged to include in said record, data identifying the different points in a period of time at which signals are generated from which recorded data in said record is derived.

8. Apparatus in accordance with claim 1 wherein said memory is arranged to generate a record identifying stresses experienced by the structure to which said housing is attached arising from variations in load on said structure independent of identified variations arising from variations in temperature derived from electrical signals generated by said strain gauge obtained at different points in time each separated by a predefined time period.

9. Apparatus in accordance with claim 1 wherein said temperature variation detector comprises:

a temperature sensor operable to generate signals indicative of a detected temperature;

a processor operable to process electrical signals generated by said strain gauge and signals generated by said temperature sensor to calculate a signal indicative of stresses experienced by said structure arising from variations in load on said structure independent of identified variations arising from variations in temperature.

10. Apparatus in accordance with claim 1 wherein said temperature variation detector comprises:

a second strain gauge positioned within said housing attached to a non-load bearing sample of material of the structure said housing is operable to be attached, said second strain gauge thereby being operable to generate electrical signals indicative of stresses experienced by said structure arising from variations in temperature independent of variations arising from variation in load on said structure; and

a processor operable to process electrical signals generated by said second strain gauge and electrical signals indicative of detected stresses experienced by the structure to which said housing is attached to calculate a signal indicative of stresses experienced by said structure arising from variations in load on said structure independent of identified variations arising from variations in temperature.

11. Apparatus for detecting stresses experienced by a structure arising from variations in load, comprising:

a housing adapted to be attached to a structure;

a strain gauge positioned within said housing such that when said housing is attached to a structure the strain gauge may detect stresses experienced by the structure, the strain gauge being operable to generate electrical signals indicative of said stresses;

detection means provided within said housing for determining variations in stress detected by said strain gauge arising from variations in temperature;

recording means within said housing responsive to said strain gauge and said detection means to generate a record identifying stresses experienced by said structure arising from variations in load on said structure independent of identified variations arising from variations in temperature; and

output means operable to output data representing said record.

12. A method of obtaining a history of stresses experienced by a structure arising from variations in load on said structure independent of identified variations arising from variations in temperature;

the method comprising

providing an apparatus for detecting stresses experienced by a structure, comprising;

a housing adapted to be attached to a structure;

a strain gauge positioned within said housing such that when said housing is attached to a structure the strain gauge may detect stresses experienced by the structure, the strain gauge being operable to generate electrical signals indicative of said stresses;

a memory within said housing and operable to record data derived from said signals to form a record of stresses experienced at different points in a period of time by the structure to which said housing is attached; and

a temperature variation detector within said housing operable to identify variations in detected stress by said strain gauge arising from variations in temperature,

wherein said memory is responsive to record data identifying stresses experienced by said structure arising from variations in load on said structure independent of identified variations arising from variations in temperature;

attaching said apparatus to said structure;

utilizing said apparatus to generate a record of stresses experienced at different points in a period of time by said structure arising from variations in load on said structure, independent of identified variations arising from variations in temperature; and

outputting data corresponding to the generated record.