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Method for measuring integrated circuit processor power demand and associated system

  • US 6,954,706 B2
  • Filed: 08/20/2003
  • Issued: 10/11/2005
  • Est. Priority Date: 08/20/2003
  • Status: Active Grant
First Claim
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1. A method for measuring integrated circuit processor power demand comprising:

  • calibrating one or more voltage controlled oscillators (VCOs) for use as ammeters;

    calibrating a calibration current source, wherein the calibration current source draws current through an inherent resistance;

    calculating the inherent resistance; and

    calculating the processor power demand using a voltage that is measured across the inherent resistance.

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