Millimeter wave imaging system

• US 6,937,182 B2
• Filed: 08/12/2003
• Issued: 08/30/2005
• Est. Priority Date: 09/28/2001
• Status: Expired due to Fees

• Current Assignee: Trex Enterprises Corporation
• Original Assignee: Trex Enterprises Corporation
• Inventors: Lovberg, John A., Kolinko, Vladimir
• Primary Examiner(s): Lobo, Ian J.
• Application Number:
  US10/639,322
• Publication Number:
  US 20040056790A1
• Time in Patent Office: 749 Days
• Field of Search: 342/22, 342/27, 342/52, 342/179
• US Class Current: 342/22
• CPC Class Codes: G01S 13/44 Monopulse radar, i.e. simultaneous lobing
• CPC Class Codes: G01S 13/887 for detection of concealed objects, e.g. contraband or weapons
• CPC Class Codes: G01V 8/005 operating with millimetre waves, e.g. measuring the black losey radiation
• CPC Class Codes: H01Q 1/125 Means for positioning
• CPC Class Codes: H01Q 19/10 using reflecting surfaces
• CPC Class Codes: H01Q 3/22 varying the orientation in accordance with variation of frequency of radiated wave
• CPC Class Codes: H01Q 3/2682 Time delay steered arrays
• CPC Class Codes: H04B 1/3805 with built-in auxiliary receivers
• CPC Class Codes: H04B 10/1123 Bidirectional transmission
• CPC Class Codes: H04B 10/1149 Arrangements for indoor wireless networking of information
• CPC Class Codes: H04B 7/0408 using two or more beams, i.e. beam diversity

Abstract

A millimeter wave imaging system that includes at least one millimeter wave frequency scanning antenna for collecting frequency dependent beams of millimeter wave radiation from a narrow one-dimensional field of view. The collected radiation is amplified at the collected frequencies and the amplified signals are separated into frequency dependent bins with a tapped-delay beam-former. These bins are then sampled to produce a one-dimensional image of the antenna field of view. A two dimensional image of a target may be obtained by moving the target across the field of view of the scanning antenna. In a preferred embodiment the antenna is only 4.5 inches in length and constructed from WR-10 waveguide with inclined slots cut in one of the narrow walls at 79 mil spacings. This geometry creates a frequency-scanned antenna spanning a 20 degree vertical field of view over a 75.5-93.5 GHz operational band of the sensor, starting at approximately 1 degree below horizontal at 93.5 GHz and ranging to approximately 21 degrees below horizontal at 75.5 GHz. In this embodiment 64 of these antenna elements are arranged in four stacks of 16 antennas focused at about 18 inches to construct a portal contraband screener.

Claims

1. A millimeter wave imaging system comprising:

A) at least one millimeter wave frequency scanning antenna for collecting frequency dependent beams of millimeter wave radiation from a narrow one-dimensional field of view;

B) a millimeter wave amplifier for amplifying at the collected frequencies said millimeter wave radiation;

C) a beamformer for separating said amplified collected radiation to produce frequency dependent signals corresponding to said frequency dependent beams, said beamformer comprising;

1) a plurality of delay lines,

2) a millimeter wave lens, and

3) a plurality of millimeter wave power detectors; and

D) a sampling circuit for reading out frequency dependent signals to produce a one-dimensional image of the antenna field of view.

2. The imaging system as in claim 1 and also comprising a focusing means for focusing said frequency-scanning antenna.

3. The imaging system as in claim 2 wherein said focusing means comprises a cylindrical reflector and a cylindrical lens.

4. The imaging system as in claim 1 wherein said millimeter wave amplifier comprises three MMIC amplifiers fabricated on an indium phosphate substrate and a band pass filter.

5. The imaging system as in claim 4 wherein said amplifier comprises a co-planar waveguide design.

6. The imaging system as in claim 4 wherein said amplifier provides gains of at least 50 dB.

7. The imaging system as in claim 1 wherein said delay lines are comprised of etched copper to create circuit patterns of varying lengths.

8. The imaging system as in claim 7 wherein said delay lines define copper surfaces having surface roughness less than 300 nanometers.

9. A portal contraband screener comprising a plurality of millimeter wave sensors, each of said plurality of millimeter wave sensors comprising:

A) at least one millimeter wave frequency scanning antenna for collecting frequency dependent beams of millimeter wave radiation from a narrow one-dimensional field of view;

B) a millimeter wave amplifier for amplifying at the collected frequencies said millimeter wave radiation;

C) a beamformer for separating said amplified collected radiation to produce frequency dependent signals corresponding to said frequency dependent beams, said beamformer comprising;

1) a plurality of delay lines,

2) a millimeter wave lens, and

3) a plurality of millimeter wave power detectors; and

D) a sampling circuit for reading out frequency dependent signals to produce a one-dimensional image of the antenna field of view.

10. The screener as in claim 9 wherein each of said plurality of millimeter wave sensors also comprises a focusing means for focusing said frequency-scanning antenna.

11. The screener as in claim 10 wherein said focusing means comprises a cylindrical reflector and a cylindrical lens.

12. The screener as in claim 11 wherein each of said millimeter wave amplifiers comprises three MMIC amplifiers fabricated on an indium phosphate substrate and a band pass filter.

13. The screener as in claim 12 wherein said amplifier comprises a co-planar waveguide design.

14. The screener as in claim 12 wherein said amplifier provides gains of at least 50 dB.

15. The screener as in claim 9 wherein each of said delay lines are comprised of etched copper to create circuit patterns of varying lengths.

16. The screener as in claim 15 wherein said delay lines define copper surfaces having surface roughness less than 300 nanometers.

17. A portal contraband screener comprising a plurality of millimeter wave sensors, each of said plurality of millimeter wave sensors comprising:

A) at least one millimeter wave frequency scanning antenna for collecting frequency dependent beams of millimeter wave radiation from a narrow one-dimensional field of view;

B) a fast switch for calibration;

C) a millimeter wave amplifier for amplifying at the collected frequencies said millimeter wave radiation, said amplifier comprising at least three MMIC amplifiers fabricated on an indium phosphate substrate and a band pass filter;

D) a beamformer for separating said amplified collected radiation to produce frequency dependent signals corresponding to said frequency dependent beams, said beamformer comprising;

1) a plurality of delay lines,

2) a millimeter wave lens, and

3) a plurality of millimeter wave power detectors; and

E) a sampling circuit for reading out frequency dependent signals to produce a one-dimensional image of the antenna field of view,

F) focusing means for focusing the sensor.

18. The screener as in claim 17 wherein said focusing means comprises a cylindrical reflector and a cylindrical lens.

19. The screener as in claim 17 wherein said amplifier comprises a co-planar waveguide design.

20. The screener as in claim 17 wherein said amplifier provides gains of at least 50 dB.

21. The screener as in claim 17 wherein each of said delay lines are comprised of etched copper to create circuit patterns of varying lengths.

22. The screener as in claim 21 wherein said delay lines define copper surfaces having surface roughness less than 300 nanometers.

23. The screener as in claim 17 wherein said plurality of sensors is arranged in four stacks each stack comprising at least 16 sensors.