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Integrated circuit that can be externally tested through a normal signal output pin

  • US 6,937,051 B2
  • Filed: 07/08/2004
  • Issued: 08/30/2005
  • Est. Priority Date: 12/22/2000
  • Status: Expired due to Term
First Claim
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1. A circuit arrangement that can be externally tested through an output pin, comprising an integrated circuit that comprises:

  • a signal output pin;

    a circuit unit having a test signal output;

    a control unit having a testing input connected to said signal output pin for testing a potential at said signal output pin, and having a control output providing a control signal responsive to the testing of the potential; and

    a switching element having a signal input connected to said test signal output of said circuit unit, a switched signal output connected to said signal output pin, and a control input connected to said control output of said control unit.

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