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Method and apparatus for measuring on-chip power supply integrity

  • US 6,933,729 B2
  • Filed: 03/15/2001
  • Issued: 08/23/2005
  • Est. Priority Date: 03/14/2001
  • Status: Expired due to Fees
First Claim
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1. A method for measuring a parameter of a circuit under test, the method comprising:

  • (a) charging a first portion of a test circuit up to a first voltage level;

    (b) charging a second portion of said test circuit up to a second voltage level;

    (c) disconnecting said test circuit from respective voltage terminals providing said first and second voltage levels; and

    (d) measuring said parameter of said circuit under test with said test circuit.

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