High-speed duty cycle test through DC measurement using a combination of relays
First Claim
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1. A method comprising:
- generating one or more duty cycle control signals by varying one or more voltage values and states of one or more relays receiving the values in order to simulate a potentiometer;
providing the duty cycle control signals to a device under test;
separating a first DC portion of a first output signal and a radio frequency (RF) of the first output signal by using a bias-T circuit;
measuring the first DC portion of the first output signal of the device under test;
measuring a second DC portion of a second output signal of the device under test; and
dividing the first DC portion by a sum of the first DC portion and the second DC portion of a second output signal of the device under test.
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Abstract
According to one embodiment of the present invention, a method of high-speed duty cycle test through DC measurement using a combination of relays. The method includes: providing a plurality of relays to generate one or more duty cycle control signals; providing the duty cycle control signals to a device under test; measuring a first DC portion of a first output signal of the device under test; and dividing the first DC portion by a sum of the first DC portion and a second DC portion of a second output signal of the device under test.
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Citations
30 Claims
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1. A method comprising:
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generating one or more duty cycle control signals by varying one or more voltage values and states of one or more relays receiving the values in order to simulate a potentiometer;
providing the duty cycle control signals to a device under test;
separating a first DC portion of a first output signal and a radio frequency (RF) of the first output signal by using a bias-T circuit;
measuring the first DC portion of the first output signal of the device under test;
measuring a second DC portion of a second output signal of the device under test; and
dividing the first DC portion by a sum of the first DC portion and the second DC portion of a second output signal of the device under test. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. An apparatus comprising:
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a plurality of relays to generate one or more duty cycle control signals by varying one or more voltage values and states of one or more relays receiving the values in order to simulate a potentiometer;
a device under test coupled to the plurality of relays to receive the duty cycle control signals;
a bias-T circuit coupled to the device under test to receive a first output signal and a second output signal of the device under test, the bias-T circuit extracting a first DC portion of the first output signal and a second DC portion of the second output signal and bias-T circuit separating the first DC portion of the first output signal and a radio frequency (RF) of the first output signal; and
a divider to divide a value of the first DC portion by a sum of the first DC portion and the second DC portion. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23)
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24. A computer system comprising:
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a central processing unit (CPU);
a display device coupled to the CPU to display an image;
a device under test;
a plurality of relays coupled to the device under test to generate one or more duty cycle control signals, provided to the device under test, by varying one or more voltage values and states of one or more relays receiving the values in order to simulate a potentiometer; and
a bias-T circuit coupled to the device under test to receive a first output signal and a second output signal of the device under test, the bias-T circuit extracting a first DC portion of the first output signal and a second DC portion of the second output signal and bias-T circuit separating the first DC portion of the first output signal and a radio frequency (RF) of the first output signal. - View Dependent Claims (25, 26, 27, 28, 29, 30)
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Specification