Brush scrubbing-high frequency resonating wafer processing system and methods for making and implementing the same
First Claim
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1. A substrate cleaning apparatus, comprising:
- a transducer capable of resonating at a high frequency; and
a brush material attached to a surface of the transducer, the brush material including at least one passage extending to the surface of the transducer, the brush material being configured to be applied to a surface of the substrate, the transducer when resonating at the high frequency being capable of imparting acoustic energy to the surface of the substrate at a location of the at least one passage.
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Abstract
A substrate cleaning apparatus is provided. The apparatus includes a transducer capable of resonating at a high frequency and a brush material attached to a surface of the transducer. The brush material includes at least one passage extending to the surface of the transducer and is configured to be applied to a surface of a substrate. When the transducer resonates at the high frequency, the transducer is capable of imparting acoustic energy to the surface of the substrate at a location of the at least one passage.
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Citations
20 Claims
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1. A substrate cleaning apparatus, comprising:
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a transducer capable of resonating at a high frequency; and a brush material attached to a surface of the transducer, the brush material including at least one passage extending to the surface of the transducer, the brush material being configured to be applied to a surface of the substrate, the transducer when resonating at the high frequency being capable of imparting acoustic energy to the surface of the substrate at a location of the at least one passage. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A substrate cleaning apparatus, comprising:
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a plurality of transducers capable of resonating at a high frequency; and a brush material attached to surfaces of the transducers, the brush material including at least one passage extending to the surface of each transducer of the plurality of transducers, the brush material being configured to be applied to a surface of the substrate, wherein each transducer of the plurality of transducers is configured to resonate at the high frequency so as to impart acoustic energy onto the surface of the substrate at a respective location of each at least one passage extending to the surface of each transducer. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15, 16)
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17. A substrate cleaning apparatus, comprising:
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a plurality of transducers capable of resonating at a high frequency, each transducer including a crystal and a resonator, the resonator having a frontside and a backside, the crystal being defined on the backside of the resonator; and a brush material attached to the frontside of each resonator, the brush material being a porous material, the brush material including at least one passage extending to the frontside of each resonator of the plurality of resonators, the brush material configured to be applied onto a surface of the substrate, wherein each transducer of the plurality of transducers is configured to resonate at the high frequency so as to impart acoustic energy onto the surface of the substrate at a respective location of each at least one passage extending to the frontside of the resonator of each transducer. - View Dependent Claims (18)
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19. A substrate cleaning apparatus, comprising:
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a transducer capable of resonating at a high frequency, the transducer including a crystal and a resonator, the resonator having a frontside and a backside, the crystal being defined on the backside of the resonator; and a brush material attached to the frontside of the resonator, the brush material being a porous material, the brush material including at least one passage extending to the frontside of the resonator, the brush material being configured to be applied onto a surface of the substrate, the transducer when resonating at the high frequency being capable of imparting acoustic energy onto the surface of the substrate at a location of the at least one passage. - View Dependent Claims (20)
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Specification