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Method for identifying semiconductor integrated circuit device, method for manufacturing semiconductor integrated circuit device, semiconductor integrated circuit device and semiconductor chip

  • US 6,941,536 B2
  • Filed: 09/06/2001
  • Issued: 09/06/2005
  • Est. Priority Date: 12/01/2000
  • Status: Expired due to Fees
First Claim
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1. A semiconductor integrated circuit device having a plurality of identification elements formed to have the same form through the same manufacturing process as one another, and configured to have unique identification information determined by said plurality of identification elements,wherein said unique identification information takes a state corresponding to a relation of respective magnitudes of a parameter of said plurality of identification elements to one another, caused by variations in characteristics of said plurality of identification elements, and wherein said unique identification information includes a plurality of comparison information representing results of comparing the parameter of each identification element with the parameter of the other identification elements.

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