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Method and apparatus for characterizing a circuit with multiple inputs

  • US 6,960,926 B2
  • Filed: 06/24/2002
  • Issued: 11/01/2005
  • Est. Priority Date: 06/24/2002
  • Status: Expired due to Fees
First Claim
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1. A method of determining a characterization parameter of a circuit including at least one input, the method comprising the steps of:

  • receiving an input signal presented to the at least one input of the circuit;

    measuring a first delay associated with the circuit when the circuit is substantially unloaded;

    measuring a second delay associated with the circuit when the circuit is loaded by a predetermined impedance;

    determining a difference between the second delay and the first delay, the delay difference corresponding to a switching impedance associated with the circuit; and

    determining the characterization parameter of the circuit based, at least in part, on the switching impedance associated with the circuit.

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