Method and device for positioning a slice level of an x-ray exposure

• US 6,942,385 B2
• Filed: 07/29/2003
• Issued: 09/13/2005
• Est. Priority Date: 07/29/2002
• Status: Expired due to Fees

• Current Assignee: Siemens AG
• Original Assignee: Siemens AG
• Inventors: Fadler, Franz, Leidenberger, Stefan
• Primary Examiner(s): Glick, Edward J.
• Assistant Examiner(s): KAO, CHIH CHENG G
• Application Number:
  US10/631,040
• Publication Number:
  US 20040081281A1
• Time in Patent Office: 777 Days
• Field of Search: 378/21, 378/25, 378/26, 378/62, 378/63, 378/205, 378/206, 600/425, 600/429
• US Class Current: 378/205
• CPC Class Codes: A61B 6/08 Auxiliary means for directing the radiation beam to a particular spot, e.g. using light beams
• CPC Class Codes: A61B 6/4429 related to the mounting of source units and detector units
• CPC Class Codes: A61B 6/548 Remote control of the apparatus or devices
• CPC Class Codes: G01N 23/04 and forming images of the material

Abstract

In a method and device for positioning the level of a slice during the generation of a slice exposure of an examination subject with an x-ray examination device, a reference image of the exterior of the examination subject is recorded by a camera on a line of sight proceeding transverse to the direction of examination. The slice level of a subsequent slice exposure is determined using a slice level marking within the reference image.

Claims

1. A method for positioning a level of a slice of an X-ray exposure to be generated by irradiating a subject in an examination direction, said method comprising the steps of:

obtaining a reference image of an exterior of a subject with a camera along a line of sight transverse to said examination direction;

indicating a selected slice level with a marking in said reference image; and

using said marking in said reference image for automatically electronically setting operating parameters of an X-ray examination device when irradiating the subject with X-rays with said X-ray examination device to generate an unblurred image of substantially only said slice level of said subject.

2. A method as claimed in claim 1 wherein said marking has marking position data within said reference image associated therewith and wherein said camera has camera position data with reference to said X-ray examination device associated therewith, and using said marking position data and said camera position data to set said slice level.

3. A method as claimed in claim 2 comprising subjecting said reference image to image processing to detect fixed points therein having position data associated therewith that are known with reference to the X-ray examination device, and setting said slice level using said marking position data relative to said fixed points in said reference image and using the position data of the fixed points with reference to the X-ray examination device.

4. A method as claimed in claim 3 comprising fixing said marking within said reference image and moving said camera to vary said reference image.

5. A method as claimed in claim 4 comprising moving said camera parallel to said examination direction to vary said reference image.

6. A method as claimed in claim 1 comprising manually designating the slice level marking in said reference image.

7. A method as claimed in claim 1 comprising the steps of:

storing imaging parameters in a memory for a plurality of different types of images obtainable using said X-ray examination device;

subjecting said reference image to image processing to determine a subject parameter of said subject;

setting a slice level for one of the types of images, selected by an operator of the X-ray examination device, using said subject parameter and the imaging parameters stored in the memory for the selected type of image;

visually displaying said reference image with said marking therein corresponding to the slice level that has been set; and

allowing an operator of the X-ray examination device to approve the slice level designated by the marking in the displayed reference image and to fix the slice level for irradiating the subject with X-rays with said X-ray examination device to obtain the selected type of image.

8. A slice level positioning device for positioning a level of a slice of an X-ray exposure to be generated by irradiating a subject in an examination direction, comprising:

a camera for obtaining a reference image of an exterior of a subject along a line of sight transverse to said examination direction;

an indication unit indicating a selected slice level with a marking in said reference image; and

a processor using said marking in said reference image for setting operating parameters of an X-ray examination device when irradiating the subject with X-rays with said X-ray examination device to generate an unblurred image of substantially only said slice level of said subject.

9. A slice level positioning device as claimed in claim 8 wherein said marking has marking position data within said reference image associated therewith and wherein said camera has camera position data with reference to said X-ray examination device associated therewith, and wherein said processor sets said slice level using said marking position data and said camera position data.

10. A slice level positioning device as claimed in claim 9 comprising an image processor for subjecting said reference image to image processing to detect fixed points therein having position data associated therewith that are known with reference to the X-ray examination device, and wherein said processor sets said slice level using said marking position data relative to said fixed points in said reference image and using the position data of the fixed points with reference to the X-ray examination device.

11. A slice level positioning device as claimed in claim 10 wherein said indication unit fixes said marking within said reference image, and comprising a camera height positioner for moving said camera to vary said reference image.

12. A slice level positioning device as claimed in claim 11 wherein said camera height positioner moves said camera parallel to said examination direction to vary said reference image.

13. A slice level positioning device as claimed in claim 11 wherein said camera height positioner is remotely controllable.

14. A slice level positioning device as claimed in claim 8 comprising an input unit allowing manual designation of the slice level marking in said reference image.

15. A slice level positioning device as claimed in claim 8 comprising:

a memory for storing imaging parameters for a plurality of different types of images obtainable using said X-ray examination device;

an image processor for subjecting said reference image to image processing to determine a subject parameter of the examination subject;

said processor for setting a slice level setting operating parameters for a selected one of the types of images using said subject parameter and the imaging parameters stored in the memory for the selected type of image;

a display for visually displaying said reference image with said marking therein corresponding to the slice level that has been set; and

an input unit allowing an operator of the X-ray examination device to approve the slice level designated by the marking in the displayed reference image and to fix the slice level for irradiating the subject with X-rays with said X-ray examination device to obtain the selected type of image.

16. An X-ray examination device allowing positioning of a level of a slice of an X-ray exposure comprising:

an X-ray arrangement for irradiating a subject in an examination direction to produce an X-ray exposure;

a camera for obtaining a reference image of an exterior of the subject along a line of sight transverse to said examination direction;

an indication unit for indicating a selected slice level with a marking in said reference image; and

a processor using said marking in said reference image for setting operating parameters of said X-ray arrangement when irradiating the subject with X-rays with the X-ray arrangement to generate an unblurred image of substantially only said slice level of said subject.