Vertical MEMS gyroscope by horizontal driving

• US 6,952,965 B2
• Filed: 12/24/2003
• Issued: 10/11/2005
• Est. Priority Date: 12/24/2002
• Status: Expired due to Term

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Samsung Electronics Co. Ltd.
• Inventors: Lee, Moon-chul, Hong, Seog-soo, Kang, Seok-jin, Jung, Kyu-dong, Chung, Seok-whan
• Primary Examiner(s): Kwok, Helen C.
• Application Number:
  US10/744,099
• Publication Number:
  US 20040226369A1
• Time in Patent Office: 657 Days
• Field of Search: 735/041.2, 735/041.4, 735/040.2, 735/040.4, 735/143.2, 735/142.9, 735/141.6
• US Class Current: 73/504.12
• CPC Class Codes: B81B 2201/0242 Gyroscopes
• CPC Class Codes: B81B 2203/051 Translation according to an axis parallel to the substrate
• CPC Class Codes: B81B 2203/053 Translation according to an axis perpendicular to the substrate
• CPC Class Codes: B81B 3/0059 Constitution or structural means for controlling the movement not provided for in groups B81B3/0037 - B81B3/0056
• CPC Class Codes: G01C 19/5762 the sensing mass being connected to a driving mass, e.g. driving frames

Abstract

A vertical MEMS gyroscope by horizontal driving includes a substrate, a support layer fixed on an upper surface of an area of the substrate, a driving structure floating above the substrate and having a portion fixed to an upper surface of the support layer and another portion in parallel with the fixed portion, the driving structure having a predetermined area capable of vibrating in a predetermined direction parallel to the substrate, a detecting structure fixed to the driving structure on a same plane as the driving structure, and having a predetermined area capable of vibrating in a vertical direction with respect to the substrate, a cap wafer bonded with the substrate positioned above the driving structure and the detecting structure, and a fixed vertical displacement detection electrode formed at a predetermined location of an underside of the cap wafer, for detecting displacement of the detecting structure in the vertical direction.

Claims

1. A vertical MEMS gyroscope by horizontal driving, comprising:

a substrate;

a support layer fixed on an upper surface of a particular area of the substrate;

a driving structure floating above the substrate and having a portion thereof fixed to an upper surface of the support layer and another portion in parallel with the fixed portion, the driving structure having a predetermined area capable of vibrating in a predetermined direction parallel to the substrate;

a detecting structure fixed to the driving structure on a same plane as the driving structure, and having a predetermined area capable of vibrating in a vertical direction with respect to an upper surface of the substrate;

a cap wafer positioned above the driving structure and the detecting structure, and bonded with the substrate, the cap wafer defining an interior space above the driving structure; and

a fixed vertical displacement detection electrode formed on an underside of the cap wafer above the detecting surface, for detecting displacement of the detecting structure in the vertical direction.

2. The vertical MEMS gyroscope by horizontal driving as claimed in claim 1, wherein the driving structure comprises:

a driving mass capable of vibrating in a predetermined direction parallel to the substrate;

a plurality of support beams each having one end fixed on the upper surface of the support layer and another end fixed on a side of the driving mass, for enabling the driving mass to move in a predetermined horizontal direction;

a driving electrode for driving the driving mass in the predetermined horizontal direction; and

a horizontal displacement detection electrode for measuring a displacement of the driving mass in a horizontal direction.

3. The vertical MEMS gyroscope by horizontal driving as claimed in claim 2, wherein the driving electrode has a comb structure including a fixed driving electrode fixed on the upper surface of the support layer and a motion driving electrode formed on a side of the driving mass.

4. The vertical MEMS gyroscope by horizontal driving as claimed in claim 2, wherein the horizontal displacement detection electrode has a comb structure including a fixed horizontal displacement detection electrode fixed on the upper surface of the support layer, and a motion horizontal displacement detection electrode formed on a side of the driving mass.

5. The vertical MEMS gyroscope by horizontal driving as claimed in claim 1, wherein the detecting structure comprises:

a detection mass capable of vibrating in a vertical direction with respect to the substrate;

a plurality of support beams each having an end fixed on a side of the detection mass and another end fixed on a side of the driving structure, for enabling the detection mass to move in the vertical direction with respect to the substrate; and

a motion vertical displacement detection electrode for measuring a displacement of the detection mass in a vertical direction.

6. The vertical MEMS gyroscope by horizontal driving as claimed in claim 5, wherein the motion vertical displacement detection electrode comprises a comb-structured electrode which is formed on a side of the detection mass.

7. The vertical MEMS gyroscope by horizontal driving as claimed in claim 1, wherein the interior space formed within the cap wafer is a vacuum space formed adjacent to the fixed vertical displacement detection electrode, the vacuum space of the cap wafer being larger than an area for the fixed vertical displacement detection electrode so as to maintain a predetermined vacuum between the substrate and the cap wafer.

8. The vertical MEMS gyroscope by horizontal driving as claimed in claim 1, further comprising a detection electrode anchor arranged on the upper surface of the support layer and electrically connected with the fixed vertical displacement detection electrode.

9. The vertical MEMS gyroscope by horizontal driving as claimed in claim 8, further comprising:

a via hole formed in the cap wafer; and

an external electrode, wherein the detection electrode anchor is electrically connected to the external electrode through the via hole.

10. The vertical MEMS gyroscope by horizontal driving as claimed in claim 2, wherein the detecting structure comprises:

a detection mass capable of vibrating in a vertical direction with respect to the substrate;

a plurality of support beams each having an end fixed on a side of the detection mass and another end fixed on a side of the driving mass, for enabling the detection mass to move in the vertical direction with respect to the substrate; and

a motion vertical displacement detection electrode for measuring a displacement of the detection mass in a vertical direction.