Apparatus for determining gaps between a proximity probe and a conductive target material
First Claim
Patent Images
1. An apparatus for determining gaps between a proximity probe and a conductive target material, said apparatus comprising in combination:
- a network including a first electrical component and said proximity probe serially connected;
a signal generating means operatively coupled to said network for driving a current through said serial connection for establishing a first analog voltage signal across said network and a second analog voltage signal across said proximity probe;
sampling means for digitizing said established voltage signals into digital voltage signals;
a digital multiplier for multiplying each of said digital voltage signals by a digital sine signal and a digital cosine signal;
means for accumulating values of each multiply in a memory, and means for processing each multiply for obtaining complex voltage representations correlative to gaps between said proximity probe and the conductive target material.
0 Assignments
0 Petitions
Accused Products
Abstract
A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
-
Citations
4 Claims
-
1. An apparatus for determining gaps between a proximity probe and a conductive target material, said apparatus comprising in combination:
-
a network including a first electrical component and said proximity probe serially connected;
a signal generating means operatively coupled to said network for driving a current through said serial connection for establishing a first analog voltage signal across said network and a second analog voltage signal across said proximity probe;
sampling means for digitizing said established voltage signals into digital voltage signals;
a digital multiplier for multiplying each of said digital voltage signals by a digital sine signal and a digital cosine signal;
means for accumulating values of each multiply in a memory, and means for processing each multiply for obtaining complex voltage representations correlative to gaps between said proximity probe and the conductive target material. - View Dependent Claims (2, 3, 4)
-
Specification