Method for identifying semiconductor integrated circuit device, method for manufacturing semiconductor integrated circuit device, semiconductor integrated circuit device and semiconductor chip
First Claim
1. A semiconductor integrated circuit device having a plurality of identification elements formed to have the same form through the same manufacturing process as one another, and configured to have unique identification information determined by said plurality of identification elements,wherein said unique identification information takes a state corresponding to a relation of respective magnitudes of a parameter of said plurality of identification elements to one another, caused by variations in characteristics of said plurality of identification elements, and wherein said unique identification information includes a plurality of comparison information representing results of comparing the parameter of each identification element with the parameter of the other identification elements.
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Accused Products
Abstract
In the manufacturing process of a semiconductor integrated circuit device, a plurality of identification elements having the same arrangement are formed and the relation of magnitude in a physical amount corresponding to variations in the process of the plurality of identification elements is employed as identification information unique to the semiconductor integrated circuit device.
64 Citations
21 Claims
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1. A semiconductor integrated circuit device having a plurality of identification elements formed to have the same form through the same manufacturing process as one another, and configured to have unique identification information determined by said plurality of identification elements,
wherein said unique identification information takes a state corresponding to a relation of respective magnitudes of a parameter of said plurality of identification elements to one another, caused by variations in characteristics of said plurality of identification elements, and wherein said unique identification information includes a plurality of comparison information representing results of comparing the parameter of each identification element with the parameter of the other identification elements.
Specification