Capacitive probe assembly with flex circuit

• US 6,930,494 B2
• Filed: 08/29/2003
• Issued: 08/16/2005
• Est. Priority Date: 08/29/2003
• Status: Expired due to Fees

• Current Assignee: Agilent Technologies, Inc.
• Original Assignee: Agilent Technologies, Inc.
• Inventors: Crook, David T., Tesdahl, Curtis A.
• Primary Examiner(s): Nguyen, Vincent Q.
• Application Number:
  US10/652,232
• Publication Number:
  US 20050046428A1
• Time in Patent Office: 718 Days
• Field of Search: 324/658, 324/660, 324/686, 324/688, 324/690, 324/158.1
• US Class Current: 324/690
• CPC Class Codes: G01R 31/312 by capacitive methods
• CPC Class Codes: G01R 31/70 Testing of connections between components and printed circuit boards G01R31/68 takes precedence

Abstract

A novel capacitive sensor assembly that utilizes a flex circuit for amplification of capacitively sensed signals and for separating the power, ground, and measurement signals is presented. The use of a flex circuit in the capacitive probe assembly allows implementation of multiple capacitive sensors for respectively capacitively coupling multiple signals from respective multiple test points of a circuit under test. The invention integrates the sensor plate, amplifier, and return wiring for each capacitive sensor all onto one flex circuit.

Claims

1. A capacitive probe assembly, comprising:

a flex circuit comprising;

a sensor connection end having connections to a first sensor signal trace and a guard signal trace;

an amplifier circuit which is coupled at an amplifier signal input to said first sensor signal trace, coupled at an output to a first measurement signal trace, coupled at an amplifier power input to a power signal trace, and coupled at an amplifier ground input to a ground signal trace; and

a host connection end having connections to said power signal trace, said ground signal trace, and said first measurement signal trace;

a capacitive probe having a flex circuit signal connection to said first sensor signal trace of said flex circuit; and

a guard having a flex circuit guard connection to said guard signal trace of said flex circuit.

2. A capacitive probe assembly in accordance with claim 1, wherein:

said capacitive probe comprises a number n, n greater than or equal to 1, of individual probes, each said individual probe connected to said guard signal trace of said flex circuit through said flex circuit guard connection and to a respective one of n sensor signal traces on said flex circuit through a respective one of n respective flex circuit signal connections.

3. A capacitive probe assembly in accordance with claim 2, further comprising:

a multiplexer which connects said amplifier input to only one of said n sensor signal traces on said flex circuit.

4. A capacitive probe assembly, comprising:

a flex circuit comprising;

a sensor connection end having connections to a number n, n greater than or equal to 1, of sensor signal traces and at least one guard signal trace;

a number m, m greater than or equal to 1, of amplifier circuits, each coupled at a respective amplifier signal input to one of said n sensor signal traces, coupled at a respective output to a respective measurement signal trace, coupled at a respective amplifier power input to a power signal trace, and coupled at a respective amplifier ground input to a ground signal trace; and

a host connection end having connections to said power signal trace, said ground signal trace, and each of said respective measurement signal traces;

a capacitive probe having a number n, n greater than or equal to 1, of flex circuit signal connections to said respective n sensor signal traces of said flex circuit; and

a guard having a flex circuit guard connection to said guard signal trace of said flex circuit.

5. A capacitive probe assembly in accordance with claim 4, wherein said capacitive probe comprises a number n, n greater than or equal to 1, of individual probes, each connected to said flex circuit guard connection to said guard signal trace of said flex circuit and to a respective one of said respective n flex circuit signal connections to a respective one of said n sensor signal traces of said flex circuit.

6. A flex circuit for a capacitive probe assembly, said capacitive probe assembly comprising a capacitive probe and a guard, said flex circuit comprising;

a sensor connection end comprising;

a connection to a first sensor signal trace, said first sensor signal trace connection connectable to said capacitive probe of said capacitive probe assembly; and

a connection to a guard signal trace, said guard signal trace connection connectable to said guard of said capacitive probe assembly;

an amplifier circuit which is coupled at an amplifier signal input to said first sensor signal trace, coupled at an output to a first measurement signal trace, coupled at an amplifier power input to a power signal trace, and coupled at an amplifier ground input to a ground signal trace; and

a host connection end having connections to said power signal trace, said ground signal trace, and said first measurement signal trace.

7. A flex circuit in accordance with claim 6, comprising:

n, n greater than or equal to 1, sensor signal traces on said flex circuit;

n flex circuit signal connections, each connected to a respective one of said n sensor signal traces;

wherein said capacitive probe comprises n individual probes, each said individual probe connectable to said guard signal trace of said flex circuit through said flex circuit guard connection and to a respective one of said n sensor signal traces on said flex circuit through a respective one of said n respective flex circuit signal connections.

8. A flex circuit in accordance with claim 7, further comprising:

a multiplexer which connects said amplifier input to only one of said n sensor signal traces.

9. A flex circuit for a capacitive probe assembly, said capacitive probe assembly comprising a capacitive probe and a guard, said flex circuit comprising:

a sensor connection end comprising;

a number n, n greater than or equal to 1, of sensor signal trace connections to a respective number n of sensor signal traces, said n sensor signal trace connections connectable to said capacitive probe of said capacitive probe assembly; and

a connection to a guard signal trace, said guard signal trace connection connectable to said guard of said capacitive probe assembly;

a number m, m greater than or equal to 1, of amplifier circuits, each coupled at a respective amplifier signal input to one of said n sensor signal traces, coupled at a respective output to a respective measurement signal trace, coupled at a respective amplifier power input to a power signal trace, and coupled at a respective amplifier ground input to a ground signal trace; and

a host connection end having connections to said power signal trace, said ground signal trace, and each of said respective measurement signal traces.

10. A flex circuit in accordance with claim 9, wherein:

said capacitive probe comprises a number n, n greater than or equal to 1, of individual probes, each connectable at said flex circuit guard connection to said guard signal trace of said flex circuit and at said respective n flex circuit signal connections to said respective n sensor signal traces of said flex circuit.