System and method for increasing the contrast of an image produced by an epifluorescence microscope

• US 6,956,695 B2
• Filed: 03/19/2002
• Issued: 10/18/2005
• Est. Priority Date: 03/19/2001
• Status: Expired due to Fees

• Current Assignee: Ikonisys, Inc.
• Original Assignee: Ikonisys, Inc.
• Inventors: Tafas, Triantafyllos, Tsipouras, Petros
• Primary Examiner(s): Nguyen, Thong
• Assistant Examiner(s): Lavarias, Arnel C.
• Application Number:
  US10/102,500
• Publication Number:
  US 20020141050A1
• Time in Patent Office: 1,309 Days
• Field of Search: 359/368, 359/634, 359/397, 359/396, 359/398, 359/350, 359/359, 359/360, 356/244, 206/456
• US Class Current: 359/396
• CPC Class Codes: G01N 21/6458 Fluorescence microscopy fluorescence microscopes per se G02B21/0076 and G02B21/16
• CPC Class Codes: G02B 21/082 for incident illumination only
• CPC Class Codes: G02B 21/16 adapted for ultraviolet illumination ; Fluorescence microscopes G02B21/0076 takes precedence
• CPC Class Codes: G02B 21/34 Microscope slides, e.g. mounting specimens on microscope slides

Abstract

The contrast of an image produced by epifluorescence microscopy may be increased by placing a high-pass dichroic reflecting film behind the sample. The reflecting film reflects the emission light emitted by the fluorescent tags in the sample back through the objective lens while allowing the shorter wavelength excitation light to pass through the sample holder.

Claims

1. A system for increasing the contrast of a fluorescently tagged biological sample comprising a sample holder for supporting a sample tagged with different fluorescent tags for epifluorescence microscopy, the sample emitting an emission light when illuminated by an excitation light, the sample holder comprising:

a sample support comprising a sample-proximal infrared reflecting film, wherein the infrared reflecting film at least partially reflects an infrared focusung light beam at or near a sample focal point or focal plane; and

a base supporting a reflector comprising a dichroic reflector surface located beneath the sample support,

wherein the dichroic reflector reflects the emission light emitted by the sample while transmitting the excitation light illuminating the sample, wherein the sample comprises different fluorescent tags selected for interacting with excitation light applied at a specific frequency to produce a specific frequency emission light, the specific frequency emission light being reflected by the dichroic surface of the reflector being suitable for reflecting said specific frequency light emitted from the fluorescent tags.

2. The system of claim 1 wherein the dichroic reflector is concave having a focal point disposed within the sample.

3. The system of claim 1 wherein the sample support for supporting a sample comprises:

a top surface; and

a bottom surface;

an infrared reflecting film deposited on the top surface, the film directly supporting the sample; and

a dichroic reflecting film deposited on either the top surface, adjacent to, or in contact with, the sample, or the bottom surface, beneath the sample.

4. The microscope slide of claim 3 wherein the infrared reflecting film comprises titanium.

5. The microscope slide of claim 3 wherein the infrared reflecting film has a thickness of 0.6 nm to 90 nm.

6. The microscope slide of claim 3 wherein the infrared reflecting film reflects between 4 to 8% of an incident infrared beam.

7. The microscope slide of claim 6 wherein the infrared reflecting film reflects between 5.5 to 7% of the incident infrared beam.

8. The system of claim 1, wherein the microscope slide comprises the dichroic reflecting film that reflects an emission light emitted by the sample when illuminated by an excitation light, and that absorbs the excitation light.

9. The system of claim 1 wherein the base is a microscope slide.

10. The system holder of claim 1 wherein the sample comprises more than one kind of fluorescent tag for imaging different sample target, each target requiring a different dichroic surface and excitation frequency.

11. The system holder of claim 1 wherein the one dichroic reflector is selected as capable to transmit or absorb all the different emission frequencies of the fluorescent tags in the sample while reflecting all the emission frequencies of the fluorescent tags.

12. The system of claim 1 wherein the dichroic reflector may be utilized for the same sample containing different fluorescent tags.