Device for measurement and analysis of electrical signals of an integrated circuit component
First Claim
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1. An integrated circuit component, comprising:
- a plurality of circuit points not being directly externally accessible, providing a reference signal provided by the integrated circuit component for test purposes, and various electrical signals of the integrated circuit component to be monitored for test purposes;
at least one connecting contact point being externally accessible; and
a multiplexer having an output connected to said at least one connecting contact point and having a plurality of inputs, each one of said plurality of inputs being connected to a respective one of said plurality of circuit points, permitting external access to the reference signal and to the various electrical signals.
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Abstract
According to the invention, one or more external test connection contact points (pads; pins; balls), are provided in an integrated circuit component (chip) (1), through which signals (4, 5, 6) that are to be measured or analyzed are selectively fed, e.g. by means of a multiplex circuit (7, 8), and wherein the signals may be connected by means of routes located internally in the component from switch points that are not directly accessible, e.g. points inside the chip (15 to 20) or covered contact points. The device according to the invention is particularly useful for highly integrated semiconductor chips.
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Citations
13 Claims
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1. An integrated circuit component, comprising:
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a plurality of circuit points not being directly externally accessible, providing a reference signal provided by the integrated circuit component for test purposes, and various electrical signals of the integrated circuit component to be monitored for test purposes;
at least one connecting contact point being externally accessible; and
a multiplexer having an output connected to said at least one connecting contact point and having a plurality of inputs, each one of said plurality of inputs being connected to a respective one of said plurality of circuit points, permitting external access to the reference signal and to the various electrical signals. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. An integrated circuit component, comprising:
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a first plurality of circuit points of the integrated circuit component not being directly externally accessible, providing a reference signal provided by the integrated circuit component for test purposes;
a second plurality of circuit points of the integrated circuit not being directly externally accessible, providing electrical signals of the integrated circuit component to be monitored for test purposes;
a first connecting contact point being externally accessible;
a second connecting contact point being externally accessible;
a first multiplexer having an output connected to said first connecting contact point and having a plurality of inputs, each one of said plurality of inputs being connected to a respective one of said first plurality of circuit points, permitting external access to the reference signal;
a second multiplexer having an output connected to said second connecting contact point and having a plurality of inputs, each one of said plurality of inputs being connected to a respective one of said second plurality of circuit points, permitting external access to the various electrical signals.
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Specification