Apparatus and method for detecting photon emissions from transistors
First Claim
Patent Images
1. A method for reducing diagnostic time of a photon detecting integrated circuit tester, the method comprising:
- processing a CAD database associated with an integrated circuit; and
identifying at least one CAD layer from the CAD database, the at least one CAD layer including at least one photon emission source of the integrated circuit;
processing the at least one CAD layer to determine an expected location of a photon emission source.
3 Assignments
0 Petitions
Accused Products
Abstract
A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves processing of integrated circuit computer aided design data to identify transistors within the CAD data. The analysis may further involve the use of Boolean operators to process the CAD data to particularly identify, such as through a channel, the location of the NMOS and PMOS gates, the location of the drain and source, or some combination of the location of the gate and drain or source to particularly identify the pinch-off region.
-
Citations
25 Claims
-
1. A method for reducing diagnostic time of a photon detecting integrated circuit tester, the method comprising:
-
processing a CAD database associated with an integrated circuit; and
identifying at least one CAD layer from the CAD database, the at least one CAD layer including at least one photon emission source of the integrated circuit;
processing the at least one CAD layer to determine an expected location of a photon emission source. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25)
-
Specification