System for testing integrated circuit devices

• US 6,930,503 B2
• Filed: 04/30/2004
• Issued: 08/16/2005
• Est. Priority Date: 08/21/1997
• Status: Expired due to Term

• Current Assignee: MOSAID Technologies Inc. (f/k/a Conversant Intellectual Property Management)
• Original Assignee: Micron Technology, Inc.
• Inventors: Van Heel, Nicholas, Wong, Victor, Zheng, Hua, Siek, David D., Sher, Joseph C., Vo, Huy Thanh
• Primary Examiner(s): Hollington, Jermele
• Application Number:
  US10/835,945
• Publication Number:
  US 20040201399A1
• Time in Patent Office: 473 Days
• Field of Search: 324/763, 324/765, 324/158.1, 365/201, 365/207, 365/189.09
• US Class Current: 324/750.01
• CPC Class Codes: G01R 31/3004 Current or voltage test
• CPC Class Codes: G11C 2029/5004 Voltage
• CPC Class Codes: G11C 29/02 Detection or location of defective auxiliary circuits, e.g. defective refresh counters
• CPC Class Codes: G11C 29/021 in voltage or current generators
• CPC Class Codes: G11C 29/028 with adaption or trimming of parameters
• CPC Class Codes: G11C 29/12 Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
• CPC Class Codes: G11C 29/12005 comprising voltage or current generators
• CPC Class Codes: G11C 5/145 Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor G11C5/141 takes precedence
• CPC Class Codes: G11C 5/146 Substrate bias generators G11C5/141 takes precedence

Abstract

A voltage generating circuit for generating internal voltage for a packaged integrated circuit memory device, is controllable to provide incremental adjustments in the voltage for testing of the memory device. The voltage generating circuit permits internally generated voltages of the memory device, such as the substrate voltage Vbb, the DVC2 voltage, and the pumped voltage Vccp, to be controlled externally through the application of test signals via the conventional test function, in performing standard device tests such as the static refresh test, logic 1s and 0s margin testing, and the like for packaged memory devices. Also, programmable circuits including programmable logic devices, such as anti-fuses, are provided that are programmable to maintain the voltage at a magnitude to which it is adjusted.

Claims

1. A system for testing an integrated circuit device comprising:

a voltage generating circuit to produce a plurality of test voltages, each of the plurality of test voltages having a different magnitude; and

a test circuit to send a plurality of test signals to the voltage generating circuit and enable the voltage generating circuit to produce one of the plurality of test voltages, wherein the plurality of test voltages correspond to the plurality of test signals.

2. The system of claim 1, wherein the voltage generating circuit comprises:

a voltage producing circuit to produce a voltage; and

a regulating circuit coupled to the voltage producing circuit to maintain the voltage at a setpoint value.

3. The system of claim 2, further comprising:

a control circuit coupled to the voltage generating circuit, the control circuit adapted to be responsive to the at least one test signal to incrementally adjust the voltage to produce one of the plurality of test voltages based on the at least one test signal.

4. A system comprising:

an integrated circuit device;

a voltage producing circuit located within the integrated circuit device to produce a voltage; and

a control circuit coupled to the voltage producing circuit and located within the integrated circuit device to provide a selected one of a plurality of voltage increments with respect to the voltage according to an external signal allowing the control circuit to be controlled externally of the integrated circuit device.

5. The system of claim 4, further comprising a regulatory circuit to maintain the voltage at a setpoint value.

6. The system of claim 4, further comprising at least one programmable circuit coupled to the control circuit, the programmable circuit being programmable to provide an output signal to cause the control circuit to permanently maintain the voltage at a level to which the voltage is adjusted.

7. A system enclosed within a package comprising:

an integrated circuit;

a voltage generating circuit coupled to the integrated circuit comprising;

a voltage producing circuit to produce a voltage; and

a voltage regulating circuit coupled to the voltage producing circuit to maintain the voltage at a setpoint value;

a test mode enabling circuit coupled to the integrated circuit and adapted to cause the integrated circuit to enter a test mode in response to an external signal;

a test circuit coupled to the voltage generating circuit and adapted to generate test vector signals in response to coded signals generated external of the package, and wherein the test vector signals represent incremental adjustments in the voltage; and

a control circuit coupled to the voltage generating circuit and the test circuit to incrementally adjust the voltage to a desired one of a plurality of voltages in response to the test vector signals to provide a plurality of voltages of different magnitudes.

8. The system of claim 7, wherein the integrated circuit is a memory device.

9. The system of claim 8, wherein the voltage is a negative substrate bias voltage that is applied to the substrate of the memory device.

10. An integrated circuit comprising:

a memory device;

a voltage generating circuit coupled to the memory device to produce a voltage at a setpoint value;

a test mode enable circuit coupled to the voltage generating circuit to cause the integrated circuit device to operate in a test mode in response to coded signals generated externally of the package and applied to signal inputs of the integrated circuit device;

a test circuit to produce a plurality of test signals coupled to the voltage generating circuit, each of the test signals representing a different voltage magnitude; and

a control circuit coupled to the voltage generating circuit and responsive to the test signals to incrementally adjust the voltage relative to the setpoint value to provide a plurality of test voltages of different magnitudes for testing the memory device.

11. The integrated circuit of claim 10, wherein the control circuit includes a plurality of control devices to change the setpoint value to cause a corresponding change in the plurality of test voltages.

12. An integrated circuit comprising:

a memory device;

a voltage generating circuit coupled to the memory device comprising;

a voltage producing circuit to produce a bias voltage; and

a regulating circuit coupled to the voltage producing circuit to maintain the bias voltage at a setpoint value and to incrementally adjust a magnitude of the voltage relative to the setpoint value to provide a plurality of voltages of different magnitudes;

a test mode enable circuit coupled to the voltage generating circuit to cause the integrated circuit device to operate in a test mode in response to a test signal generated externally of the package and applied to a signal input of the integrated circuit;

a test circuit to produce a plurality of test signals coupled to the voltage generating circuit, wherein each of the test signals represents a different adjustment value and wherein each test signal is produced in response to an external coded signal; and

a control circuit coupled to the voltage generating circuit and adapted to respond to the test signals to control the regulating circuit as a function of the test signals to incrementally adjust a magnitude of the bias voltage produced by the voltage producing circuit to provide a plurality of voltages of different magnitudes.

13. The integrated circuit of claim 12, wherein the control circuit includes a plurality of control devices to change the setpoint value to cause a corresponding change in the plurality of test voltages.

14. An integrated circuit comprising:

a memory device;

a voltage generating circuit coupled to the memory device to produce a voltage at a setpoint value and to incrementally adjust a magnitude of the voltage relative to the setpoint value to provide a plurality of voltages of different magnitudes;

a test mode enable circuit coupled to the voltage generating circuit to cause the integrated circuit device to operate in a test mode in response to coded signals generated externally of the package and applied to signal inputs of the integrated circuit device;

a test circuit to produce a plurality of test signals coupled to the voltage generating circuit, each of the test signals representing a different value for the voltage to be produced by the voltage generating circuit; and

a control circuit coupled to the voltage generating circuit comprising;

a first circuit device adapted to respond to a first test signal of the plurality of test signals and cause the voltage generating circuit to adjust the magnitude of the voltage to a first adjusted value; and

a second circuit device adapted to respond to a second test signal of the plurality of test signals and cause the voltage generating circuit to adjust the magnitude of the voltage to a second adjusted value.

15. The integrated circuit of claim 14, wherein the voltage generating circuit includes a fixed reference circuit to establish the setpoint value, wherein the control circuit includes at least one circuit device adapted to respond to an externally generated signal applied to the integrated circuit device to override the fixed reference circuit and adjust the voltage relative to the setpoint value.

16. A system for testing an integrated circuit device comprising:

a voltage generating circuit to produce a plurality of test voltages, each of the plurality of test voltages having a different magnitude;

a test circuit to produce at least one test signal coupled to the voltage generating circuit wherein each of the at least one test signal represents a different voltage to be produced by the voltage generating circuit;

a control circuit coupled to the voltage generating circuit to incrementally adjust a voltage in response to the at least one test signal; and

a programmable circuit coupled to the control circuit to control the control circuit, and to provide an output signal, wherein the control circuit is adapted to cause the voltage generating circuit to adjust the voltage produced by the voltage generating circuit in response to the output signal.

17. The system of claim 16, wherein the programmable circuit is programmed externally of the system.

18. The system of claim 16, wherein the programmable circuit is programmed to cause the voltage to adjust to a digitline equilibrating voltage.

19. A system for testing an integrated circuit device comprising:

a voltage generating circuit to produce a voltage at a setpoint value and to selectively increment a voltage with a plurality of voltage increments with respect to the setpoint value to provide a plurality of test voltages, each of the plurality of test voltages having a different magnitude;

a test mode enable circuit coupled to the voltage generating circuit to cause the integrated circuit device to enter a test mode on receiving a test signal; and

a test control circuit coupled to the voltage generating circuit to cause the voltage generating circuit to selectively increment the voltage relative to the setpoint value to provide a desired test voltage selected from the plurality of test voltages.

20. The system of claim 19, wherein the setpoint value is a bias voltage.

21. The system of claim 19, wherein the setpoint value is a bias voltage and wherein the plurality of incremental adjustments are a plurality of discrete shifts in the level of the bias voltage.

22. A system for testing an integrated circuit device comprising:

a voltage generating circuit to produce a voltage at a setpoint value and to selectively increment a voltage with a plurality of voltage increments to provide the plurality of test voltages, each of the plurality of test voltages having a different magnitude;

a test control circuit coupled to the voltage generating circuit to cause the voltage generating circuit to selectively increment the voltage relative to the setpoint value to provide a desired test voltage selected form the plurality of test voltages; and

a programmable circuit coupled to the voltage generating circuit to modify the setpoint value corresponding to a modify signal.

23. The system of claim 22, wherein the voltage generating circuit, the test control circuit, the programmable circuit and the integrated circuit device are housed in a package and the modify signal is generated externally of the package.

24. The system of claim 22, further comprising:

a test mode enable circuit coupled to the voltage generating circuit to cause the integrated circuit device to enter a test mode on receiving a test signal.

25. A system for producing test voltages for use in testing an integrated circuit device comprising:

an integrated circuit device;

a voltage producing circuit located within the integrated circuit device to produce a voltage and a plurality of voltage increments with respect to the voltage; and

a control circuit coupled to the voltage producing circuit and located within the integrated circuit device to incrementally adjust the voltage with a selected one of the plurality of voltage increments according to an external signal allowing the control circuit to be controlled externally of the integrated circuit device.

26. The system of claim 25, further comprising a fixed reference circuit to establish the setpoint value, wherein the control circuit includes at least one circuit device adapted to respond to an externally generated signal applied to the integrated circuit device to override the fixed reference circuit and adjust the voltage relative to the setpoint value.

27. A system for producing test voltages enclosed within a package comprising:

an integrated circuit;

a voltage generating circuit coupled to the integrated circuit comprising;

a voltage producing circuit to produce a voltage; and

a voltage regulating circuit coupled to the voltage producing circuit to maintain the voltage at a setpoint value;

a test mode enabling circuit coupled to the integrated circuit and adapted to cause the integrated circuit to enter a test mode in response to an external signal;

a test circuit coupled to the voltage generating circuit to generate test vector signals in response to coded signals generated external of the package, and wherein the test vector signals represent incremental adjustments in the voltage; and

a control circuit coupled to the voltage generating circuit to incrementally adjust the voltage in response to the test vector signals for testing the integrated circuit to provide a plurality of voltages of different magnitudes.

28. The system of claim 27, wherein the integrated circuit is a memory device.

29. The system of claim 27, wherein the voltage is a negative substrate bias voltage that is applied to the substrate of the memory device.

30. A system for producing test voltages in an integrated circuit comprising:

a memory device;

a voltage generating circuit coupled to the memory device to produce a voltage at a setpoint value;

a test mode enable circuit coupled to the voltage generating circuit to cause the integrated circuit device to operate in a test mode in response to coded signals generated externally of the package and applied to signal inputs of the integrated circuit device;

a test circuit to produce a plurality of test signals coupled to the voltage generating circuit, each of the test signals representing a different value for the voltage to be produced by the voltage generating circuit; and

a control circuit coupled to the voltage generating circuit and adapted to respond to the test signals to incrementally adjust the voltage relative to the setpoint value for testing the memory device to provide a selected one of a plurality of voltages.

31. The system of claim 30, wherein the control circuit includes a plurality of control devices to control a fixed reference circuit to change the setpoint value to cause a corresponding change in the value for the voltage.

32. A system for producing test voltages for testing an integrated circuit device comprising:

a voltage generating circuit;

a test circuit to produce at least one test signal coupled to the voltage generating circuit wherein each of the at least one test signal represents a different voltage to be produced by the voltage generating circuit;

a control circuit coupled to the voltage generating circuit to incrementally adjust a voltage in response to the at least one test signal to a selected one of a plurality of voltage increments; and

a programmable circuit coupled to the control circuit to control the control circuit, wherein the programmable circuit is adapted to provide an output signal and the control circuit is adapted to cause the voltage generating circuit to adjust the voltage produced by the voltage generating circuit in response to the output signal.

33. The system of claim 32, wherein the programmable circuit is programmed externally of the system.

34. The system of claim 32, wherein the programmable circuit is programmed to cause the voltage to adjust to a digitline equilibrating voltage.

35. A system for producing test voltages for testing an integrated circuit device comprising:

a voltage generating circuit to produce a voltage at a setpoint value;

a test mode enable circuit coupled to the voltage generating circuit to cause the integrated circuit device to enter a test mode on receiving a test signal; and

a test control circuit coupled to the voltage generating circuit to cause the voltage generating circuit to perform a plurality of incremental adjustments to the voltage relative to the setpoint value.

36. The system of claim 35, wherein the setpoint value is a bias voltage.

37. The system of claim 35, wherein the setpoint value is a bias voltage and wherein the plurality of incremental adjustments are a plurality of discrete shifts in the level of the bias voltage.

38. A system for producing test voltages for testing an integrated circuit device comprising:

a voltage generating circuit to produce a voltage at a setpoint value;

a test control circuit coupled to the voltage generating circuit to cause the voltage generating circuit to perform a plurality of incremental adjustments to the voltage relative to the setpoint value; and

a programmable circuit coupled to the voltage generating circuit to modify the setpoint value corresponding to a modify signal.

39. The system of claim 38, wherein the voltage generating circuit, the test control circuit, the programmable circuit and the integrated circuit device are housed in a package and the modify signal is generated externally of the package.

40. The system of claim 39, further comprising:

a test mode enable circuit coupled to the voltage generating circuit to cause the integrated circuit device to enter a test mode on receiving a test signal.