Apparatus and methods for optically monitoring thickness

• US 6,937,350 B2
• Filed: 06/26/2002
• Issued: 08/30/2005
• Est. Priority Date: 06/29/2001
• Status: Expired due to Fees

• Current Assignee: Massachusetts Institute of Technology
• Original Assignee: Massachusetts Institute of Technology
• Inventors: Shirley, Lyle
• Primary Examiner(s): Smith, Zandra V.
• Application Number:
  US10/180,679
• Publication Number:
  US 20030011789A1
• Time in Patent Office: 1,161 Days
• Field of Search: 356/601, 356/630, 356/485, 356/496, 356/502, 356/511
• US Class Current: 356/630
• CPC Class Codes: G01B 11/06 for measuring thickness ; e.g. of sheet material thickness measurement by thermal means G01B21/085
• CPC Class Codes: G01B 11/0691 of objects while moving G01B11/0616 takes precedence
• CPC Class Codes: G01B 11/306 for measuring evenness

Abstract

In one aspect, the invention relates to an apparatus for monitoring thickness variations of an object having first and second opposing surfaces. The apparatus includes a first source positioned to project a first fringe pattern at a first location on the first surface and a second source positioned to project a second fringe pattern at a first location on the second surface. The apparatus further includes a first detector positioned to detect the first fringe pattern at the first location on the first surface, the first detector generating a first signal in response to the first fringe pattern at the first location. The apparatus also includes a second detector positioned to detect the second fringe pattern at the first location on the second surface, the second detector generating a second signal in response to the second fringe pattern at the first location. The apparatus further includes a processor adapted to calculate variations in the thickness of the object in response to the first and the second signals.

Claims

1. An apparatus for monitoring thickness variations of an object having first and second opposing surfaces, the apparatus comprising:

a first source positioned to project a first fringe pattern at a first location on the first surface;

a second source positioned to project a second fringe pattern at a first location on the second surface;

a first detector positioned to detect the first fringe pattern at the first location on the first surface, the first detector generating a first signal in response to the first fringe pattern at the first location;

a second detector positioned to detect the second fringe pattern at the first location on the second surface, the second detector generating a second signal in response to the second fringe pattern at the first location;

a processor adapted to calculate variations in the thickness of the object in response to the first and the second signals; and

a control system locating the first and second fringe patterns to second locations on the first and second surfaces, respectively, the first and second detectors generating third and fourth signals, respectively in response to the first and second fringe patterns at the second locations, the processor adapted to calculate variations in the thickness of the object in response to the first, second, third and fourth signals.

2. The apparatus of claim 1 wherein the first and second sources are generated from a single source.

3. The apparatus of claim 1 wherein the first source comprises two subsources, wherein the subsources are coherent with respect to one another.

4. The apparatus of claim 1 wherein the first source is a broadband source.

5. The apparatus of claim 1 wherein the second source is a broadband source.

6. The apparatus of claim 1 wherein the first and second sources are coherent with respect to one another.

7. The apparatus of claim 1 wherein the processor calculates the variations in the thickness by detecting the displacement of a fringe in the first fringe pattern and the second fringe pattern.

8. The apparatus of claim 1 wherein the object is substantially stationary and wherein the control system moves the first detector and the second detector relative to the object.

9. The apparatus of claim 1 wherein a single detector replaces the first and second detectors.

10. A method for monitoring thickness variations of an object having first and second opposing surfaces, the method comprising the steps of:

illuminating the first surface with radiation from a first source to produce a first fringe pattern at a first location on the first surface;

illuminating the second surface with radiation from a second source to produce a second fringe pattern at a first location on the second surface;

detecting the first and second fringe patterns at the first locations on the first and second surfaces, respectively;

moving the first and second fringe patterns to second locations on the first and second surfaces, respectively;

detecting the first and second fringe patterns at the second locations on the first and second surfaces, respectively; and

calculating variations in the thickness of the object in response to a comparison between the first and second fringe patterns at the first locations, and the first and second fringe patterns at the second locations.

11. The method of claim 10 wherein the calculation of the variations in the thickness comprises counting a fringe from the first fringe pattern and the second fringe pattern at the first and the second locations.

12. The method of claim 10 wherein the step of moving the first and second fringe patterns comprises holding the object substantially stationary and moving the first detector and the second detector relative to the object.

13. The method of claim 10 wherein the step of calculating the variations in the thickness comprises subtracting the first and second fringe patterns at the first locations from the first and second fringe patterns at the second locations.

14. The method of claim 10, the method comprising the additional step of:

counting a fringe from the first fringe pattern and the second fringe pattern at the first and the second locations.

15. The method of claim 10 wherein the step of moving the first and second fringe patterns comprises holding the object substantially stationary and moving the first detector, the second detector, the first source, and the second source together relative to the object.

16. The method of claim 10 wherein the step of moving said first and second fringe patterns comprises moving the object relative to the first detector, the second detector, the first source, and the second source.

17. An apparatus for monitoring the flatness of an object having a surface, the apparatus comprising:

a source positioned to project a fringe pattern at a first location on the surface;

a detector positioned to detect the fringe pattern at the first location on the surface;

wherein the detector generates a first signal in response to the fringe pattern at the first location;

a processor adapted to monitor variations in the flatness of the object in response to the first signal; and

a control system for locating the fringe pattern at a second location on the surface, wherein the detector generates a second signal in response to the fringe pattern at the second location and the processor is adapted to monitor variations in the flatness of the object in response to the first and second signals.

18. A method for monitoring variations in the flatness of an object having a surface, the method including the steps of:

illuminating the surface with radiation from a source to produce a fringe pattern at a first location on the surface of the object;

detecting the fringe pattern at the first location on the surface of the object;

monitoring the variations in the flatness of the object in response to the detected fringe pattern at the first location on the surface;

moving the fringe pattern to a second location on the surface,

detecting the fringe pattern at the second location on the surface, and

monitoring the variations in the flatness of the object in response to a comparison between the fringe pattern at the first location, and the fringe pattern at the second location.

19. The method of claim 18 comprising the additional steps of illuminating a surface of a known flat standard with radiation from the source to produce a fringe pattern at a first location on the surface of the known flat standard, detecting the fringe pattern at the first location on the surface of the known flat standard, and comparing the variations in the flatness of the known flat standard with the variations in the flatness of the object to generate compensated variations in the flatness of the object.

20. The method of claim 18 wherein the step of moving the fringe pattern includes holding the object substantially stationary and moving the detector relative to the object.

21. The method of claim 18 wherein the step of moving said first and second fringe patterns comprises holding the object substantially stationary and moving the first detector, the second detector, the first source, and the second source together relative to the object.

22. The method of claim 18 wherein the step of moving said first and second fringe patterns comprises moving the object relative to the first detector, the second detector, the first source, and the second source.